TY - JOUR A1 - Hodoroaba, Vasile-Dan A1 - Rades, Steffi A1 - Natte, Kishore A1 - Orts Gil, Guillermo A1 - Unger, Wolfgang T1 - Morphology of nanoparticles - A characterization using high-resolution SEM JF - GIT Imaging & Microscopy N2 - Potential candidates of reference nano-materials are manufactured and systematically characterized in particular with respect to their morphology (shape, size and size distribution) in the frame of the running large European project NanoValid. By exploiting the transmission operation mode in a SEM, known as T-SEM, it is demonstrated by means of three representative examples of nanoparticles how a quick morphological inspection up to a complete, metrological characterization is feasible. KW - Nanoparticles KW - SEM KW - TEM KW - T-SEM KW - NanoValid PY - 2013 SN - 1439-4243 SN - 1863-7809 VL - 15 IS - 1 SP - 54 EP - 56 PB - GIT-Verl. CY - Darmstadt AN - OPUS4-27925 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan A1 - Heilmann, Maria T1 - Nanoparticle Populations N2 - Two new projects P15 Measurement of particle size and shape distribution of bipyramidal titania including deposition from liquid suspension and P16 Measurement of (relative) number concentration of bimodal silica nanoparticles including deposition from liquid suspension have been started at VAMAS/TWA 34 under the lead of BAM. First results are presented and discussed. T2 - Versailles Project on Advanced Materials and Standards (VAMAS) 47th Steering Committee Meeting CY - Turin, Italy DA - 18.10.2022 KW - VAMAS KW - Nanoparticles KW - Inter-laboratory comparison KW - Particle size distribution KW - Nanoparticle concentration PY - 2022 AN - OPUS4-56196 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - EMPIR nPSize - Improved Traceability Chain of Nanoparticle Size Measurement - What nPSize can offer to ISO/TC 229? N2 - The main outcomes of the EMPIR project nPSize are presented and the suitability of the new capabilities, e.g. reference materials, sample preparation protocols, measurement procedures, and data analysis, to be standardized and implemented in accredited analytical laboratories is discussed. Complementation and/or filling gaps of published and ongoing standardisation projects on size, shape and number concentration measurements under ISO/TC 229/JWG 2 are offered. The two VAMAS inter-laboratory comparisons resulted from the nSPize project and just started under TWA 34 Nanoparticle Populations (Projects #15 and #16) of bipyramidal TiO2 anatase and bimodal SiO2 nanoparticles are presented in detail. T2 - Interim Meeting of ISO/TC 229 Nanotechnologies - Strategy and Metrology Group CY - Online meeting DA - 09.05.2022 KW - Nanoparticles KW - Particle size distribution KW - Inter-laboratory comparison KW - Electron microscopy KW - AFM KW - SAXS KW - ISO/TC229 PY - 2022 AN - OPUS4-54819 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Advanced Characterization of the Surface Morphology and Chemistry within nano@BAM N2 - Both essential aspects of the surface of solid matter, its morphology and chemistry, are studied traditionally at BAM starting in the 60’s with different cyclical research focus areas, mostly related either to applicative research or method development. In the recent years, the focus has shifted almost exclusively to the nano-analytics of advanced materials such as complex nanoparticles, (ultra)thin films/coatings, nanocomposites, 2D materials, energy materials, etc. This is also the reason why BAM has established recently the new Competence Center nano@BAM (www.bam.de/Navigation/DE/Themen/Material/Nanotechnologie/sichere-nanomaterialien.html) with the five sub-fields nanoCharacterisation, nanoMaterial, nanoSafety, nanoData and nanoTechnology. The link to the BAM central guidelines to the safety in technology and chemistry is given by the development of reference products such as reference measurement procedures, reference (nano)materials, and newly reference data sets. Thus, an internationally well-networked group in surface analysis has been established @BAM, with regular contributions to integral analytical characterization with metrological and standardization background. Examples of newly developed methodical approaches will be given with an emphasis on correlative nano-analysis of morphology and chemistry of nanomaterials. Correlative imaging by STEM-in-SEM with high-resolution SEM and EDX, and further with AFM or the new technique TKD (Transmission Kikuchi Diffraction) will be explained on various examples of nanostructures, both as starting materials and embedded/functionalized nanoparticles in products. The unique analytical benefits of the Auger electron probe as a veritable nano-tool for surface chemistry will be highlighted. The panoply of advanced surface characterization methods @BAM is completed by discussing examples of hybrid analysis of the bulk of nanomaterials by X-ray Spectroscopy with the highest surface-sensitive methods X-ray Photoelectron Spectroscopy (XPS) and Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS). Particularly for the analysis of the surface chemistry of nanostructures, such as the completeness of the shells of core-shell nanoparticles or in-depth and lateral gradients of chemistry within mesoporous thin layers, the latter methods are inherent. Other special developments like approaches for the quantitative determination of the roughness of particle surface by electron microscopy or for the quantitative determination of the porosity of thin mesoporous layers by electron probe microanalysis (EPMA) with SEM will be presented. T2 - Seminar of the Academic Centre for Materials and Nanotechnology CY - Online meeting DA - 12.05.2022 KW - Nanoparticles KW - Thin films KW - Nano Characterisation KW - Nanomaterials KW - Surface morphology KW - Surface chemistry PY - 2022 UR - https://www.agh.edu.pl/en/info/article/seminar-advanced-characterization-of-the-surface-morphology-and-chemistry-within-nanobam/ AN - OPUS4-54820 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - RPRT A1 - Hodoroaba, Vasile-Dan A1 - Fontanges, R. A1 - Delvallée, A. A1 - Deumer, J. A1 - Salzmann, C. A1 - Crouzier, L. A1 - Gollwitzer, C. A1 - Klein, T. A1 - Koops, R. A1 - Sebaihi, N. A1 - Pauw, Brian Richard A1 - Smales, Glen Jacob A1 - Artous, S. A1 - Taché, O. A1 - Feltin, N. T1 - Report on full algorithm sequences for nanoparticle detection and size measurement as developed on both a physical basis and by machine learning T2 - Community EMPIR Project 17NRM04 nPSize (Improved traceability chain of nanoparticle size measurements) N2 - he main objective of the nPSize project is to improve the measurement capabilities for nanoparticle size based on both measurement methods traceable to SI units and new reference materials. Two basic approaches have been used in order to develop measurement procedures resulting in traceable results of the nanoparticle size distribution: physical modelling for the methods used in the project (TSEM, SEM, AFM and SAXS) and machine learning. Physical modelling: In this part, the physical models associated with different shape measurements for the techniques TSEM, SEM, AFM and SAXS have been collected and further developed with the aim to simulate the resulting signal as measured by the individual methods. Uncertainties and traceability associated with each model were investigated and evaluated. In the following, the progress on these physical models is reported for each individual method. Machine Learning modelling: The aim of this part is to use machine learning to enable automatic measurement of nanoparticle shape from expert a-priori information only. No physical model will be used as a-priori information in this task. The accuracy and traceability of the size results obtained by each technique will be analyzed and compared with the physical modelling. A machine learning database will then be used to create automatic detection algorithms. KW - Nanoparticles KW - Particle size distribution KW - SEM KW - TSEM KW - TEM KW - SAXS KW - AFM PY - 2022 UR - https://nbn-resolving.org/urn:nbn:de:kobv:b43-546531 DO - https://doi.org/10.5281/zenodo.5807864 SP - 1 EP - 20 PB - Zenodo CY - Geneva AN - OPUS4-54653 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Hodoroaba, Vasile-Dan A1 - Fagan, J. T1 - Contributors invited for two studies on concentration of bimodal silica nanoparticle and bipyramidal titania T2 - Newsletter of IOM3 N2 - International standardisation network VAMAS is calling for participants in two studies on the measurement of (relative) number concentration of bimodal silica nanoparticles including deposition from liquid suspension and the measurement of particle size and shape distribution of bipyramidal titania including deposition from liquid suspension. KW - Nanoparticles KW - VAMAS KW - Inter-laboratory comparison KW - TiO2 KW - SiO2 PY - 2021 UR - https://www.iom3.org/resource/contributors-invited-for-two-studies-on-concentration-of-bimodal-silica-nanoparticle-and-bipyramidal-titania.html SP - 1 EP - 2 PB - Institute of Materials, Minerals and Mining (IOM3) CY - London, UK AN - OPUS4-54410 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Crouzier, L. A1 - Feltin, N. A1 - Delvallée, A. A1 - Pellegrino, Francesco A1 - Maurino, V. A1 - Cios, Grzegorz A1 - Tokarski, T. A1 - Salzmann, Christoph A1 - Deumer, J. A1 - Gollwitzer, C. A1 - Hodoroaba, Vasile-Dan T1 - Correlative analysis of the dimensional properties of bipyramidal titania nanoparticles by complementing electron microscopy with other methods JF - Nanomaterials N2 - In this paper, the accurate determination of the size and size distribution of bipyramidal anatase nanoparticles (NPs) after deposition as single particles on a silicon substrate by correlative Scanning Electron Microscopy (SEM) with Atomic Force Microscopy (AFM) analysis is described as a new measurement procedure for metrological purposes. The knowledge of the exact orientation of the NPs is a crucial step in extracting the real 3D dimensions of the particles. Two approaches are proposed to determine the geometrical orientation of individual nano‐bipyramides: (i) AFM profiling along the long bipyramid axis and (ii) stage tilting followed by SEM imaging. Furthermore, a recently developed method, Transmission Kikuchi Diffraction (TKD), which needs preparation of the crystalline NPs on electron‐transparent substrates such as TEM grids, has been tested with respect to its capability of identifying the geometrical orientation of the individual NPs. With the NPs prepared homogeneously on a TEM grid, the transmission mode in a SEM, i.e., STEM‐in‐SEM (or T‐SEM), can be also applied to extract accurate projection dimensions of the nanoparticles from the same sample area as that analysed by SEM, TKD and possibly AFM. Finally, Small Angle X‐ray Scattering (SAXS) can be used as an ensemble technique able to measure the NPs in liquid suspension and, with ab‐initio knowledge of the NP shape from the descriptive imaging techniques, to provide traceable NP size distribution and particle concentration. KW - Nanoparticles KW - Complex-shape KW - Bipyramid KW - Electron microscopy KW - AFM KW - Size measurements KW - TKD KW - STEM-in-SEM KW - SAXS KW - Nanoparticle concentration KW - Correlative analysis PY - 2021 UR - https://nbn-resolving.org/urn:nbn:de:kobv:b43-539888 DO - https://doi.org/10.3390/nano11123359 SN - 2079-4991 VL - 11 IS - 12 SP - 1 EP - 19 PB - MDPI CY - Basel AN - OPUS4-53988 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Hülagü, Deniz A1 - Tobias, Charlie A1 - Climent Terol, Estela A1 - Gojani, Ardian A1 - Rurack, Knut A1 - Hodoroaba, Vasile-Dan T1 - Generalized Analysis Approach of the Profile Roughness by Electron Microscopy with the Example of Hierarchically Grown Polystyrene–Iron Oxide–Silica Core–Shell–Shell Particles JF - Advanced Engineering Materials N2 - The roughness as a property of core–shell (CS) microparticles plays a key role in their functionality. Quantitative evaluation of the roughness of CS microparticles is, however, a challenging task with approaches using electron microscopy images being scarce and showing pronounced differences in terms of methodology and results. This work presents a generalized method for the reliable roughness determination of nonplanar specimens such as CS particles from electron microscopic images, the method being robust and reproducible with a high accuracy. It involves a self-written software package (Python) that analyzes the recorded images, extracts corresponding data, and calculates the roughness based on the deviation of the identified contour. Images of single particles are taken by a dual mode scanning electron microscopy (SEM) setup which permits imaging of the same field-of-view of the sample with high resolution and surface sensitive in SE InLens mode as well as in transmission mode (TSEM). Herein, a new type of polystyrene core–iron oxide shell–silica shell particles is developed to serve as a set of lower micrometer-sized study objects with different surface roughness; the analysis of their images by the semiautomatic workflow is demonstrating that the particles’ profile roughness can be quantitatively obtained. KW - Core–shell particles KW - Image analysis KW - Nanoparticles KW - Roughness KW - SEM KW - transmission mode PY - 2022 UR - https://nbn-resolving.org/urn:nbn:de:kobv:b43-542576 DO - https://doi.org/10.1002/adem.202101344 SP - 1 EP - 9 PB - Wiley-VCH AN - OPUS4-54257 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Advanced Characterization of the Surface Morphology and Chemistry within nano@BAM N2 - Both essential aspects of the surface of solid matter, its morphology and chemistry, are studied traditionally at BAM starting in the 60’s with different cyclical research focus areas, mostly related either to applicative research or method development. In the recent years, the focus has shifted almost exclusively to the nano-analytics of advanced materials such as complex nanoparticles, (ultra)thin films/coatings, nanocomposites, 2D materials, energy materials, etc. This is also the reason why BAM has established recently the new Competence Center nano@BAM (www.bam.de/Navigation/DE/Themen/Material/Nanotechnologie/sichere-nanomaterialien.html) with the five sub-fields nanoCharacterisation, nanoMaterial, nanoSafety, nanoData and nanoTechnology. The link to the BAM central guidelines to the safety in technology and chemistry is given by the development of reference products such as reference measurement procedures, reference (nano)materials, and newly reference data sets. Thus, an internationally well-networked group in surface analysis has been established @BAM, with regular contributions to integral analytical characterization with metrological and standardization background. Examples of newly developed methodical approaches will be given with an emphasis on correlative nano-analysis of morphology and chemistry of nanomaterials. Correlative imaging by STEM-in-SEM with high-resolution SEM and EDX, and further with AFM or the new technique TKD (Transmission Kikuchi Diffraction) will be explained on various examples of nanostructures, both as starting materials and embedded/functionalized nanoparticles in products. The unique analytical benefits of the Auger electron probe as a veritable nano-tool for surface chemistry will be highlighted. The panoply of advanced surface characterization methods @BAM is completed by discussing examples of hybrid analysis of the bulk of nanomaterials by X-ray Spectroscopy with the highest surface-sensitive methods X-ray Photoelectron Spectroscopy (XPS) and Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS). Particularly for the analysis of the surface chemistry of nanostructures, such as the completeness of the shells of core-shell nanoparticles or in-depth and lateral gradients of chemistry within mesoporous thin layers, the latter methods are inherent. Other special developments like approaches for the quantitative determination of the roughness of particle surface by electron microscopy or for the quantitative determination of the porosity of thin mesoporous layers by electron probe microanalysis (EPMA) with SEM will be presented in conjunction with the corresponding advanced materials studied. Current research projects, promising ideas, including ongoing (pre-)standardization activities in the field of the challenging nano/surface analysis will be touched systematically, with the open goal of identifying future bilateral cooperation possibilities between EMPA and BAM. T2 - EMPA-Kolloquium CY - Online meeting DA - 01.12.2021 KW - Nanoparticles KW - Nano@BAM KW - Nanomaterials KW - Surface morphology and chemistry KW - Correlative analysis PY - 2021 AN - OPUS4-54039 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - EMPIR nPSize - Improved Traceability Chain of Nanoparticle Size Measurement N2 - In order to assess new nanomaterials and nanoparticles for potential risks to health and the environment, they need to be well-characterised. The measurement of constituent nanoparticle size, shape, and size distribution are important factors for the risk evaluation process. EMPIR project Improved traceability chain of nanoparticle size measurements (17NRM04, nPSize) is working to assess a range of traceable nanoparticle measurement approaches, including Electron Microscopy (SEM, TEM, STEM-in-SEM), Atomic Force Microscopy and Small Angle X-ray Scattering, and deliver improved calibration methods to users. For the techniques under investigation, physical models of their response to a range of nanoparticle types are developed. Validated reference materials are also used for inter-comparisons of measurement systems, with an evaluation of the associated measurement uncertainty. With project contributions to standards development work, manufacturers will be better placed to assess the human and environmental risks posed by nanomaterials across a whole range of products. T2 - EMPIR nPSize Training Course "Traceable Characterization of Nanoparticles by SAXS" CY - Online meeting DA - 01.02.2021 KW - Nanoparticles KW - Particle size distribution KW - Traceability KW - nPSize KW - SAXS PY - 2021 AN - OPUS4-53883 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -