TY - JOUR A1 - Hentschel, Manfred P. A1 - Müller, Bernd R. A1 - Lange, Axel A1 - Harbich, Karl-Wolfram A1 - Schors, Jörg A1 - Wald, Oliver T1 - New Developments in X-ray-Topography of Advanced Non-Metallic Materials T2 - 15th World Conference on Non-Destructive Testing (WCNDT) CY - Roma, Italy DA - 2000-10-15 PY - 2000 UR - http://www.ndt.net/article/wcndt00/papers/idn258/idn258.htm SN - 1435-4934 VL - 5 IS - 11 PB - NDT.net CY - Kirchwald AN - OPUS4-928 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Harbich, Karl-Wolfram A1 - Hentschel, Manfred P. A1 - Schors, Jörg T1 - X-ray refraction characterization of nonmetallic materials KW - Nondestructive characterization KW - X-ray refraction topography KW - Pore size KW - Crack density PY - 2001 SN - 0963-8695 VL - 34 SP - 297 EP - 302 PB - Butterworth-Heinemann CY - Oxford AN - OPUS4-945 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Görner, Wolf A1 - Hentschel, Manfred P. A1 - Müller, Bernd R. A1 - Riesemeier, Heinrich A1 - Krumrey, M. A1 - Ulm, G. T1 - The first hard X-rays at the BAMline PY - 2001 UR - http://www.helmholtz-berlin.de/media/media/oea/web/pr_webseite/druckschriften/berichte/bessy/annualreport2000.pdf#page=329 SN - 0179-4159 SP - 329 EP - 331 PB - Berliner Elektronenspeicherring-Gesellschaft für Synchrotronstrahlung CY - Berlin AN - OPUS4-1299 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Müller, Bernd R. A1 - Hentschel, Manfred P. A1 - Lange, Axel T1 - Non-destructive evaluation of advanced materials by synchrotron radiation refraction topography PY - 2002 UR - http://www.helmholtz-berlin.de/media/media/oea/web/pr_webseite/druckschriften/berichte/bessy/annualreport2001.pdf#page=233 SN - 0179-4159 SP - 233 EP - 234 PB - Berliner Elektronenspeicherring-Gesellschaft für Synchrotronstrahlung CY - Berlin AN - OPUS4-1326 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Müller, Bernd R. A1 - Ekenhorst, Derk A1 - Brzezinka, Klaus-Werner A1 - Hentschel, Manfred P. ED - Krenkel, W. T1 - Fiber Induced Failure of Carbon/Carbon Composites T2 - 4th International Conference on High Temperature Ceramic Matrix Composites ; 4th HT-CMC Conference CY - Munich, Germany DA - 2001-10-01 PY - 2001 SN - 3-527-30320-0 VL - 4 SP - 175 EP - 180 PB - Wiley-VCH CY - Weinheim AN - OPUS4-1289 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Harbich, Karl-Wolfram A1 - Hentschel, Manfred P. A1 - Ekenhorst, Derk A1 - Schors, Jörg A1 - Lange, Axel T1 - X-Ray Refraction for NDT of Micro Cracks and Impacts N2 - High performance composites and other light weight materials are generally a comple problem to the performance of nondestructive testing methods. X-ray refraction provide unconventional X-ray scattering techniques to meet the actual demand for improve nondestructive characterization of these advanced materials. Scanning the samples across collimated narrow incident X-ray beam permits to image integral micro-structures (a present) with a resolution of 10 µm. Investigations of samples after strain-induced micro cracks and fibre debonding in impact damaged epoxy are shown. The physics of X-ray refraction are analogous to the well known refraction of light b optical lenses and prisms, governed by Snell's law. The special feature is the deflection a very small angles of few minutes of arc, as the refractive index of X-rays in matter i nearly one. Due to the density differences at inner surfaces most of the incident X-rays ar deflected. As the scattered intensity of refraction is proportional to the specific surface of sample, a reference standard gives a quantitative measure for analytical determinations. Figure 1 represents a two-dimensional damage distribution of an impact in a 0/90° CFR laminate of 3 mm, thickness. Unlike in ultrasonic testing, there is no shadowing effect o the successive layers. By use of X-ray refraction the exact concentration of debonde fibres is calculated for each position. Additionally the refraction allows the selection of th fibre orientation. T2 - 7th European Conference on Non-Destructive Testing (ECNDT) CY - Copenhagen, Denmark DA - 1998-05-26 PY - 1998 UR - http://www.ndt.net/abstract/ecndt98/435.htm SN - 87-986898-0-0 VL - 3 CY - Broendy, Denmark AN - OPUS4-3328 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Hentschel, Manfred P. A1 - Ekenhorst, Derk A1 - Harbich, Karl-Wolfram A1 - Lange, Axel A1 - Schors, Jörg ED - Green, R. E. T1 - New X-ray refractography for non-destructive evaluation of advanced materials T2 - 8th International Symposium on Nondestructive Characterization of Materials CY - Boulder, CO, USA DA - 1997-06-15 PY - 1998 SN - 0-306-45900-0 VL - 8 SP - 409 EP - 416 PB - Plenum Press CY - New York AN - OPUS4-3330 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Hentschel, Manfred P. A1 - Harbich, Karl-Wolfram A1 - Lange, Axel A1 - Schors, Jörg A1 - Ekenhorst, Derk A1 - Judd, M.D. A1 - Raynal, R. T1 - X-ray refraction characterizes leight weight materials PY - 1998 SN - 1018-8657 VL - 8 IS - 3 SP - 14 EP - 15 PB - European Space Agency CY - Noordwijk AN - OPUS4-3331 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Harbich, Karl-Wolfram A1 - Schors, Jörg A1 - Lange, Axel A1 - Hentschel, Manfred P. ED - van Hemelrijck, D. T1 - X-ray refraction - new methods for non-destructive evaluation of advanced materials T2 - 2nd International Conference on Emerging Technologies in NDT CY - Athens, Greece DA - 1999-05-24 KW - X-ray refraction PY - 2000 SN - 90-5809-127-9 SP - 207 EP - 212 PB - Balkema CY - Rotterdam AN - OPUS4-851 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Harbich, Karl-Wolfram A1 - Hentschel, Manfred P. T1 - Nondestructive Characterization of Monolithic Ceramics by X-Ray Refraction T2 - 7th Euro Ceramics - Conference and Exhibition of the European Ceramic Society (ECerS) CY - Brugge, Belgium DA - 2001-09-09 KW - X-ray refraction KW - Non-destructive testing KW - Porosity KW - Specific surface KW - Pore size PY - 2001 SN - 1013-9826 VL - 206-213 SP - 673 EP - 676 PB - Trans Tech Publ. CY - Aedermannsdorf AN - OPUS4-1861 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Rudolph, Hans-Volker A1 - Hentschel, Manfred P. A1 - Ivers, Heinz T1 - Damage accumulation in short fiber reinforced thermoplast by X-Ray refraction N2 - Micro damage structures of fiber reinforced polymers (FRP) can be characterized nondestructively by X-ray refraction topography, which images inner surfaces. The damage accumulation after fatigue treatment of short glass fiber reinforced polybutylene terephthalate (PBT-GF) is correlated to the applied load and the number of cycles. Micro cracks and fiber/matrix debonding during fatigue can be detected separately due to their different direction of X-ray small angle scattering. The residual strength over the crack surface decreases by a linear decay as 30 %, 60 % and 90 % of the materials lifetime is passed. T2 - 8th ECNDT CY - Barcelona, Spain DA - 2002-06-17 PY - 2002 UR - http://www.ndt.net/article/ecndt02/193/193.htm VL - 8 SP - 1 EP - 5 PB - European Federation for Non-Destructive Testing CY - Barcelona AN - OPUS4-1840 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Müller, Bernd R. A1 - Hentschel, Manfred P. A1 - Lange, Axel A1 - Harwardt, Michael T1 - Characterization of fibre reinforced metals by X-ray refraction CT PY - 2003 UR - http://www.helmholtz-berlin.de/media/media/oea/web/pr_webseite/druckschriften/berichte/bessy/annualreport2002.pdf#page=336 SN - 0179-4159 SP - 336 EP - 337 PB - Berliner Elektronenspeicherring-Gesellschaft für Synchrotronstrahlung CY - Berlin AN - OPUS4-2493 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Müller, Bernd R. A1 - Hentschel, Manfred P. A1 - Harbich, Karl-Wolfram A1 - Lange, Axel A1 - Schors, Jörg T1 - X-ray refraction topography for non-destructive evaluation of advanced materials T2 - 15th World Conference on Non-Destructive Testing (WCNDT) CY - Roma, Italy DA - 2000-10-15 KW - X-ray refraction PY - 2000 UR - http://www.ndt.net/article/wcndt00/papers/idn257/idn257.htm SN - 1435-4934 VL - 5 IS - 11 SP - 1 EP - 7(?) PB - NDT.net CY - Kirchwald AN - OPUS4-871 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hentschel, Manfred P. A1 - Gofers, J. T1 - HYJECT T2 - Messe EUROMOLD 2002 CY - Frankfurt am Main, Germany DA - 2002-12-04 PY - 2002 AN - OPUS4-2033 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Müller, Bernd R. A1 - Lange, Axel A1 - Harwardt, Michael A1 - Hentschel, Manfred P. A1 - Illerhaus, Bernhard A1 - Goebbels, Jürgen T1 - First refraction enhanced 3D computed tomography T2 - International Symposium on Computed Tomography and Image Processing for Industrial Radiology CY - Berlin, Germany DA - 2003-06-23 PY - 2003 SN - 3-931381-48-X N1 - Serientitel: DGZfP-Proceedings BB – Series title: DGZfP-Proceedings BB IS - 84-CD PB - DGZfP CY - Berlin AN - OPUS4-2519 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Müller, Bernd R. A1 - Lange, Axel A1 - Hentschel, Manfred P. ED - Cohen, L. J. T1 - Non-Destructive Characterization of High Performance Composites by use of X-Ray Refraction Topography T2 - 48th International SAMPE symposium and exhibition CY - Long Beach, CA, USA DA - 2003-05-11 KW - Non-Destructive Inspection (NDI) KW - Characterization KW - Advanced Composite PY - 2003 SN - 0-938994-94-8 VL - 1 SP - 1203 EP - 1211 PB - SAMPE International Business Office CY - Covina, Calif. AN - OPUS4-2542 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hentschel, Manfred P. A1 - Lange, Axel A1 - Harbich, Karl-Wolfram A1 - Schors, Jörg A1 - Wald, Oliver T1 - X-ray diffraction and refraction topography of light weight materials T2 - 41st Annual Conference of The British Institute of Non-Destructive Testing - NDT 2002 CY - Southport, England DA - 2002-09-17 PY - 2002 AN - OPUS4-3092 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hentschel, Manfred P. A1 - Lange, Axel A1 - Harbich, Karl-Wolfram T1 - X-Ray Diffraction Scanning Microscopy - A new method of nondestructive Characterization of inhomogeneous materials T2 - ESA Symposium on Space Applications of Advanced Structural Materials (ESTEC) CY - Noordwijk, Netherlands DA - 1990-03-21 PY - 1990 IS - MBB-Z--0301-90-PUB SP - 447 EP - 450 PB - Zentrale Berichtsstelle, Technisch-wissenschaftliche Information, Messerschmitt-Bölkow-Blohm GmbH CY - München AN - OPUS4-3269 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Hentschel, Manfred P. A1 - Harbich, Karl-Wolfram A1 - Lange, Axel ED - Burke, W. T1 - New X-ray scanning topographic approaches to nondestructive evaluation of composites T2 - International Symposium "Advanced Materials for Lightweight Structures" CY - Noordwijk, Netherlands DA - 1992-03-25 PY - 1992 SN - 92-9092-186-2 N1 - Serientitel: ESA SP – Series title: ESA SP IS - 336 SP - 229 EP - 232 PB - ESTEC, ESA Publ. Division CY - Noordwijk AN - OPUS4-3271 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Harbich, Karl-Wolfram A1 - Hentschel, Manfred P. A1 - Schors, Jörg ED - Vincenzini, P. T1 - X-ray refraction: A new method for nondestructive characterization of advanced ceramics N2 - Quantitative X-ray refraction topography is applied for improved nondestructive evaluation of advanced high performance ceramics. The method is based on X-ray small angle scattering by refraction of X-rays due to density differences of microstructures in heterogeneous materials. It determines the amount of inner surfaces and interfaces within the range of µm to nm dimensions. As the scattered refraction intensity is proportional to the inner surface density of a sample, a reference standard gives a quantitative measure for analytical requirements. X-ray refraction scanning topography visualizes integral interface properties at 10 µm spatial resolution by two-dimensional computer images. Characteristic microstructure parameters, i.e. density fluctuation, porosity and pore size distribution of several examples of SiO[2]-and SiC ceramics at different stages of sintering are presented. T2 - 9th World Ceramics Congress and Forum on New Materials ; 9th CIMTEC CY - Florence, Italy KW - Advanced ceramics PY - 1999 UR - http://cat.inist.fr/?aModele=afficheN&cpsidt=1811372 SN - 88-86538-17-0 N1 - Serientitel: Advances in science and technology – Series title: Advances in science and technology IS - 16 SP - 345 EP - 352 PB - Techna CY - Faenza AN - OPUS4-3272 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Hampe, Andreas A1 - Harbich, Karl-Wolfram A1 - Hentschel, Manfred P. A1 - Rudolph, Hans-Volker T1 - The Determination of Inner Surfaces in Composites by X-Ray Refraction T2 - 12th International Conference on Composite Materials ; 12th ICCM Europe CY - Paris, France DA - 1999-07-05 PY - 1999 SN - 2-9514526-2-4 IS - 423 CY - Paris AN - OPUS4-3273 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Schors, Jörg A1 - Lange, Axel A1 - Hentschel, Manfred P. T1 - Non-destructive Inspection of Ceramic/Composite Materials using Non-classical X-Ray Techniques KW - CFRP KW - WAXS KW - XROT KW - FAXOT PY - 1999 IS - ESA CR(P)-4273 SP - 1 EP - 48 PB - BAM CY - Berlin AN - OPUS4-792 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Müller, Bernd R. A1 - Görner, Wolf A1 - Hentschel, Manfred P. A1 - Riesemeier, Heinrich A1 - Krumrey, M. A1 - Ulm, G. A1 - Diete, W. A1 - Klein, U. A1 - Frahm, R. T1 - BAMlin - the first hard X-ray beamline at BESSY II N2 - The first hard X-ray beamline at BESSY II will be installed by BAM and PTB at a superconducting 7 T wavelength shifter. The main optical elements of the beamline are a Double-Multilayer-Monochromator and a Double-Crystal-Monochromator. The two devices can be used separately or in-line. Main applications of monochromatic radiation with photon energies up to 50 keV are X-ray fluorescence analysis, micro-computed tomography, X-ray topography, detector calibration and reflectometry. Calculable undispersed radiation up to 200 keV will be available for radiometric applications. KW - Double-Multilayer-Monochromator with meridional bender KW - Double-Crystal-Monochromator with sagittal bender KW - X-ray fluorescence analysis KW - Micro-computed tomography KW - X-ray topography KW - Detector calibration KW - Reflectometry PY - 2001 U6 - https://doi.org/10.1016/S0168-9002(01)00466-1 SN - 0168-9002 SN - 0167-5087 VL - 467-468 IS - 1 SP - 703 EP - 706 PB - North-Holland CY - Amsterdam AN - OPUS4-1171 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Eberbeck, D. A1 - Lange, Axel A1 - Hentschel, Manfred P. T1 - Identification of aggregates of magnetic nanoparticles in ferrofluids at low concentrations N2 - Different very dilute suspensions of magnetic nanoparticles (magnetite surrounded by an organic shell) in water (ferrofluids) were investigated using small-angle X-ray scattering. It is shown that the scattering originates not only from noncorrelated core–shell nanoparticles, but also from larger structures. By modelling, these structures can be identified as close-packed clusters consisting of core–shell particles (core diameter ~10 nm). The analysis of the radial distance distribution function, obtained by Fourier transformation of the scattered intensity, reveals a lower bound of the mean cluster size of about 40 nm. The formation of clusters is persistent, even in very dilute suspensions. PY - 2003 U6 - https://doi.org/10.1107/S002188980301104X SN - 0021-8898 SN - 1600-5767 VL - 36 IS - 4 SP - 1069 EP - 1074 PB - Blackwell CY - Oxford AN - OPUS4-2638 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Hentschel, Manfred P. A1 - Lange, Axel A1 - Harbich, Karl-Wolfram A1 - Schors, Jörg A1 - Wald, Oliver ED - Green, R. E. ED - Djordjevic, B. B. ED - Hentschel, M. P. T1 - X-Ray Diffraction and Refraction Topography of Light Weight Materials T2 - 11th International Symposium on Nondestructive Characterization of Materials CY - Berlin, Germany DA - 2002-06-24 PY - 2003 SN - 3-540-40154-7 SP - 157 EP - 166 PB - Springer CY - Berlin AN - OPUS4-2639 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Müller, Bernd R. A1 - Lange, Axel A1 - Harwardt, Michael A1 - Hentschel, Manfred P. T1 - Sub-micrometer computed tomography at BAMline PY - 2004 UR - http://www.helmholtz-berlin.de/media/media/oea/web/pr_webseite/druckschriften/berichte/bessy/annualreport2003.pdf#page=321 SN - 0179-4159 SP - 321 EP - 323 PB - Berliner Elektronenspeicherring-Gesellschaft für Synchrotronstrahlung CY - Berlin AN - OPUS4-3509 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Müller, Bernd R. A1 - Hentschel, Manfred P. A1 - Harbich, Karl-Wolfram A1 - Lange, Axel A1 - Schors, Jörg T1 - X-Ray Refraction Topography for Non-Destructive Evaluation of Advanced Materials KW - X-Ray Refraction KW - Fibre Debonding KW - Topography KW - Crack Density KW - Pore Size KW - SAXS PY - 2001 SP - 1 EP - 7 PB - Society of Manufacturing Engineers CY - Dearborn, Mich. AN - OPUS4-1097 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Hentschel, Manfred P. A1 - Lange, Axel A1 - Harbich, Karl-Wolfram A1 - Schors, Jörg A1 - Wald, Oliver T1 - X-ray diffraction and refraction topography of light weight materials T2 - Annual conference of the British Institute on Non-Destructive Testing ; NDT 2002 CY - Southport, England, UK DA - 2002-09-17 PY - 2002 SN - 0-903132-30-3 SP - 275 EP - 280 PB - British Institute of Non-Destructive Testing CY - Northampton AN - OPUS4-1938 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Fensch-Kleemann, Elisabeth A1 - Harbich, Karl-Wolfram A1 - Hentschel, Manfred P. T1 - Microstructural Characterisation of Porous Ceramics by X-Ray Refraction Topography KW - X-ray refraction topography KW - High pressure mercury intrusion KW - Non-destructive testing KW - Porosity KW - Surface density KW - Specific surface KW - Pore size PY - 2002 SN - 0173-9913 SN - 0196-6219 VL - 79 IS - 11 SP - E35 EP - E38 PB - Göller CY - Baden-Baden AN - OPUS4-1916 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Müller, Bernd R. A1 - Lange, Axel A1 - Harwardt, Michael A1 - Hentschel, Manfred P. A1 - Illerhaus, Bernhard A1 - Goebbels, Jürgen A1 - Bamberg, J. A1 - Heutling, F. T1 - 3D Refraction Computed Tomography Applied to Metal Matrix Composites N2 - For the first time Metal Matrix Composites (MMC) have been investigated by 3D Computed Tomography combined with enhanced interface contrast due to X-ray refraction. X-ray refraction is a relatively new approach for the characterization of advanced materials. The related techniques of Refraction Topography and Refraction Computed Tomography have been developed and applied at our laboratory during the last decade to meet the actual demand for improved nondestructive characterization of high performance composites, ceramics and other low density materials and components. X-ray refraction occurs, when X-rays crosses interfaces of spherical or cylindrical shape (e.g. pores or fibres) in the same way as visible light is refracted by lenses. These X-ray optical effects can be observed at small scattering angles of few minutes of arc as the refractive index n of X-rays is nearly unity (n = 1 – 10-6). Due to the short X-ray wavelength of about 0.1 nm the technique determines the amount of inner surfaces and interfaces of nanometer dimensions. The technique is expected to solve many problems in understanding the meaning of micro and sub micro structures in materials science. With the results of the CT investigation, some questions could be clarified for a better understanding of fatigue failure mechanisms under cyclic loading conditions. The specimens for the test programme have been provided by MTU Aero Engines. They consist of a titanium matrix (Ti6242) reinforced by SiC fibres (SCS6). The investigations have been performed at the materials research station of BAM (BAMline) at the Synchrotron Facility BESSY in Berlin, Germany. T2 - 35th International SAMPE technical conference CY - Dayton, OH, USA DA - 2003-09-28 KW - Non-Destructive Inspection (NDI) KW - Characterization KW - Titanium Metal Matrix Composites (Ti-MMC) KW - Ti6242 KW - SCS6 PY - 2003 SN - 0-938994-95-6 PB - SAMPE CY - Covina, Calif. AN - OPUS4-2780 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Müller, Bernd R. A1 - Lange, Axel A1 - Hentschel, Manfred P. ED - Green, R. E. ED - Djordjevic, B. B. ED - Hentschel, M. P. T1 - Synchrotron Radiation Refraction Topography PY - 2003 SN - 3-540-40154-7 SP - 167 EP - 176 PB - Springer CY - Berlin AN - OPUS4-2765 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Schors, Jörg A1 - Lange, Axel A1 - Hentschel, Manfred P. ED - Green, R. E. ED - Djordjevic, B. B. ED - Hentschel, M. P. T1 - Precise Measurements of Fibre Direction, Type and Content in CFRP by X-Ray Rotation Topography T2 - 11th International Symposium on Nondestructive Characterization of Materials CY - Berlin, Germany DA - 2002-06-24 PY - 2003 SN - 3-540-40154-7 SP - 185 EP - 198 PB - Springer CY - Berlin AN - OPUS4-2766 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Rudolph, Hans-Volker A1 - Hentschel, Manfred P. A1 - Ivers, Heinz A1 - Harbich, Karl-Wolfram ED - Green, R. E. ED - Djordjevic, B. B. ED - Hentschel, M. P. T1 - Characterization of damage accumulation during fatigue in fiber reinforced thermoplast by X-ray refraction T2 - 11th International Symposium on Nondestructive Characterization of Materials CY - Berlin, Germany DA - 2002-06-24 PY - 2003 SN - 3-540-40154-7 SP - 705 EP - 710 PB - Springer CY - Berlin AN - OPUS4-2771 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Hentschel, Manfred P. A1 - Harbich, Karl-Wolfram A1 - Lange, Axel A1 - Rudolph, Hans-Volker T1 - X-ray Refraction of Paper and Pigments PY - 1995 SN - 0025-5300 VL - 37 IS - 3 SP - 60 EP - 62 PB - Carl Hanser Verlag CY - München AN - OPUS4-3656 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Harbich, Karl-Wolfram A1 - Hentschel, Manfred P. A1 - Lange, Axel ED - Hemelrijck, Danny van T1 - New X-ray refractometry for nondestructive characterization of hihg performance composites and ceramics T2 - 1st Joint Belgian-Hellenic Conference on Nondestructive Testing CY - Patras, Greece DA - 1995-05-22 PY - 1996 SN - 90-5410-595-X SP - 185 EP - 189 PB - Balkema CY - Rotterdam, Netherlands AN - OPUS4-3660 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Harbich, Karl-Wolfram A1 - Hentschel, Manfred P. A1 - Ekenhorst, Derk A1 - Schors, Jörg ED - Michel, B. T1 - X-ray refraction for nondestructive investigation of micro cracks and impacts T2 - 2nd International Conference and Exhibition Micro Materials CY - Berlin, Germany DA - 1997-04-16 PY - 1997 SN - 3-932434-05-6 VL - 1 SP - 1025 EP - 1027 PB - ddp Goldenbogen CY - Dresden AN - OPUS4-3662 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Hentschel, Manfred P. A1 - Ekenhorst, Derk A1 - Harbich, Karl-Wolfram A1 - Lange, Axel ED - Naslain, R. ED - Lamon, J. ED - Doumeingts, D. T1 - C-fibre degradation debonding and lamella buckling measurement in CMC by new X-ray topography T2 - 6th European Conference on Composite Materials ; 1st International Conference on High Temperature Ceramic Matrix Composites (HT-CMC1) CY - Bordeaux, France DA - 1993-09-20 PY - 1993 SN - 1-85573-143-6 VL - 1 SP - 245 EP - 250 PB - Woodhead CY - Cambridge AN - OPUS4-3647 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hentschel, Manfred P. A1 - Harbich, Karl-Wolfram A1 - Lange, Axel T1 - New X-ray refractometry of paper and pigments T2 - 4. Internale Konferenz "Zerstörungsfreie Untersuchung an Kunst- und Kulturgütern" CY - Berlin DA - 1994-10-03 PY - 1994 SP - 291 EP - 295 CY - Berlin AN - OPUS4-3650 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Hentschel, Manfred P. A1 - Harbich, Karl-Wolfram A1 - Lange, Axel T1 - Nondestructive evaluation of single fibre debonding in composites by X-ray refraction PY - 1994 SN - 0963-8695 VL - 27 IS - 5 SP - 275 EP - 280 PB - Butterworth-Heinemann CY - Oxford AN - OPUS4-3651 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hentschel, Manfred P. A1 - Ekenhorst, Derk A1 - Harbich, Karl-Wolfram A1 - Lange, Axel T1 - New X.ray refractography for nondestructive investigations T2 - International Symposium on Advanced Materials for Lightweight Structures CY - Noordwijk, Netherlands DA - 1994-03-22 PY - 1994 N1 - Serientitel: ESA WPP – Series title: ESA WPP IS - 70 SP - 661 EP - 664 PB - ESTEC Conference Bureau CY - Noordwijk AN - OPUS4-3652 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Müller, Bernd R. A1 - Lange, Axel A1 - Harwardt, Michael A1 - Hentschel, Manfred P. A1 - Illerhaus, Bernhard A1 - Goebbels, Jürgen A1 - Bamberg, J. A1 - Heutling, F. T1 - Micro Crack Characterization of Metal Matrix Composites by 3D-Refraction-Computed-Tomography T2 - 16th World Conference on Nondestructive Testing CY - Montreal, Canada DA - 2004-08-30 KW - NDE KW - X-ray refraction KW - Composites KW - MMC PY - 2004 SP - 9 pages PB - International Committee for Non-Destructive Testing CY - Montreal AN - OPUS4-5486 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Müller, Bernd R. A1 - Hentschel, Manfred P. T1 - Synchrotron radiation refraction topography for charcterization of lightweight materials N2 - The employment of synchrotron radiation for refraction topography of materials has considerable advantages over standard x-ray sources. The much higher beam intensity and the parallel and monochromatic radiation provide faster measurements and better angular and spatial resolution. X-ray refraction techniques image the inner surface and interface concentration of micro-structured materials. This effect of x-ray optics is additional to small-angle scattering by diffraction, when the scattering objects reach micrometre dimensions. We have developed x-ray refraction techniques within the last decade in order to meet the growing demands for improved non-destructive characterization of high-performance composites, ceramics and other low-density materials. Sub-micron particle dimensions, the pore size of ceramics, the crack density distribution and single fibre debonding within damaged composites can be measured and visualized by computer-generated interface topographs. For this purpose investigations are now being performed at the new hard x-ray beamline of the Federal Institute for Materials Research and Testing (BAM) at BESSY, Berlin. This BAMline provides monochromatic radiation of photon energies from 5 to 60 keV from a double multilayer and/or a double-crystal monochromator. A separate instrument is dedicated to the further development and application of synchrotron radiation refraction (SRR) topography. Different from conventional small-angle scattering cameras with collimating slits and pinholes, scattering angles down to a few seconds of arc are selected by a single-crystal analyser, similar to a Bonse-Hart diffractometer. A 20 µm spatial resolution of the scattering micro-structures is achieved by a CCD camera with a fluorescent converter. First SRR topographs of aircraft composites [carbon fibre-reinforced plastics (CFRP), carbon fibre-reinforced ceramics (C/C), metal matrix ceramics (MMC)] will be reported. KW - BAMline KW - Refraction topography PY - 2004 U6 - https://doi.org/10.1002/xrs.736 SN - 0049-8246 VL - 33 IS - 6 SP - 402 EP - 406 PB - Wiley CY - Chichester AN - OPUS4-11930 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Müller, Bernd R. A1 - Lange, Axel A1 - Harwardt, Michael A1 - Hentschel, Manfred P. A1 - Illerhaus, Bernhard A1 - Goebbels, Jürgen A1 - Bamberg, J. A1 - Heutling, F. T1 - X-Ray Refraction Topography and Computed Tomography for NDE of Lightweight Materials T2 - 9th European Conference on NDT CY - Berlin, Germany DA - 2006-09-25 KW - Synchrotron Refraction CT KW - MMC KW - Bragg-Magnification PY - 2006 SN - 3-931381-86-2 SP - 1(?) EP - 9(?) PB - European Federation for Non-Destructive Testing CY - Berlin AN - OPUS4-13703 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hentschel, Manfred P. A1 - Lange, Axel A1 - Harbich, Karl-Wolfram A1 - Schors, Jörg A1 - Wald, Oliver A1 - Müller, Bernd R. T1 - NDE of micro structured materials by X-ray diffraction and refraction topography T2 - SPIE 9th Internat. Symp. NDE for Health Monitoring and Diagnostics CY - San Diego, CA, USA DA - 2004-03-15 PY - 2004 AN - OPUS4-5558 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hentschel, Manfred P. T1 - Non-destructive micro damage imaging of composites by X-ray refraction T2 - Aero NDT Forum, Aerospace Testing EXPO 2004 CY - Hamburg, Germany DA - 2004-03-30 PY - 2004 AN - OPUS4-5559 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Harbich, Karl-Wolfram A1 - Klobes, Peter A1 - Hentschel, Manfred P. T1 - Microstructural characterization of porous materials by two-dimensional X-ray refraction topography N2 - X-ray refraction topography determines the internal surfaces and interfaces of non-metallic porous materials within the range of namometer to micrometer dimensions. The method is based on refraction of X-rays caused by interfaces of microstructures in heterogeneous materials. Generally, it permits a non-destructive full volume characterization of the pore topology. The X-ray refraction scanning technique make possible to visualize integral interface properties up to 10 μm spatial resolution by two-dimensional topographic images. It detects the spatially resolved internal surfaces of both, open and closed pores. Comparison to a certified powder reference of uniform grain size and known packing density reveals a quantitative measure for calibration requirements. An investigation on SiC- and Al2O3-ceramics illustrate the quantitative characterization of the internal surface density, pore sizes and their spatial distribution as well as local porosity fluctuations. KW - X-ray refraction topography KW - Al2O3 ceramics KW - Internal surface density KW - Porosity fluctuation KW - Pore size PY - 2004 U6 - https://doi.org/10.1016/j.colsurfa.2004.04.074 SN - 0927-7757 SN - 1873-4359 VL - 241 IS - 1-3 SP - 225 EP - 229 PB - Elsevier CY - Amsterdam AN - OPUS4-11972 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Markötter, H. A1 - Manke, I. A1 - Kuhn, R. A1 - Arlt, Tobias A1 - Kardjilov, N. A1 - Hentschel, Manfred P. A1 - Kupsch, Andreas A1 - Lange, Axel A1 - Hartnig, C. A1 - Scholta, J. A1 - Banhart, J. T1 - Neutron tomographic investigations of water distributions in polymer electrolyte membrane fuel cell stacks N2 - Neutron tomography was applied to study the 3D water distribution in full polymer electrolyte membrane fuel cell (PEMFC) stacks. The water distribution after switch-off of the fuel cell was analyzed over a period of 36 h. We found a slowly increasing water amount in the fuel cell, but only few changes within a time period of 5 h, which is about the time necessary for neutron tomography. In this way, the requirement for successful tomography was obtained. It is demonstrated how the quasi in-situ tomography technique enables us to study the water content in individual flow field channels of three-fold stacks. Flow field as well as stack design issues are addressed by this visualization method showing weak points due to a non-uniform water distribution that can be identified by means of neutron imaging. KW - Radiography KW - Tomography KW - Neutron imaging KW - Polymer electrolyte membrane fuel cell (PEMFC) KW - Manifold stack KW - Water management PY - 2012 U6 - https://doi.org/10.1016/j.jpowsour.2012.07.043 SN - 0378-7753 VL - 219 SP - 120 EP - 125 PB - Elsevier CY - Amsterdam [u.a.] AN - OPUS4-26317 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Müller, Bernd R. A1 - Lange, Axel A1 - Hentschel, Manfred P. A1 - Kupsch, Andreas T1 - A comfortable procedure for correcting X-ray detector backlight N2 - A novel approach is suggested to strongly suppress artifacts in radiography and computed tomography caused by the effect of diffuse background signals 'backlighting' of 2D X-ray detectors. Depending on the detector geometry the mechanism may be different. Either based on the optical scattering of the fluorescent screen materials into the optical detection devices or Compton or X-ray fluorescence scattering by the detector components. Consequently, these erroneous intensity portions result in locally different violations of Lambert Beer's law in single projections (radiographs) as a function of the detector area coverage and the magnitude of the attenuation. The absorption of multiple metal sheets is investigated by monochromatic synchrotron radiation, thus excluding beam hardening. The proposed correction procedure simply requires the individual subtraction of one and the same fraction of the primary and transmitted mean intensity, as a constant (non-local) scattering mechanism is assumed. KW - X-ray detector backlighting KW - Radiography KW - Fluorescent screen KW - Diffuse background KW - Computed tomography PY - 2013 U6 - https://doi.org/10.1088/1742-6596/425/19/192015 SN - 1742-6588 SN - 1742-6596 VL - 425 IS - 19 SP - 192015-1 EP - 192015-4 PB - IOP Publ. CY - Bristol, UK AN - OPUS4-28262 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Kupsch, Andreas A1 - Hentschel, Manfred P. A1 - Lange, Axel A1 - Grothausmann, R. A1 - Manke, I. T1 - Application of the DIRECTT algorithm to sub-nanometer electron tomography N2 - Tomography data obtained from transmission electron microscopes are especially attractive due to their unrivaled spatial resolution in the nanometer range or even less, but they require enormous efforts in sample preparation and suffer from a diverse accumulation of experimental restrictions, which unavoidably result in fundamental reconstruction artifacts. These restrictions refer to: partial opacity, a limited view (limited angle or missing wedge), very few angles (with respect to the detector size), limited to a region of interest (ROI; due to the sample size), variable angular increments as well as sample degradation due the interactions with the electron beam. An advanced version of the DIRECTT (Direct Iterative Reconstruction of Computed Tomography Trajectories) algorithm proves to cope with most of these severe deviations from ideal CT measuring conditions. However, careful data preprocessing is required in order to exploit the capabilities of the algorithm. Nanometer sized Ruthenium catalyst particles for fuel cell applications are 3D imaged at a few Ångström resolution in order to estimate their partial free surface on carbon black supports, which rule the efficiency of the catalytic activity. Comparisons of DIRECTT reconstructions to the conventional filtered back projection, prove the significant improvements. T2 - DIR 2011 - International symposium on digital industrial raidology and computed tomography CY - Berlin, Germany DA - 20.06.2011 KW - Electron tomography KW - Computed tomography KW - Reconstruction algorithms PY - 2011 U6 - http://nbn-resolving.de/urn/resolver.pl?urn:nbn:de:kobv:b43-243577 SN - 978-3-940283-34-4 IS - DGZfP-BB 128 (Tu.3.3) SP - 1 EP - 6 PB - Deutsche Gesellscahft für Zerstörungsfreie Prüfung e.V. (DGZfP) AN - OPUS4-24357 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Lange, Axel A1 - Hentschel, Manfred P. A1 - Kupsch, Andreas A1 - Müller, Bernd R. T1 - Correction of diffuse X-ray detector based background N2 - A novel approach to strongly suppress artifacts in radiography and computed tomography caused by the effect of diffuse background Signals (“backlight”) of 2D X-ray detectors is suggested. Depending on the detector geometry the mechanism may be different, either based on the optical scattering of the fluorescent screen materials into optical detection devices or Compton or X-ray fluorescence scattering by the detector components. Consequently, these erroneous intensity portions result in locally different violations of Lambert Beer’s law in single projections (radiographs). When used as input data for computed tomography these violations are directly observed via modulation of the projected mass as a function of the rotation Phase and the sample’s aspect ratio (dynamics). The magnitude of the diffuse Background signal depends on the detector area covered by the projected sample. They are more pronounced the smaller the shaded area and the stronger the total attenuation. Moreover, the local intensity mismatch depends on the attenuation of the sample. We present very basic reference data measured with multiple metal foils at a synchrotron radiation source. Beam hardening artifacts can be excluded due to the monochromatic radiation. The proposed correction procedure assumes a constant (non-local) scattering mechanism. T2 - DIR 2011 - International symposium on digital industrial raidology and computed tomography CY - Berlin, Germany DA - 20.06.2011 KW - Backlight KW - X-ray detector KW - Fluorescence screen KW - Synchrotron radiography KW - Computed tomography PY - 2011 U6 - http://nbn-resolving.de/urn/resolver.pl?urn:nbn:de:kobv:b43-243589 SN - 978-3-940283-34-4 IS - DGZfP-BB 128 (Poster 24) SP - 1 EP - 7 PB - Deutsche Gesellscahft für Zerstörungsfreie Prüfung e.V. (DGZfP) AN - OPUS4-24358 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -