TY - JOUR A1 - Ünveren, Ercan A1 - Kemnitz, E. A1 - Hutton, S. A1 - Lippitz, Andreas A1 - Unger, Wolfgang T1 - Analysis of highly resolved x-ray photoelectron Cr 2p spectra obtained with a Cr2O3 powder sample prepared with adhesive tape JF - Surface and interface analysis KW - High-resolution XPS KW - Cr2O3 powder KW - Multiplet splitting PY - 2004 SN - 0142-2421 SN - 1096-9918 VL - 36 SP - 92 EP - 95 PB - Wiley CY - Chichester AN - OPUS4-3427 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -