TY - JOUR A1 - Hentschel, Manfred P. A1 - Müller, Bernd R. A1 - Lange, Axel A1 - Harbich, Karl-Wolfram A1 - Schors, Jörg A1 - Wald, Oliver T1 - New Developments in X-ray-Topography of Advanced Non-Metallic Materials T2 - 15th World Conference on Non-Destructive Testing (WCNDT) CY - Roma, Italy DA - 2000-10-15 PY - 2000 UR - http://www.ndt.net/article/wcndt00/papers/idn258/idn258.htm SN - 1435-4934 VL - 5 IS - 11 PB - NDT.net CY - Kirchwald AN - OPUS4-928 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Harbich, Karl-Wolfram A1 - Hentschel, Manfred P. A1 - Schors, Jörg T1 - X-ray refraction characterization of nonmetallic materials KW - Nondestructive characterization KW - X-ray refraction topography KW - Pore size KW - Crack density PY - 2001 SN - 0963-8695 VL - 34 SP - 297 EP - 302 PB - Butterworth-Heinemann CY - Oxford AN - OPUS4-945 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Görner, Wolf A1 - Hentschel, Manfred P. A1 - Müller, Bernd R. A1 - Riesemeier, Heinrich A1 - Krumrey, M. A1 - Ulm, G. T1 - The first hard X-rays at the BAMline PY - 2001 UR - http://www.helmholtz-berlin.de/media/media/oea/web/pr_webseite/druckschriften/berichte/bessy/annualreport2000.pdf#page=329 SN - 0179-4159 SP - 329 EP - 331 PB - Berliner Elektronenspeicherring-Gesellschaft für Synchrotronstrahlung CY - Berlin AN - OPUS4-1299 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Müller, Bernd R. A1 - Hentschel, Manfred P. A1 - Lange, Axel T1 - Non-destructive evaluation of advanced materials by synchrotron radiation refraction topography PY - 2002 UR - http://www.helmholtz-berlin.de/media/media/oea/web/pr_webseite/druckschriften/berichte/bessy/annualreport2001.pdf#page=233 SN - 0179-4159 SP - 233 EP - 234 PB - Berliner Elektronenspeicherring-Gesellschaft für Synchrotronstrahlung CY - Berlin AN - OPUS4-1326 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Müller, Bernd R. A1 - Ekenhorst, Derk A1 - Brzezinka, Klaus-Werner A1 - Hentschel, Manfred P. ED - Krenkel, W. T1 - Fiber Induced Failure of Carbon/Carbon Composites T2 - 4th International Conference on High Temperature Ceramic Matrix Composites ; 4th HT-CMC Conference CY - Munich, Germany DA - 2001-10-01 PY - 2001 SN - 3-527-30320-0 VL - 4 SP - 175 EP - 180 PB - Wiley-VCH CY - Weinheim AN - OPUS4-1289 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Harbich, Karl-Wolfram A1 - Hentschel, Manfred P. A1 - Ekenhorst, Derk A1 - Schors, Jörg A1 - Lange, Axel T1 - X-Ray Refraction for NDT of Micro Cracks and Impacts N2 - High performance composites and other light weight materials are generally a comple problem to the performance of nondestructive testing methods. X-ray refraction provide unconventional X-ray scattering techniques to meet the actual demand for improve nondestructive characterization of these advanced materials. Scanning the samples across collimated narrow incident X-ray beam permits to image integral micro-structures (a present) with a resolution of 10 µm. Investigations of samples after strain-induced micro cracks and fibre debonding in impact damaged epoxy are shown. The physics of X-ray refraction are analogous to the well known refraction of light b optical lenses and prisms, governed by Snell's law. The special feature is the deflection a very small angles of few minutes of arc, as the refractive index of X-rays in matter i nearly one. Due to the density differences at inner surfaces most of the incident X-rays ar deflected. As the scattered intensity of refraction is proportional to the specific surface of sample, a reference standard gives a quantitative measure for analytical determinations. Figure 1 represents a two-dimensional damage distribution of an impact in a 0/90° CFR laminate of 3 mm, thickness. Unlike in ultrasonic testing, there is no shadowing effect o the successive layers. By use of X-ray refraction the exact concentration of debonde fibres is calculated for each position. Additionally the refraction allows the selection of th fibre orientation. T2 - 7th European Conference on Non-Destructive Testing (ECNDT) CY - Copenhagen, Denmark DA - 1998-05-26 PY - 1998 UR - http://www.ndt.net/abstract/ecndt98/435.htm SN - 87-986898-0-0 VL - 3 CY - Broendy, Denmark AN - OPUS4-3328 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Hentschel, Manfred P. A1 - Ekenhorst, Derk A1 - Harbich, Karl-Wolfram A1 - Lange, Axel A1 - Schors, Jörg ED - Green, R. E. T1 - New X-ray refractography for non-destructive evaluation of advanced materials T2 - 8th International Symposium on Nondestructive Characterization of Materials CY - Boulder, CO, USA DA - 1997-06-15 PY - 1998 SN - 0-306-45900-0 VL - 8 SP - 409 EP - 416 PB - Plenum Press CY - New York AN - OPUS4-3330 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Hentschel, Manfred P. A1 - Harbich, Karl-Wolfram A1 - Lange, Axel A1 - Schors, Jörg A1 - Ekenhorst, Derk A1 - Judd, M.D. A1 - Raynal, R. T1 - X-ray refraction characterizes leight weight materials PY - 1998 SN - 1018-8657 VL - 8 IS - 3 SP - 14 EP - 15 PB - European Space Agency CY - Noordwijk AN - OPUS4-3331 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Harbich, Karl-Wolfram A1 - Schors, Jörg A1 - Lange, Axel A1 - Hentschel, Manfred P. ED - van Hemelrijck, D. T1 - X-ray refraction - new methods for non-destructive evaluation of advanced materials T2 - 2nd International Conference on Emerging Technologies in NDT CY - Athens, Greece DA - 1999-05-24 KW - X-ray refraction PY - 2000 SN - 90-5809-127-9 SP - 207 EP - 212 PB - Balkema CY - Rotterdam AN - OPUS4-851 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Harbich, Karl-Wolfram A1 - Hentschel, Manfred P. T1 - Nondestructive Characterization of Monolithic Ceramics by X-Ray Refraction T2 - 7th Euro Ceramics - Conference and Exhibition of the European Ceramic Society (ECerS) CY - Brugge, Belgium DA - 2001-09-09 KW - X-ray refraction KW - Non-destructive testing KW - Porosity KW - Specific surface KW - Pore size PY - 2001 SN - 1013-9826 VL - 206-213 SP - 673 EP - 676 PB - Trans Tech Publ. CY - Aedermannsdorf AN - OPUS4-1861 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Rudolph, Hans-Volker A1 - Hentschel, Manfred P. A1 - Ivers, Heinz T1 - Damage accumulation in short fiber reinforced thermoplast by X-Ray refraction N2 - Micro damage structures of fiber reinforced polymers (FRP) can be characterized nondestructively by X-ray refraction topography, which images inner surfaces. The damage accumulation after fatigue treatment of short glass fiber reinforced polybutylene terephthalate (PBT-GF) is correlated to the applied load and the number of cycles. Micro cracks and fiber/matrix debonding during fatigue can be detected separately due to their different direction of X-ray small angle scattering. The residual strength over the crack surface decreases by a linear decay as 30 %, 60 % and 90 % of the materials lifetime is passed. T2 - 8th ECNDT CY - Barcelona, Spain DA - 2002-06-17 PY - 2002 UR - http://www.ndt.net/article/ecndt02/193/193.htm VL - 8 SP - 1 EP - 5 PB - European Federation for Non-Destructive Testing CY - Barcelona AN - OPUS4-1840 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Müller, Bernd R. A1 - Hentschel, Manfred P. A1 - Lange, Axel A1 - Harwardt, Michael T1 - Characterization of fibre reinforced metals by X-ray refraction CT PY - 2003 UR - http://www.helmholtz-berlin.de/media/media/oea/web/pr_webseite/druckschriften/berichte/bessy/annualreport2002.pdf#page=336 SN - 0179-4159 SP - 336 EP - 337 PB - Berliner Elektronenspeicherring-Gesellschaft für Synchrotronstrahlung CY - Berlin AN - OPUS4-2493 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Müller, Bernd R. A1 - Hentschel, Manfred P. A1 - Harbich, Karl-Wolfram A1 - Lange, Axel A1 - Schors, Jörg T1 - X-ray refraction topography for non-destructive evaluation of advanced materials T2 - 15th World Conference on Non-Destructive Testing (WCNDT) CY - Roma, Italy DA - 2000-10-15 KW - X-ray refraction PY - 2000 UR - http://www.ndt.net/article/wcndt00/papers/idn257/idn257.htm SN - 1435-4934 VL - 5 IS - 11 SP - 1 EP - 7(?) PB - NDT.net CY - Kirchwald AN - OPUS4-871 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hentschel, Manfred P. A1 - Gofers, J. T1 - HYJECT T2 - Messe EUROMOLD 2002 CY - Frankfurt am Main, Germany DA - 2002-12-04 PY - 2002 AN - OPUS4-2033 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Müller, Bernd R. A1 - Lange, Axel A1 - Harwardt, Michael A1 - Hentschel, Manfred P. A1 - Illerhaus, Bernhard A1 - Goebbels, Jürgen T1 - First refraction enhanced 3D computed tomography T2 - International Symposium on Computed Tomography and Image Processing for Industrial Radiology CY - Berlin, Germany DA - 2003-06-23 PY - 2003 SN - 3-931381-48-X N1 - Serientitel: DGZfP-Proceedings BB – Series title: DGZfP-Proceedings BB IS - 84-CD PB - DGZfP CY - Berlin AN - OPUS4-2519 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Müller, Bernd R. A1 - Lange, Axel A1 - Hentschel, Manfred P. ED - Cohen, L. J. T1 - Non-Destructive Characterization of High Performance Composites by use of X-Ray Refraction Topography T2 - 48th International SAMPE symposium and exhibition CY - Long Beach, CA, USA DA - 2003-05-11 KW - Non-Destructive Inspection (NDI) KW - Characterization KW - Advanced Composite PY - 2003 SN - 0-938994-94-8 VL - 1 SP - 1203 EP - 1211 PB - SAMPE International Business Office CY - Covina, Calif. AN - OPUS4-2542 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hentschel, Manfred P. A1 - Lange, Axel A1 - Harbich, Karl-Wolfram A1 - Schors, Jörg A1 - Wald, Oliver T1 - X-ray diffraction and refraction topography of light weight materials T2 - 41st Annual Conference of The British Institute of Non-Destructive Testing - NDT 2002 CY - Southport, England DA - 2002-09-17 PY - 2002 AN - OPUS4-3092 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hentschel, Manfred P. A1 - Lange, Axel A1 - Harbich, Karl-Wolfram T1 - X-Ray Diffraction Scanning Microscopy - A new method of nondestructive Characterization of inhomogeneous materials T2 - ESA Symposium on Space Applications of Advanced Structural Materials (ESTEC) CY - Noordwijk, Netherlands DA - 1990-03-21 PY - 1990 IS - MBB-Z--0301-90-PUB SP - 447 EP - 450 PB - Zentrale Berichtsstelle, Technisch-wissenschaftliche Information, Messerschmitt-Bölkow-Blohm GmbH CY - München AN - OPUS4-3269 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Hentschel, Manfred P. A1 - Harbich, Karl-Wolfram A1 - Lange, Axel ED - Burke, W. T1 - New X-ray scanning topographic approaches to nondestructive evaluation of composites T2 - International Symposium "Advanced Materials for Lightweight Structures" CY - Noordwijk, Netherlands DA - 1992-03-25 PY - 1992 SN - 92-9092-186-2 N1 - Serientitel: ESA SP – Series title: ESA SP IS - 336 SP - 229 EP - 232 PB - ESTEC, ESA Publ. Division CY - Noordwijk AN - OPUS4-3271 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Harbich, Karl-Wolfram A1 - Hentschel, Manfred P. A1 - Schors, Jörg ED - Vincenzini, P. T1 - X-ray refraction: A new method for nondestructive characterization of advanced ceramics N2 - Quantitative X-ray refraction topography is applied for improved nondestructive evaluation of advanced high performance ceramics. The method is based on X-ray small angle scattering by refraction of X-rays due to density differences of microstructures in heterogeneous materials. It determines the amount of inner surfaces and interfaces within the range of µm to nm dimensions. As the scattered refraction intensity is proportional to the inner surface density of a sample, a reference standard gives a quantitative measure for analytical requirements. X-ray refraction scanning topography visualizes integral interface properties at 10 µm spatial resolution by two-dimensional computer images. Characteristic microstructure parameters, i.e. density fluctuation, porosity and pore size distribution of several examples of SiO[2]-and SiC ceramics at different stages of sintering are presented. T2 - 9th World Ceramics Congress and Forum on New Materials ; 9th CIMTEC CY - Florence, Italy KW - Advanced ceramics PY - 1999 UR - http://cat.inist.fr/?aModele=afficheN&cpsidt=1811372 SN - 88-86538-17-0 N1 - Serientitel: Advances in science and technology – Series title: Advances in science and technology IS - 16 SP - 345 EP - 352 PB - Techna CY - Faenza AN - OPUS4-3272 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -