TY - CONF A1 - Jaenisch, Gerd-Rüdiger A1 - Artemiev, Valentin M. A1 - Naumov, A. ED - Thompson, D. T1 - Dynamic image reconstruction for CT applications T2 - 27th Annual Review of Progress in Quantitative Nondestructive Evaluation CY - Ames, IA, USA DA - 2000-07-16 PY - 2000 SN - 1-563-96988-2 SN - 0743-0760 SN - 0094-243X N1 - Geburtsname von Jaenisch, Gerd-Rüdiger: Tillack, G.-R. - Birth name of Jaenisch, Gerd-Rüdiger: Tillack, G.-R. N1 - Serientitel: AIP conference proceedings – Series title: AIP conference proceedings IS - 557 SP - 1(?) EP - 8(?) PB - American Institute of Physics CY - Melville, NY AN - OPUS4-946 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Jaenisch, Gerd-Rüdiger A1 - Vengrinovich, V. A1 - Zolotarev, S. A1 - Kuntsevich, A. ED - Thompson, D. T1 - New technique for 2D and 3D X-ray image restoration of pipes in service given a limited access for observation T2 - 27th Annual Review of Progress in Quantitative Nondestructive Evaluation CY - Ames, IA, USA DA - 2000-07-16 PY - 2000 SN - 1-563-96988-2 SN - 0743-0760 SN - 0094-243X N1 - Geburtsname von Jaenisch, Gerd-Rüdiger: Tillack, G.-R. - Birth name of Jaenisch, Gerd-Rüdiger: Tillack, G.-R. N1 - Serientitel: AIP conference proceedings – Series title: AIP conference proceedings IS - 557 SP - 8 Seiten PB - American Institute of Physics CY - Melville, NY AN - OPUS4-947 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Bellon, Carsten A1 - Jaenisch, Gerd-Rüdiger T1 - Computer simulation of X-Ray NDE process T2 - International Symposium on Computed Tomography and Image Processing for Industrial Radiology CY - Berlin, Germany DA - 2003-06-23 KW - Computersimulation KW - Radiografie KW - CAD PY - 2003 SN - 3-931381-48-X N1 - Geburtsname von Jaenisch, Gerd-Rüdiger: Tillack, G.-R. - Birth name of Jaenisch, Gerd-Rüdiger: Tillack, G.-R. N1 - Serientitel: DGZfP-Proceedings BB – Series title: DGZfP-Proceedings BB IS - 84-CD SP - 187 EP - 189 PB - DGZfP CY - Berlin AN - OPUS4-2872 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Jaenisch, Gerd-Rüdiger A1 - Vengrinovich, V. T1 - Optimal processing of the information available from NDE measured data T2 - 15th World Conference on Non-Destructive Testing (WCNDT) CY - Roma, Italy DA - 2000-10-15 KW - NDE data processing KW - Inverse problems KW - Bayesian restoration KW - Data fusion PY - 2000 UR - http://www.ndt.net/article/wcndt00/papers/idn429/idn429.htm SN - 1435-4934 N1 - Geburtsname von Jaenisch, Gerd-Rüdiger: Tillack, G.-R. - Birth name of Jaenisch, Gerd-Rüdiger: Tillack, G.-R. VL - 5 IS - 11 SP - 1(?) EP - 8(?) PB - NDT.net CY - Kirchwald AN - OPUS4-860 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Jaenisch, Gerd-Rüdiger A1 - Artemiev, Valentin M. A1 - Naumov, A. T1 - Dynamic image reconstruction - General estimation principle for process tomography T2 - 15th World Conference on Non-Destructive Testing (WCNDT) CY - Roma, Italy DA - 2000-10-15 KW - Dynamic image KW - Stochastic estimation KW - Dynamic reconstruction KW - Kalman filter PY - 2000 UR - http://www.ndt.net/article/wcndt00/papers/idn326/idn326.htm SN - 1435-4934 N1 - Geburtsname von Jaenisch, Gerd-Rüdiger: Tillack, G.-R. - Birth name of Jaenisch, Gerd-Rüdiger: Tillack, G.-R. VL - 5 IS - 11 SP - 1 EP - 8(?) PB - NDT.net CY - Kirchwald AN - OPUS4-868 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Müller, Christina A1 - Zscherpel, Uwe A1 - Ewert, Uwe A1 - Rosenthal, Martina A1 - Bellon, Carsten A1 - Jaenisch, Gerd-Rüdiger ED - Madalgue, X. P. V. T1 - Reliability investigation of NDE signals N2 - The reliability investigations are dedicated to throw light on the performance of the NDE system with respect to the required aim. This is especially of interest when digitized and processed signals are involved where it becomes hard to assess whether the quality of the system has raised or not. Three different ways to investigate reliability of NDE signals will be described. The first way of investigation, the performance demonstration, is preferred e.g. in the US American nuclear power industry. This is an integral consideration of the non destructive test as a system where the whole NDE system is packed in a black box and only the input in terms of the real existing flaws in the component is considered and compared to the output in terms of the indications of the human inspector or of the automated system. The second – the European tradition – relies on a standardized description of physical/technical parameters of the NDE system which are preconditions for successful system performance. An example for such a standardized set of performance parameters is given in the recently released standard about Xray film digitization CEN EN 14096. The third approach – the modular conception – is a marriage of both: The signal chain is cut into main modules. Each module is assessed in a most appropriate individual way e.g. via modeling calculations. The single results are joint together according to the reliability of the subsystems. Separating criteria for the system were proposed through a reliability formula developed during a series of European-American workshops on NDE reliability. Examples of all three approaches will be given. T2 - 4th International Workshop - Advances in Signal Processing for Nondestructive Evaluation of Materials CY - Québec, Canada DA - 2001-08-07 KW - Reliability of NDE Systems KW - Performance Demonstration KW - Essential Parameters KW - European Standards KW - Radiographic Testing KW - Film Digitalization KW - Austenitic Tube Welds KW - ROC KW - POD PY - 2002 UR - http://intl.gel.ulaval.ca/image_site/abs_quebec_01.pdf SN - 1-571-17091-X N1 - Geburtsname von Rosenthal, Martina: Scharmach, M. - Birth name of Rosenthal, Martina: Scharmach, M. N1 - Geburtsname von Jaenisch, Gerd-Rüdiger: Tillack, G.-R. - Birth name of Jaenisch, Gerd-Rüdiger: Tillack, G.-R. N1 - Serientitel: Topics on nondestructive evaluation series – Series title: Topics on nondestructive evaluation series IS - 6 SP - 61 EP - 72 PB - American Society for Nondestructive Testing CY - Columbus, Ohio AN - OPUS4-2007 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Jaenisch, Gerd-Rüdiger A1 - Bellon, Carsten T1 - Monte Carlo Simulation für radiographische Anwendungen PY - 2003 SN - 0025-5300 N1 - Geburtsname von Jaenisch, Gerd-Rüdiger: Tillack, G.-R. - Birth name of Jaenisch, Gerd-Rüdiger: Tillack, G.-R. VL - 45 IS - 3 SP - 85 EP - 91 PB - Carl Hanser Verlag CY - München AN - OPUS4-1995 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Jaenisch, Gerd-Rüdiger A1 - Artemiev, Valentin M. A1 - Naumov, A. T1 - Rekonstruktion dynamischer Objekteigenschaften für CT PY - 2001 SN - 0025-5300 N1 - Geburtsname von Jaenisch, Gerd-Rüdiger: Tillack, G.-R. - Birth name of Jaenisch, Gerd-Rüdiger: Tillack, G.-R. VL - 43 IS - 6 SP - 254 EP - 258 PB - Carl Hanser Verlag CY - München AN - OPUS4-1190 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Jaenisch, Gerd-Rüdiger A1 - Artemiev, Valentin M. A1 - Naumov, A. T1 - Statistical Estimation theory Approach for the Dynamic Image Reconstruction T2 - 2nd World Congress on Industrial Process Tomography CY - Hannover, Germany DA - 2001-08-29 KW - Dynamic image KW - Stochastic estimation KW - Dynamic reconstruction KW - Kalman filter PY - 2001 SN - 0-85316-224-7 N1 - Geburtsname von Jaenisch, Gerd-Rüdiger: Tillack, G.-R. - Birth name of Jaenisch, Gerd-Rüdiger: Tillack, G.-R. VL - 2 IS - Appendix 1 SP - 772 EP - 779 PB - Virtual Centre for Industrial Process Tomography CY - [Manchester] AN - OPUS4-1191 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Jaenisch, Gerd-Rüdiger A1 - Gray, J. ED - Thompson, D. T1 - X-ray imaging methods over the last 25 years - new advances and capabilities N2 - The last 25 years have seen an explosion in the number of new x-ray based imaging methods and applications. In reviewing these new capabilities we see that the ability to generate improved data quality underlies a number of the major advances. Improvement in the quality of x-ray sources, in detector resolution and dynamic range, in data analysis methods both in image processing and in reconstruction techniques have yielded significant advances in image quality. In addition to the improved imaging hardware, the use of computers play a key role in extending capabilities in high speed computed tomography, in real time image enhancement, in automated defect recognition and in the development of accurate x-ray inspection simulations. The ability to generate information and to analyze the complexities introduced by typical inspection demands can quickly outstrip even today's computational resources. Developments in parallel computing and computer memory are beginning to managing the huge data volumes now routinely produced and open up a number of new applications. Some examples include high-resolution 3D-image generation with the capability to probe micron length scales, dual energy computed tomography providing improved airport security, materials characterization techniques providing new tool for process development, and x-ray image formation modeling. The ability to model the details of the generation of bremsstrahlung radiation and its interaction with the complex geometry of the object under consideration provide for the first time a means to determine and quantify the optimal parameters for an inspection. These advances over the last 25 years represent exciting time in x-ray imaging, the impact of which will be played out in the next decade. ©2001 American Institute of Physics. T2 - 27th Annual Review of Progress in Quantitative Nondestructive Evaluation CY - Ames, IA, USA DA - 2000-07-16 PY - 2001 SN - 1-563-96988-2 U6 - https://doi.org/10.1063/1.1373737 SN - 0743-0760 SN - 0094-243X N1 - Geburtsname von Jaenisch, Gerd-Rüdiger: Tillack, G.-R. - Birth name of Jaenisch, Gerd-Rüdiger: Tillack, G.-R. N1 - Serientitel: AIP conference proceedings – Series title: AIP conference proceedings IS - 557 SP - 16 EP - 32 PB - American Institute of Physics CY - Melville, NY AN - OPUS4-1192 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -