TY - CONF A1 - Kulow, Anicó A1 - de Oliveira Guilherme Buzanich, Ana A1 - Reinholz, Uwe A1 - Radtke, Martin A1 - Riesemeier, Heinrich A1 - Streli, C. T1 - Time- and lateral-resolved X-ray absorption fine structure spectroscopy N2 - We developed a setup for time- and lateral-resolved X-ray absorption fine structure (XAFS) spectroscopy. A dispersive element is placed behind the sample to investigate. The broadband incoming beam transmits the sample, is then dispersed and finally collected by a position sensitive detector. This allows the recording of a whole X-ray absorption near edge structure (XANES) or extended X-ray absorption fine structure (EXAFS) spectrum in a single shot. The dispersive element is a Si(111) crystal, bent by means of a so called wafer bender, developed in house. Our setup is very flexible, easy to adjust and allows a time resolution down to one second which can be used to follow chemical reactions with dynamics on this time scale. T2 - SXR2019 CY - Berlin, Germany DA - 16.09.2019 KW - Spectroscopy KW - X-ray KW - Absorption KW - Synchrotron PY - 2019 AN - OPUS4-49045 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -