TY - JOUR A1 - Sobol, Oded A1 - Holzlechner, Gerald A1 - Nolze, Gert A1 - Wirth, Thomas A1 - Eliezer, D. A1 - Böllinghaus, Thomas A1 - Unger, Wolfgang T1 - Time-of-Flight secondary ion mass spectrometry (ToF-SIMS) imaging of deuterium assisted cracking in a 2205 duplex stainless steel microstructure N2 - In the present work, the influence of deuterium on the microstructure of a duplex stainless steel type EN 1.4462 has been characterized by Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) supported by scanning electron microscopy (SEM), focused ion beam (FIB), electron back scattered diffraction(EBSD) and energy dispersive x-ray (EDX) investigations. Characterization has been carried out before and after electrochemical charging with deuterium which has been used as a tracer, due to its similar behavior to hydrogen in the steel microstructure. In a first approach, the distribution of the deuterium occurring at temperatures above 58 °C has been visualized. Further it turned out that sub-surface micro blisters are formed in the ferrite-austenite interface, followed by the formation of needle shaped plates and subsequent cracking at the ferrite surface. In the austenite phase, parallel cracking alongside twins and hexagonal close packed (martensitic) regions has been observed. In both phases and even in the apparent interface, cracking has been associated with high deuterium concentrations, as compared to the surrounding undamaged microstructure. Sub-surface blistering in the ferrite has to be attributed to the accumulation and recombination of deuterium at the ferrite-austenite interface underneath the respective ferrite grains and after fast diffusing through this phase. Generally, the present application of chemometric imaging and structural analyses allows characterization of hydrogen assisted degradation at a sub-micron lateral resolution. KW - ToF-SIMS KW - Hydrogen assisted cracking KW - Hydrogen embrittlement KW - SEM KW - FIB KW - EBSD PY - 2016 UR - http://www.sciencedirect.com/science/article/pii/S0921509316310334 U6 - https://doi.org/10.1016/j.msea.2016.08.107 SN - 0921-5093 VL - 676 SP - 271 EP - 277 PB - Elsevier B.V. AN - OPUS4-37298 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Sobol, Oded A1 - Holzlechner, Gerald A1 - Holzweber, Markus A1 - Lohninger, H. A1 - Böllinghaus, Thomas A1 - Unger, Wolfgang T1 - First use of data fusion and multivariate analysis of ToF-SIMS and SEM image data for studying deuterium-assisted degradation processes in duplex steels N2 - Time-of-flight secondary ion mass spectrometry (ToF-SIMS) and high-resolution scanning electron microscopy are well-acknowledged tools in materials characterization. The ability to map chemical species on the surface of an investigated sample with often low mass detection limits makes ToF-SIMS an essential tool in fields where many question marks concerning Degradation processes and damage mechanisms exist. The aim of this paper is to describe the power of data fusion of ToF-SIMS and high-resolution scanning electron microscopy results employing computational methods for multivariate data Analysis such as principal component analysis. As a case study the investigation of hydrogen distribution in an artificially charged Duplex stainless steel microstructure is presented aiming on a better understanding of hydrogen embrittlement. T2 - 16th European Conference on Applications of Surface and Interface Analysis CY - Granada, Spain DA - 28.09.2015 KW - ToF-SIMS KW - HR-SEM KW - Data fusion KW - Duplex stainless steel KW - Hydrogen embrittlement PY - 2016 UR - http://onlinelibrary.wiley.com/doi/10.1002/sia.6015/full U6 - https://doi.org/10.1002/sia.6015 VL - 48 IS - 7 SP - 474 EP - 478 PB - John Wiley & Sons, Ltd CY - Surface and Interface Analysis AN - OPUS4-36832 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Holzlechner, Gerald A1 - Hussels, M. A1 - Reihardt, P. A1 - Jungnickel, H. A1 - Kummrow, A. A1 - Neukammer, J. A1 - Unger, Wolfgang T1 - Metrology for monitoring infectious diseases: flow cytometer, XPS and TOF-SIMS characterization of DNA adhesion losses on micro fluidic PCR devices T2 - Angewandte Oberflächen Analytik Tagung, AOFA 18 CY - Kaiserslautern, Germany DA - 2014-09-29 PY - 2014 AN - OPUS4-31684 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Holzlechner, Gerald A1 - Sobol, Oded A1 - Böllinghaus, Thomas A1 - Unger, Wolfgang ED - Udomkichdecha, W. ED - Mononukul, A. ED - Böllinghaus, Thomas ED - Lexow, Jürgen T1 - Imaging ToF-SIMS as a chemical metrology tool to support material and analytical science N2 - As a chemical metrology tool time-of-flight secondary ion mass spectrometry (ToF-SIMS) has become a very popular technique to monitor the elemental, isotopic and molecular distribution in two or three dimensions. Its reduced sampling depth, high sensitivity, great structural specificity and the direct detection of hydrogen thereby increase the emergence of ToF-SIMS for material and analytical surface science, particularly due to recent instrumental developments improving mass, depth and lateral resolution. For basic surface science, adsorption processes and surface reactivity thus can be investigated in high detail on organic as well as inorganic samples. The use of multivariate data analysis in addition can effectively assist to identify trends in the complex SIMS raw data set and define key co-variances between certain samples or mass spectra. In this contribution the essence of ToF-SIMS is illustrated by discussing two highly relevant energy applications. First, for piezoelectric electroceramics oxygen exchange active zones have been visualized to determine the impact of external field-load to the oxygen vacancy distribution between anode and cathode. As a second case study the interaction of hydrogen species with the microstructure of a duplex stainless steel was investigated. It was concluded that ToF-SIMS has a valuable essence for detailing hydrogen related degradation mechanisms. T2 - 4th WMRIF Young scientists workshop CY - Boulder, CO, USA DA - 08.09.2014 PY - 2016 SN - 978-981-287-723-9 SN - 978-981-287-724-6 U6 - https://doi.org/10.1007/978-981-287-724-6_7 SP - 63 EP - 72 PB - Springer AN - OPUS4-34881 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Holzlechner, Gerald A1 - Sobol, Oded A1 - Straub, Franka A1 - Böllinghaus, Thomas A1 - Unger, Wolfgang T1 - ToF-SIMS as a Metrology Tool to Support Materail and Analytical Science T2 - 4th WMRIF Young Scientist Workshop CY - Denver, Colorado USA DA - 2014-09-08 PY - 2014 AN - OPUS4-34684 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Holzlechner, Gerald A1 - Hussels, M. A1 - Reichardt, Ph. A1 - Jungnickel, H. A1 - Kummrow, A. A1 - Unger, Wolfgang A1 - Neukammer, J. T1 - METROLOGY FOR MONITORING INFECTIOUS DISEASES Flow cytometer, ToF-SIMS, and XPS characterization of DNA adhesion losses on micro fluidic PCR devices T2 - AOFA 18. Arbetistagung Angewandte Oberflächenanalytik CY - Kaiserslautern DA - 2014-09-29 PY - 2014 AN - OPUS4-34685 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Holzlechner, Gerald A1 - Sobol, Oded A1 - Straub, Franka A1 - Böllinghaus, Thomas A1 - Unger, Wolfgang T1 - ToF-SIMS as a Metrology Tool to Support Material and Analytical Science T2 - Seminar at MTEC Bangkok CY - Bangkok, Thailand DA - 2015-06-22 PY - 2015 AN - OPUS4-34686 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Holzlechner, Gerald A1 - Unger, Wolfgang A1 - Giovannozzi, A. A1 - Arlinghaus, H. F. A1 - Portesi, C. A1 - Pelster, A. A1 - Pollakowski, B. A1 - Beckhoff, B. A1 - Bunch, J. A1 - Tyler, B. A1 - Hornemann, A. A1 - Pollakowski, B. T1 - Traceability of PDMS on TiO2 and HDPE substrates by a multi analytical approach T2 - ECASIA 16th CY - Granada, Spain DA - 2015-09-28 PY - 2015 AN - OPUS4-34687 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Holzlechner, Gerald A1 - Sobol, Oded A1 - Wirth, Thomas A1 - Böllinghaus, Thomas A1 - Unger, Wolfgang T1 - Investigations of Hydrogen Embrittlement (HE) b Time-of-Flight Secondary Ion mass Spectroscopy (ToF-SIMS) T2 - ECASIA, 16th CY - Granada, Spain DA - 2015-09-28 PY - 2015 AN - OPUS4-34688 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -