TY - JOUR A1 - Harbich, Karl-Wolfram A1 - Lange, Axel A1 - Hentschel, Manfred P. T1 - Röntgen-Rotations-Refraktometrie - Die Glasfaserorientierung in Spritzguß-Kompositen ermitteln JF - Materialprüfung = Materials testing PY - 1995 SN - 0025-5300 VL - 37 IS - 1-2 SP - 19 EP - 21 PB - Carl Hanser Verlag CY - München AN - OPUS4-3653 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Harbich, Karl-Wolfram A1 - Hentschel, Manfred P. A1 - Lange, Axel T1 - Röntgen-Refraktions-Topographie JF - Qualität und Zuverlässigkeit PY - 1995 SN - 0720-1214 SN - 0033-5126 VL - 40 IS - 10 SP - 1184 PB - Hanser CY - München AN - OPUS4-3654 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Harbich, Karl-Wolfram A1 - Hentschel, Manfred P. A1 - Lange, Axel T1 - Röntgen-Refraktions-Topographie an Neuen Werkstoffen JF - DGZfP-Zeitung PY - 1995 SN - 0948-5112 VL - 49 SP - 40 EP - 44 PB - Deutsche Gesellschaft für Zerstörungsfreie Prüfung CY - Berlin AN - OPUS4-3655 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Hentschel, Manfred P. A1 - Harbich, Karl-Wolfram A1 - Lange, Axel A1 - Rudolph, Hans-Volker T1 - X-ray Refraction of Paper and Pigments JF - Materialprüfung = Materials testing PY - 1995 SN - 0025-5300 VL - 37 IS - 3 SP - 60 EP - 62 PB - Carl Hanser Verlag CY - München AN - OPUS4-3656 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Harbich, Karl-Wolfram A1 - Lange, Axel A1 - Hentschel, Manfred P. T1 - Quantitative Röntgen-Refraktions-Topographie von keramischen Werkstoffen JF - Materialprüfung = Materials testing KW - Röntgen-Refraktions-Topographie KW - Oberfläche, innen KW - Porengröße KW - Keramik KW - Röntgen-Topographie PY - 1996 SN - 0025-5300 VL - 38 IS - 5 SP - 181 EP - 186 PB - Carl Hanser Verlag CY - München AN - OPUS4-677 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Harbich, Karl-Wolfram A1 - Hentschel, Manfred P. A1 - Lange, Axel ED - Hemelrijck, Danny van T1 - New X-ray refractometry for nondestructive characterization of hihg performance composites and ceramics T2 - Non destructive testing - proceedings of the First Joint Belgian-Hellenic Conference on Non Destructive Testing T2 - 1st Joint Belgian-Hellenic Conference on Nondestructive Testing CY - Patras, Greece DA - 1995-05-22 PY - 1996 SN - 90-5410-595-X SP - 185 EP - 189 PB - Balkema CY - Rotterdam, Netherlands AN - OPUS4-3660 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Harbich, Karl-Wolfram A1 - Schors, Jörg A1 - Lange, Axel A1 - Ekenhorst, Derk A1 - Harwardt, Michael A1 - Hentschel, Manfred P. T1 - Röntgen-Refraktion von Werkstoffen - Zerstörungsfreie Charakterisierung von Mikro-Grenzflächen JF - Materialprüfung = Materials testing PY - 1997 SN - 0025-5300 VL - 39 IS - 7-8 SP - 302 EP - 307 PB - Carl Hanser Verlag CY - München AN - OPUS4-3663 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Harbich, Karl-Wolfram A1 - Hentschel, Manfred P. A1 - Ekenhorst, Derk A1 - Schors, Jörg A1 - Lange, Axel T1 - X-Ray Refraction for NDT of Micro Cracks and Impacts T2 - Proceedings of the 7th European Conference on Non-Destructive Testing N2 - High performance composites and other light weight materials are generally a comple problem to the performance of nondestructive testing methods. X-ray refraction provide unconventional X-ray scattering techniques to meet the actual demand for improve nondestructive characterization of these advanced materials. Scanning the samples across collimated narrow incident X-ray beam permits to image integral micro-structures (a present) with a resolution of 10 µm. Investigations of samples after strain-induced micro cracks and fibre debonding in impact damaged epoxy are shown. The physics of X-ray refraction are analogous to the well known refraction of light b optical lenses and prisms, governed by Snell's law. The special feature is the deflection a very small angles of few minutes of arc, as the refractive index of X-rays in matter i nearly one. Due to the density differences at inner surfaces most of the incident X-rays ar deflected. As the scattered intensity of refraction is proportional to the specific surface of sample, a reference standard gives a quantitative measure for analytical determinations. Figure 1 represents a two-dimensional damage distribution of an impact in a 0/90° CFR laminate of 3 mm, thickness. Unlike in ultrasonic testing, there is no shadowing effect o the successive layers. By use of X-ray refraction the exact concentration of debonde fibres is calculated for each position. Additionally the refraction allows the selection of th fibre orientation. T2 - 7th European Conference on Non-Destructive Testing (ECNDT) CY - Copenhagen, Denmark DA - 1998-05-26 PY - 1998 UR - http://www.ndt.net/abstract/ecndt98/435.htm SN - 87-986898-0-0 VL - 3 CY - Broendy, Denmark AN - OPUS4-3328 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Hentschel, Manfred P. A1 - Lange, Axel A1 - Harbich, Karl-Wolfram A1 - Ekenhorst, Derk A1 - Schors, Jörg T1 - Röntgentopographische Verfahren - Zerstörungsfreie Charakterisierung moderner Werkstoffe JF - Materialprüfung = Materials testing PY - 1998 SN - 0025-5300 VL - 40 IS - 5 SP - 170 EP - 174 PB - Carl Hanser Verlag CY - München AN - OPUS4-3329 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Hentschel, Manfred P. A1 - Ekenhorst, Derk A1 - Harbich, Karl-Wolfram A1 - Lange, Axel A1 - Schors, Jörg ED - Green, R. E. T1 - New X-ray refractography for non-destructive evaluation of advanced materials T2 - Nondestructive characterization of materials VIII T2 - 8th International Symposium on Nondestructive Characterization of Materials CY - Boulder, CO, USA DA - 1997-06-15 PY - 1998 SN - 0-306-45900-0 VL - 8 SP - 409 EP - 416 PB - Plenum Press CY - New York AN - OPUS4-3330 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -