TY - JOUR A1 - Müller, Bernd R. A1 - Lange, Axel A1 - Hentschel, Manfred P. A1 - Kupsch, Andreas T1 - A comfortable procedure for correcting X-ray detector backlight N2 - A novel approach is suggested to strongly suppress artifacts in radiography and computed tomography caused by the effect of diffuse background signals 'backlighting' of 2D X-ray detectors. Depending on the detector geometry the mechanism may be different. Either based on the optical scattering of the fluorescent screen materials into the optical detection devices or Compton or X-ray fluorescence scattering by the detector components. Consequently, these erroneous intensity portions result in locally different violations of Lambert Beer's law in single projections (radiographs) as a function of the detector area coverage and the magnitude of the attenuation. The absorption of multiple metal sheets is investigated by monochromatic synchrotron radiation, thus excluding beam hardening. The proposed correction procedure simply requires the individual subtraction of one and the same fraction of the primary and transmitted mean intensity, as a constant (non-local) scattering mechanism is assumed. KW - X-ray detector backlighting KW - Radiography KW - Fluorescent screen KW - Diffuse background KW - Computed tomography PY - 2013 DO - https://doi.org/10.1088/1742-6596/425/19/192015 SN - 1742-6588 SN - 1742-6596 VL - 425 IS - 19 SP - 192015-1 EP - 192015-4 PB - IOP Publ. CY - Bristol, UK AN - OPUS4-28262 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Hentschel, Manfred P. A1 - Müller, Bernd R. A1 - Lange, Axel A1 - Wald, Oliver T1 - Quantitative X-ray Determination of CFRP Micro Structures T2 - International Symposium on NDT in Aerospace CY - Fürth, Germany DA - 2008-12-03 KW - Neutronen-Radiographie KW - Neutronen-Tomographie KW - Tomographische Rekonstruktionsalgorithmen KW - Brennstoffzellen KW - In-Situ Radiologie PY - 2008 SN - 978-3-940283-12-2 N1 - Serientitel: Berichtsband / Deutsche Gesellschaft für zerstörungsfreie Prüfung e. V. – Series title: Berichtsband / Deutsche Gesellschaft für zerstörungsfreie Prüfung e. V. IS - DGZfP-BB 114 (X-Ray/Lecture 13) SP - 89 EP - 98 PB - DGZfP CY - Berlin AN - OPUS4-18606 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Hentschel, Manfred P. A1 - Lange, Axel A1 - Müller, Bernd R. A1 - Schors, Jörg A1 - Harbich, Karl-Wolfram T1 - Röntgen-Refraktions-Computer-Tomographie N2 - Für die Charakterisierung Neuer Werkstoffe, vornehmlich Nichtmetalle, hat sich das Verfahren der Röntgen-Refraktions-Topographie bewährt. Es handelt sich phänomenologisch um eine Technik der Röntgen-Kleinwinkel-Streuung mit Probekörper-Abtastung bei fest vorgewähltem Streuwinkel. Gegenüber der klassischen Beugungstheorie dominieren jedoch bei der Streuung an Strukturen oberhalb von 0.3 µm Größe röntgenoptische Brechungseffekte. Detektierbar sind damit innere Ober- und Grenzflächen, insbesondere Mikrorisse unterhalb der lichtmikroskopischen Erkennbarkeit. Da es sich hierbei um eine Durchstrahlungs-Technik handelt, überlagern jedoch die Strukturen zu einer Projektion, analog zu den radiographischen Verfahren. Um auch Informationen entlang der Durchstrahlungs-Richtung in der Tiefe des Probekörpers zu erhalten, wird unter kleinen Streuwinkeln die Computer-Tomographie durchgeführt, im ersten Ansatz mit nur zwei Meßkanälen, jeweils für die Messung der Absorptions- und der Refraktions-Intensität. Dazu werden nacheinander 360 Linear-Scans nach Drehung von jeweils 1° aufgenommen. Die Intensitätswerte werden nach den Regeln der fouriergefilterten Rückprojektion zu Computer-Tomogrammen verarbeitet. Die Ergebnisse visualisieren die Anordnung von Grenzflächen und innere Oberflächen, die sich für zahlreiche nichtmetallische Werkstoffe, vor alllem im Transportmittel-Leichtbau als relevante Mikrostrukturen für das Versagens-Verhalten und die Werkstoff-Optimierung eignen. Zum Vergleich entstehen aus den simultanen Absorptionsmessungen gleichzeitig die klassischen Computer-Tomogramme, die ausschließlich Dichteänderungen anzeigen. T2 - Jahrestagung Zerstörungsfreie Materialprüfung 1999 CY - Celle, Deutschland DA - 1999-05-10 KW - Röntgentomographie KW - Röntgen-Refraktions-Computer-Tomographie PY - 1999 UR - http://www.ndt.net/abstract/dgzfp99/data/40.htm SN - 3-931381-27-7 VL - 1 IS - 68 SP - 361 EP - 369 PB - DGZfP CY - Berlin AN - OPUS4-715 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Müller, Bernd R. A1 - Lange, Axel A1 - Harwardt, Marco A1 - Hentschel, Manfred P. A1 - Illerhaus, Bernhard A1 - Goebbels, Jürgen T1 - Synchrotron Refraction CT and Synchrotron Bragg Magnification CT for NDE T2 - International Symposium on Digital industrial Radiology and Computed Tomography (DIR 2007) CY - Lyon, France DA - 2007-06-25 KW - X-ray Refraction KW - Diffraction Enhanced Imaging (DEI) KW - Bragg Magnification KW - Synchrotron Radiation KW - Computed Tomography (CT) KW - Metal Matrix Composites (MMC) KW - Lightweight Materials KW - Aerospace PY - 2007 IS - CD-ROM SP - 1 EP - 8 CY - Lyon, France AN - OPUS4-16366 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Hentschel, Manfred P. A1 - Müller, Bernd R. A1 - Harwardt, Michael A1 - Lange, Axel T1 - Synchrotron-Refraktions-Computer Tomographie für die Materialforschung T2 - DGZfP Jahrestagung CY - Rostock, Deutschland DA - 2005-05-02 KW - Computer-Tomographie KW - Synchrotronstrahlung KW - Refraktionskontrast KW - Bragg-Vergrößerung PY - 2005 SN - 3-931381-64-1 N1 - Serientitel: Berichtsband / Deutsche Gesellschaft für zerstörungsfreie Prüfung e. V. – Series title: Berichtsband / Deutsche Gesellschaft für zerstörungsfreie Prüfung e. V. IS - 94-CD SP - 1(?) EP - 7(?) PB - DGZfP CY - Berlin AN - OPUS4-11698 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Lange, Axel T1 - Enhanced Spatial Resolution Using Iterative Focal Desmearing in Computed Tomography T2 - ECNDT 10 CY - Moscow, Russia DA - 2010-06-08 PY - 2010 AN - OPUS4-21589 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Kupsch, Andreas A1 - Lange, Axel A1 - Hentschel, Manfred P. T1 - Computertomographische 2D-Rekonstruktionen ohne gefilterte Rückprojektion mit DIRECTT T2 - DACH-Jahrestagung 2008 CY - St. Gallen, Schweiz DA - 2008-04-28 KW - Computer-Tomographie KW - Rekonstruktionsalgorithmen KW - Ortsauflösung PY - 2008 SN - 978-3-940283-09-2 IS - DGZfP-BB 113 (Poster 10) SP - 1 EP - 6 AN - OPUS4-17937 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Ewers, Benjamin A1 - Kupsch, Andreas A1 - Lange, Axel A1 - Hentschel, Manfred P. T1 - Terahertz spectral imaging techniques in NDT: Topography and computed tomography N2 - The emerging technology of generation and detection of Terahertz waves (1 THz = 1012 Hz) offers diverse potentials in non-destructive testing (NDT) regarding security as well as safety aspects. Herein, we focus on the latter with emphasis on imaging techniques. The THz range (0.1 … 10 THz, 3mm …30 µm) closes the technological gap between ultra high frequency electronics and FIR optics in the electro-magnetic (EM) spectrum. Electro-optical sampling provides straight access to the EM wave including its phase (rather than intensity). THz waves are well suited to characterize non-metallic materials since they penetrate paper, plastics, ceramics and certain composites (e.g. GFC). We employ a commercial fibre-coupled THz time domain spectrometer (TDS) for scanning the samples laterally through a focal spot. At each position the entire temporal pulse train is recorded, which offers the opportunity to use various parameters derivable for imaging. Topographic measurements are performed as reflection set-up. The achievable spatial resolution is diffraction limited at about 100 µm -300 µm (which allows for perception of single defects on a sub-mm scale). In contrast to typical pulse echoed ultrasound testing THz topography is a non-contact inspection tool without coupling agents. Several reflections of subsequent concealed layers are detected instead of just the first encountered one. Comparing to X-ray (radiology) the non-ionizing THz-waves generate images of similar contrast regarding metal and plastic (organic) components, while conventional radiography emphasizes one type of material depending on the energy preselected. Moreover, the full temporal information is exploited to derive spectra in certain selected time windows, i.e. separated spectral properties of each layer in multilayered structures. Tomographic measurements are performed in transmission mode. The sample is mounted on a rotation stage in order to allow for lateral scanning under the different projection angles. The reconstruction is typically performed by filtered backprojection, which is widely used for X-ray CT. The adaption of this technique to the THz range comes along with several experimental drawbacks such as considerable refraction and scattering. According to these difficulties we investigate the occurring artefacts. The THz-TDS provides the opportunity to calculate a separate backprojection of each frequency interval as obtained by the Fourier transformation of the recorded time resolved amplitude. This results in a spectrally resolved reconstruction of each voxel, which is unique in computed tomography technology. T2 - 10th European conference on non-destructive testing CY - Moscow, Russia DA - 2010-06-07 KW - Terahertz time domain spectroscopy KW - Spectral computed tomography KW - 3D topography PY - 2010 UR - http://www.ndt.net/article/ecndt2010/reports/1_09_10.pdf IS - Paper 4.02.18 SP - 1 EP - 10(?) AN - OPUS4-21465 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Hentschel, Manfred P. A1 - Harbich, Karl-Wolfram A1 - Müller, Bernd R. A1 - Lange, Axel A1 - Schors, Jörg A1 - Wald, Oliver ED - Gerhard Busse, ED - Danny Van Hemelrijck, ED - Igor Solodov, ED - Anastasopoulos, Athanasios T1 - NDE of micro structured materials by X-ray diffraction and refraction topography T2 - 4th International Conference of Emerging Technologies in Non-Destructive Testing (ETNDT 4) CY - Stuttgart, Germany DA - 2007-04-02 KW - Nondestructive testing KW - X-ray scattering KW - X-ray topography KW - Computed topography KW - Synchrotron refraction computed tomography KW - Structure property relations KW - Composite damaging KW - Ceramics KW - Foams PY - 2007 SN - 978-0-415-46476-5 SP - 15 EP - 22 PB - Taylor & Francis CY - London, UK AN - OPUS4-17561 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Kupsch, Andreas A1 - Lange, Axel A1 - Hentschel, Manfred P. A1 - Bruno, Giovanni A1 - Onel, Yener A1 - Wolk, Thomas A1 - Staude, Andreas A1 - Ehrig, Karsten A1 - Müller, Bernd R. T1 - Evaluating porosity in cordierite diesel particulate filter materials: advanced X-ray techniques and new statistical analysis methods T2 - ECNDT 2014 - 11th European conference on non-destructive testing CY - Prague, Czech Republic DA - 2014-10-06 KW - Porous ceramics KW - Diesel particulate filters KW - Pore orientation KW - X-ray computed tomography KW - X-ray refraction KW - DIVA algorithm KW - Phase contrast KW - Edge artefact KW - Soft matter radiography KW - Wavelet transform KW - Huygens elementary waves PY - 2014 SN - 978-80-214-5018-9 SP - 1 EP - 8(?) AN - OPUS4-31973 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -