TY - CONF A1 - Ewert, Uwe A1 - Heyne, Klara A1 - Zscherpel, Uwe A1 - Jechow, Mirko A1 - Bavendiek, K. ED - Thompson, D.O. ED - Chimenti, D.E. T1 - Optimum exposure conditions for computed radiography depending on fixed pattern noise and efficiency of imaging plate-scanner systems N2 - The presently active standards on Computed Radiography (CR) need a major revision. It was observed by many users that the image quality for class B of EN 14784-2 is not achievable under the same exposure conditions as used for film exposure. A mathematical model was developed and tested, which allows the calculation of the image quality, proven by image quality indicators (IQI), depending on the fixed pattern noise and the efficiency of the used imaging plate (IP) scanner system. All tested IP scanner systems provide a fixed correlation between the measured signal/noise ratio (SNR) and the grey values in the digital images. The maximum achievable SNRmax depends on the fixed pattern noise of the plate (high dose limit). Depending on the exposure dose an optimum visibility of IQIs can be predicted by calculation and measured considering the attenuation coefficient for calculation of the contrast/noise ratio (CNR). The diameter of the just visible wire is proportional to 1/sqrt(CNR). The optimum tube voltage for best visibility of IQIs and maximum CNR depend on the exposure dose. The optimum tube voltage for best visibility is achieved only at exposures with high dose. A dose dependant optimal tube voltage was not observed for film radiography. T2 - 37th Annual Review of Progress in Quantitative Nondestructive Evaluation CY - San Diego, CA, USA DA - 18.07.2010 KW - Computed radiography KW - Computed radiology KW - Non destructive testing KW - Image quality KW - Signal-to-noise ratio KW - Contrast-to-noise ratio KW - Imaging plates KW - Optimum tube voltage KW - Standards PY - 2011 SN - 978-0-7354-0888-3 U6 - https://doi.org/10.1063/1.3591892 SN - 0743-0760 SN - 0094-243X N1 - Serientitel: AIP conference proceedings – Series title: AIP conference proceedings IS - 1335 SP - 493 EP - 500 PB - American Institute of Physics CY - Melville, NY AN - OPUS4-27540 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -