TY - JOUR A1 - Kulow, Anicó A1 - Witte, S. A1 - Beyer, S. A1 - de Oliveira Guilherme Buzanich, Ana A1 - Radtke, Martin A1 - Reinholz, Uwe A1 - Riesemeier, H. A1 - Streli, C. T1 - A new experimental setup for time- and laterally-resolved X-ray absorption fine structure spectroscopy in a 'single shot' N2 - In this work, a new setup for dispersive XAFS measurements is presented. This reproducible and scanningfree setup yields both time- and laterally-resolved XAFS experiments in a ‘single-shot’. It allows a straightforward adjustment for probing different elements covering many relevant applications in materials science. An incoming energetic broadband beam is diffracted by a Si (111) crystal after passing through the sample and collected by an area sensitive detector. Depending on the energy range of the incoming beam, XANES and/or EXAFS spectra can be recorded with a time resolution down to 1 s. The feasibility of this setup was demonstrated at the BAMline at BESSY II (Berlin, Germany) with reference Fe and Cu foils and the results are hereby presented and discussed. Additionally, an application where time resolution on the second scale is required is briefly evaluated. The presented example concerns studying early stages of zinc(II)2-methylimidazolate (ZIF-8) crystallization. This is particularly important for biomedical applications. KW - X-ray spectroscopy KW - X-ray absorption fine structure KW - Time-resolved KW - Laterally-resolved KW - Experimental setup PY - 2019 U6 - https://doi.org/10.1039/c8ja00313k SN - 0267-9477 SN - 1364-5544 VL - 34 IS - 1 SP - 239 EP - 246 PB - Royal Society of Chemistry CY - London AN - OPUS4-47207 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Kulow, Anicó A1 - Witte, S. A1 - Beyer, S. A1 - Streli, C. A1 - Radtke, Martin A1 - Reinholz, Uwe A1 - Riesemeier, Heinrich A1 - de Oliveira Guilherme Buzanich, Ana T1 - Time- and lateral-resolved X-ray absorption fine structure spectroscopy N2 - X-ray absorption fine structure (XAFS) spectroscopy is a powerful and widely used tool for material characterization. It is non-destructive, element-sensitive and requires no long-range order of the sample, making it suitable for the investigation of amorphous phases. XAFS includes the X-ray absorption near edge structure (XANES) and the extended X-ray absorption fine structure (EXAFS), providing information about the electronical state of the absorbing atom and the spatial order of the neighboring atoms respectively. Our new approach presented here is derived from the classical dispersive XAFS setup. The aim is to have a scanningless, stable and reproducible setup for applications, in which dynamic processes occur in the second time scale. A broad polychromatic beam passes through the sample and is dispersed afterwards by a convexly bent Si (111) crystal. All energies are reflected under different angles and thus spatially separated, allowing a position sensitive detector to record a spectrum over the energy range of the incoming beam in a single shot. Tests of this setup were performed at the BAMline @ BESSY-II (Berlin, Germany) with different metal foils. First in situ measurements comprised the investigation of the early stages of the zinc(II)2-methylimidazolate (ZIF-8) crystallization. This topic of metal-organic-frameworks (MOF) research is of interest for medical applications. Structural changes with a time resolution of 1 s could be followed. The second dimension of the broad beam can be used for a lateral resolution. T2 - ANAKON 2019 CY - Münster, Germany DA - 25.03.2019 KW - X-ray absorption fine structure KW - Synchrotron based methods KW - X-ray spectroscopy PY - 2019 AN - OPUS4-47660 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -