TY - CONF A1 - Hentschel, Manfred P. A1 - Lange, Axel A1 - Harbich, Karl-Wolfram T1 - X-Ray Diffraction Scanning Microscopy - A new method of nondestructive Characterization of inhomogeneous materials T2 - Development of fabrication methods for metallic multilayer structures (MBB-Bericht. Z 301-90 PUB) T2 - ESA Symposium on Space Applications of Advanced Structural Materials (ESTEC) CY - Noordwijk, Netherlands DA - 1990-03-21 PY - 1990 IS - MBB-Z--0301-90-PUB SP - 447 EP - 450 PB - Zentrale Berichtsstelle, Technisch-wissenschaftliche Information, Messerschmitt-Bölkow-Blohm GmbH CY - München AN - OPUS4-3269 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Harbich, Karl-Wolfram A1 - Hentschel, Manfred P. A1 - Schors, Jörg ED - Vincenzini, P. T1 - X-ray refraction: A new method for nondestructive characterization of advanced ceramics T2 - Ceramics: getting into the 2000's / Pt. D: Including sections I - J - SM N2 - Quantitative X-ray refraction topography is applied for improved nondestructive evaluation of advanced high performance ceramics. The method is based on X-ray small angle scattering by refraction of X-rays due to density differences of microstructures in heterogeneous materials. It determines the amount of inner surfaces and interfaces within the range of µm to nm dimensions. As the scattered refraction intensity is proportional to the inner surface density of a sample, a reference standard gives a quantitative measure for analytical requirements. X-ray refraction scanning topography visualizes integral interface properties at 10 µm spatial resolution by two-dimensional computer images. Characteristic microstructure parameters, i.e. density fluctuation, porosity and pore size distribution of several examples of SiO[2]-and SiC ceramics at different stages of sintering are presented. T2 - 9th World Ceramics Congress and Forum on New Materials ; 9th CIMTEC CY - Florence, Italy KW - Advanced ceramics PY - 1999 UR - http://cat.inist.fr/?aModele=afficheN&cpsidt=1811372 SN - 88-86538-17-0 N1 - Serientitel: Advances in science and technology – Series title: Advances in science and technology IS - 16 SP - 345 EP - 352 PB - Techna CY - Faenza AN - OPUS4-3272 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hentschel, Manfred P. A1 - Harbich, Karl-Wolfram A1 - Lange, Axel T1 - New X-ray refractometry of paper and pigments T2 - Tagungsband der 4. Internationalen Konferenz "Zerstörungsfreie Untersuchung an Kunst- und Kulturgütern" T2 - 4. Internale Konferenz "Zerstörungsfreie Untersuchung an Kunst- und Kulturgütern" CY - Berlin DA - 1994-10-03 PY - 1994 SP - 291 EP - 295 CY - Berlin AN - OPUS4-3650 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hentschel, Manfred P. A1 - Ekenhorst, Derk A1 - Harbich, Karl-Wolfram A1 - Lange, Axel T1 - New X.ray refractography for nondestructive investigations T2 - Proceedings of the International Symposium on Advanced Materials for Lightweight Structures '94 T2 - International Symposium on Advanced Materials for Lightweight Structures CY - Noordwijk, Netherlands DA - 1994-03-22 PY - 1994 N1 - Serientitel: ESA WPP – Series title: ESA WPP IS - 70 SP - 661 EP - 664 PB - ESTEC Conference Bureau CY - Noordwijk AN - OPUS4-3652 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Schors, Jörg A1 - Harbich, Karl-Wolfram A1 - Hentschel, Manfred P. A1 - Lange, Axel T1 - Non-Destructive Micro Crack Detection in Modern Materials T2 - 9th European Conference on NDT T2 - 9th European Conference on NDT CY - Berlin, Germany DA - 2006-09-25 KW - X-ray KW - Refraction KW - Micro cracks KW - Inner surface KW - Topography KW - Composites PY - 2006 SN - 3-931381-86-2 SP - 1(?) EP - 5(?) PB - European Federation for Non-Destructive Testing CY - Berlin AN - OPUS4-14040 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -