TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Depth profiling of layered samples by Glow Discharge Optical Emission Spectroscopy (GD-OES) T2 - AIST-BAM Symposium on Materials Surface Technology in Twin Institute Programme CY - Tsukuba, Japan DA - 2003-02-18 PY - 2003 SP - 71 EP - 73 AN - OPUS4-6926 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -