TY - GEN A1 - Müller, Bernd R. A1 - Trappe, Volker A1 - Goebbels, Jürgen A1 - Hickmann, Stefan A1 - Grasse, Fabian T1 - Non-destructive characterization of composites: from small scale to complex component testing - a challenge T2 - International Symposium on NDT in Aerospace (Proceedings) T2 - International Symposium on NDT in Aerospace CY - Hamburg, Germany DA - 2010-11-22 KW - Aircraft KW - Wind turbine blades KW - Automotive KW - X-ray refraction KW - Fibre orientation KW - WAXS technique KW - X-ray computed tomography PY - 2010 SN - 978-3-940283-28-3 IS - DGZfP-BB 124 (Tu.2.B.1) SP - 1 EP - 6 AN - OPUS4-22724 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Müller, Bernd R. A1 - Lange, Axel A1 - Hentschel, Manfred P. ED - Cohen, L. J. T1 - Non-Destructive Characterization of High Performance Composites by use of X-Ray Refraction Topography T2 - Advancing materials in the global economy - applications, emerging markets and evolving technologies T2 - 48th International SAMPE symposium and exhibition CY - Long Beach, CA, USA DA - 2003-05-11 KW - Non-Destructive Inspection (NDI) KW - Characterization KW - Advanced Composite PY - 2003 SN - 0-938994-94-8 VL - 1 SP - 1203 EP - 1211 PB - SAMPE International Business Office CY - Covina, Calif. AN - OPUS4-2542 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Müller, Bernd R. A1 - Lange, Axel A1 - Hentschel, Manfred P. ED - Green, R. E. ED - Djordjevic, B. B. ED - Hentschel, M. P. T1 - Synchrotron Radiation Refraction Topography T2 - Nondestructive characterization of materials XI PY - 2003 SN - 3-540-40154-7 SP - 167 EP - 176 PB - Springer CY - Berlin AN - OPUS4-2765 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Müller, Bernd R. A1 - Lange, Axel A1 - Harwardt, Michael A1 - Hentschel, Manfred P. A1 - Illerhaus, Bernhard A1 - Goebbels, Jürgen A1 - Bamberg, J. A1 - Heutling, F. T1 - 3D Refraction Computed Tomography Applied to Metal Matrix Composites T2 - Materials and processing N2 - For the first time Metal Matrix Composites (MMC) have been investigated by 3D Computed Tomography combined with enhanced interface contrast due to X-ray refraction. X-ray refraction is a relatively new approach for the characterization of advanced materials. The related techniques of Refraction Topography and Refraction Computed Tomography have been developed and applied at our laboratory during the last decade to meet the actual demand for improved nondestructive characterization of high performance composites, ceramics and other low density materials and components. X-ray refraction occurs, when X-rays crosses interfaces of spherical or cylindrical shape (e.g. pores or fibres) in the same way as visible light is refracted by lenses. These X-ray optical effects can be observed at small scattering angles of few minutes of arc as the refractive index n of X-rays is nearly unity (n = 1 – 10-6). Due to the short X-ray wavelength of about 0.1 nm the technique determines the amount of inner surfaces and interfaces of nanometer dimensions. The technique is expected to solve many problems in understanding the meaning of micro and sub micro structures in materials science. With the results of the CT investigation, some questions could be clarified for a better understanding of fatigue failure mechanisms under cyclic loading conditions. The specimens for the test programme have been provided by MTU Aero Engines. They consist of a titanium matrix (Ti6242) reinforced by SiC fibres (SCS6). The investigations have been performed at the materials research station of BAM (BAMline) at the Synchrotron Facility BESSY in Berlin, Germany. T2 - 35th International SAMPE technical conference CY - Dayton, OH, USA DA - 2003-09-28 KW - Non-Destructive Inspection (NDI) KW - Characterization KW - Titanium Metal Matrix Composites (Ti-MMC) KW - Ti6242 KW - SCS6 PY - 2003 SN - 0-938994-95-6 PB - SAMPE CY - Covina, Calif. AN - OPUS4-2780 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Müller, Bernd R. A1 - Lange, Axel A1 - Harwardt, Michael A1 - Hentschel, Manfred P. A1 - Illerhaus, Bernhard A1 - Goebbels, Jürgen A1 - Bamberg, J. A1 - Heutling, F. T1 - Micro Crack Characterization of Metal Matrix Composites by 3D-Refraction-Computed-Tomography T2 - 16th World Conference on Nondestructive Testing T2 - 16th World Conference on Nondestructive Testing CY - Montreal, Canada DA - 2004-08-30 KW - NDE KW - X-ray refraction KW - Composites KW - MMC PY - 2004 SP - 9 pages PB - International Committee for Non-Destructive Testing CY - Montreal AN - OPUS4-5486 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Müller, Bernd R. A1 - Lange, Axel A1 - Harwardt, Michael A1 - Hentschel, Manfred P. A1 - Illerhaus, Bernhard A1 - Goebbels, Jürgen T1 - First refraction enhanced 3D computed tomography T2 - International Symposium on Computed Tomography and Image Processing for Industrial Radiology T2 - International Symposium on Computed Tomography and Image Processing for Industrial Radiology CY - Berlin, Germany DA - 2003-06-23 PY - 2003 SN - 3-931381-48-X N1 - Serientitel: DGZfP-Proceedings BB – Series title: DGZfP-Proceedings BB IS - 84-CD PB - DGZfP CY - Berlin AN - OPUS4-2519 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Müller, Bernd R. A1 - Lange, Axel A1 - Harwardt, Michael A1 - Hentschel, Manfred P. T1 - Submikro-Computer-Tomographie an der BAMline T2 - ZfP in Forschung, Entwicklung und Anwendung - Jahrestagung 2004 T2 - Jahrestagung Zerstörungsfreie Materialprüfung 2004 CY - Salzburg, Österreich DA - 2004-05-17 KW - Computer Tomographie KW - Vergrößerung mit asymmetrischen Kristallen PY - 2004 UR - http://www.ndt.net/article/dgzfp04/papers/v09/v09.htm SN - 3-931381-55-2 SP - 1(?) EP - 7(?) PB - DGZfP CY - Berlin AN - OPUS4-5869 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Müller, Bernd R. A1 - Lange, Axel A1 - Harwardt, Michael A1 - Hentschel, Manfred P. T1 - Synchrotron Based Micro-CT and Refraction Enhanced Micro-CT of MMC T2 - International Symposium on NDT in Aerospace T2 - International Symposium on NDT in Aerospace CY - Fürth, Germany DA - 2008-12-03 KW - X-ray Refraction KW - Synchrotron Radiation KW - Computed Tomography KW - Metal Matrix Composites KW - Lightweight Materials KW - Aerospace PY - 2008 SN - 978-3-940283-12-2 N1 - Serientitel: Berichtsband / Deutsche Gesellschaft für zerstörungsfreie Prüfung e. V. – Series title: Berichtsband / Deutsche Gesellschaft für zerstörungsfreie Prüfung e. V. IS - DGZfP-BB 114 (Poster 10) SP - 295 EP - 305 PB - DGZfP CY - Berlin AN - OPUS4-18607 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Müller, Bernd R. A1 - Lange, Axel A1 - Harwardt, Michael A1 - Hentschel, Manfred P. ED - Paul Sellin, T1 - Refraction enhanced micro-CT for non-destructive materials characterization T2 - IEEE Nuclear Science Symposium, October 19-25, 2008, Dresden T2 - IEEE Nuclear Science Symposium CY - Dresden, Germany DA - 2008-10-19 KW - Synchrotron KW - Micro-CT KW - Refraction PY - 2008 SN - 978-1-4244-2715-4 SN - 1082-2654 SP - 541 EP - 546 AN - OPUS4-18662 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Müller, Bernd R. A1 - Lange, Axel A1 - Harwardt, Marco A1 - Hentschel, Manfred P. A1 - Illerhaus, Bernhard A1 - Goebbels, Jürgen A1 - Bamberg, J. A1 - Heutling, F. ED - Danny Van Hemelrijck, ED - Igor Solodov, ED - Anastasopoulos, Athanasios ED - Gerhard Busse, T1 - Synchrotron-Refraction-Computed-Tomography for NDT and characterisation of lightweight composite materials T2 - Emerging Technologies in Non-Destructive Testing T2 - 4th International Conference of Emerging Technologies in Non-Destructive Testing (ETNDT 4) CY - Stuttgart, Germany DA - 2007-04-02 KW - Refraction KW - Computed Tomography KW - NDE KW - Ti-MMC PY - 2008 SN - 978-0-415-46476-5 SP - 217 EP - 221 PB - Taylor & Francis CY - London, UK AN - OPUS4-18680 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -