TY - JOUR A1 - Tzschichholz, Grit A1 - Steinborn, Gabriele A1 - Hentschel, Manfred P. A1 - Lange, Axel A1 - Klobes, Peter T1 - Characterisation of porous titania yttrium oxide compounds by mercury intrusion porosimetry and X-ray refractometry N2 - Aiming at ceramic materials of low thermal radiation emittance titania yttrium oxide ceramics have been prepared by sintering in air at 1,100 and 1,400 °C, respectively, and characterised. Due to its high infrared refractive index, average pore sizes up to 1 µm for optimal Mie scattering cross sections and over 35% porosity the material is a promising candidate for elevated temperature insulations. The essentially in large pore growth is achieved by graphitic nano and micro particle additives. The microstructure parameters of porosity, specific surface area, median and average pore sizes are determined by mercury intrusion porosimetry. Beyond this classical technique supplementary measurements by X-ray Absorption and X-ray refractometry reveal considerably larger average pore sizes due to closed pores not accessible for mercury. An additional advantage of the X-ray techniques is their non-destructive application, which allows other treatments afterwards. The combined application of both methods provides additional information and reliability in case of complex ceramic microstructures and may serve for improved developments of porous ceramics with optimised thermal scattering for energy savings in high temperature applications. KW - Porous ceramics KW - Mercury intrusion porosimetry KW - X-ray refractometry KW - Porosity KW - Specific surface area KW - Average pore size PY - 2011 DO - https://doi.org/10.1007/s10934-010-9358-4 SN - 1380-2224 SN - 1573-4854 VL - 18 IS - 1 SP - 83 EP - 88 PB - Kluwer CY - Dordrecht AN - OPUS4-22977 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Michaeli, W. A1 - Hentschel, Manfred P. A1 - Lingk, O. T1 - A novel approach for measuring the specific volume of (semi-crystalline) polymers at elevated cooling rates using X-rays T2 - ANTEC 2007, Annual technical conference CY - Cincinnati, OH, USA DA - 2007-05-06 KW - Thermoplaste KW - Rekristallisation KW - Quenching KW - Monochromatische Radiometrie KW - Kurzzeit-Radiometrie KW - Röntgen-Szintillationsdetektor hoher Zählraten PY - 2007 SN - 0-9753707-5-8 SP - 1617 EP - 1621 PB - Society of Plastics Engineers AN - OPUS4-17186 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Lange, Axel A1 - Hentschel, Manfred P. A1 - Schors, Jörg ED - Gerhard Busse, ED - Danny Van Hemelrijck, ED - Igor Solodov, ED - Anastasopoulos, Athanasios T1 - Direct iterative reconstruction of computed tomography trajectories (DIRECTT) T2 - 4th International Conference of Emerging Technologies in Non-Destructive Testing (ETNDT 4) CY - Stuttgart, Germany DA - 2007-04-02 KW - Computed tomography KW - Reconstruction algorithm PY - 2007 SN - 978-0-415-46476-5 SP - 229 EP - 236 PB - Taylor & Francis CY - London, UK AN - OPUS4-17560 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hentschel, Manfred P. T1 - X-ray diffraction and refraction topography of light weight materials T2 - 41st Annual Conference of The British Institute of Non-Destructive Testing - NDT 2002 CY - Southport, England DA - 2002-09-17 PY - 2002 AN - OPUS4-3092 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hentschel, Manfred P. A1 - Lange, Axel A1 - Harbich, Karl-Wolfram T1 - X-Ray Diffraction Scanning Microscopy - A new method of nondestructive Characterization of inhomogeneous materials T2 - ESA Symposium on Space Applications of Advanced Structural Materials (ESTEC) CY - Noordwijk, Netherlands DA - 1990-03-21 PY - 1990 IS - MBB-Z--0301-90-PUB SP - 447 EP - 450 PB - Zentrale Berichtsstelle, Technisch-wissenschaftliche Information, Messerschmitt-Bölkow-Blohm GmbH CY - München AN - OPUS4-3269 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Hentschel, Manfred P. A1 - Harbich, Karl-Wolfram A1 - Lange, Axel ED - Burke, W. T1 - New X-ray scanning topographic approaches to nondestructive evaluation of composites T2 - International Symposium "Advanced Materials for Lightweight Structures" CY - Noordwijk, Netherlands DA - 1992-03-25 PY - 1992 SN - 92-9092-186-2 N1 - Serientitel: ESA SP – Series title: ESA SP IS - 336 SP - 229 EP - 232 PB - ESTEC, ESA Publ. Division CY - Noordwijk AN - OPUS4-3271 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Harbich, Karl-Wolfram A1 - Hentschel, Manfred P. A1 - Schors, Jörg ED - Vincenzini, P. T1 - X-ray refraction: A new method for nondestructive characterization of advanced ceramics N2 - Quantitative X-ray refraction topography is applied for improved nondestructive evaluation of advanced high performance ceramics. The method is based on X-ray small angle scattering by refraction of X-rays due to density differences of microstructures in heterogeneous materials. It determines the amount of inner surfaces and interfaces within the range of µm to nm dimensions. As the scattered refraction intensity is proportional to the inner surface density of a sample, a reference standard gives a quantitative measure for analytical requirements. X-ray refraction scanning topography visualizes integral interface properties at 10 µm spatial resolution by two-dimensional computer images. Characteristic microstructure parameters, i.e. density fluctuation, porosity and pore size distribution of several examples of SiO[2]-and SiC ceramics at different stages of sintering are presented. T2 - 9th World Ceramics Congress and Forum on New Materials ; 9th CIMTEC CY - Florence, Italy KW - Advanced ceramics PY - 1999 UR - http://cat.inist.fr/?aModele=afficheN&cpsidt=1811372 SN - 88-86538-17-0 N1 - Serientitel: Advances in science and technology – Series title: Advances in science and technology IS - 16 SP - 345 EP - 352 PB - Techna CY - Faenza AN - OPUS4-3272 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Hampe, Andreas A1 - Harbich, Karl-Wolfram A1 - Hentschel, Manfred P. A1 - Rudolph, Hans-Volker T1 - The Determination of Inner Surfaces in Composites by X-Ray Refraction T2 - 12th International Conference on Composite Materials ; 12th ICCM Europe CY - Paris, France DA - 1999-07-05 PY - 1999 SN - 2-9514526-2-4 IS - 423 CY - Paris AN - OPUS4-3273 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Harbich, Karl-Wolfram A1 - Hentschel, Manfred P. A1 - Ekenhorst, Derk A1 - Schors, Jörg A1 - Lange, Axel T1 - X-Ray Refraction for NDT of Micro Cracks and Impacts N2 - High performance composites and other light weight materials are generally a comple problem to the performance of nondestructive testing methods. X-ray refraction provide unconventional X-ray scattering techniques to meet the actual demand for improve nondestructive characterization of these advanced materials. Scanning the samples across collimated narrow incident X-ray beam permits to image integral micro-structures (a present) with a resolution of 10 µm. Investigations of samples after strain-induced micro cracks and fibre debonding in impact damaged epoxy are shown. The physics of X-ray refraction are analogous to the well known refraction of light b optical lenses and prisms, governed by Snell's law. The special feature is the deflection a very small angles of few minutes of arc, as the refractive index of X-rays in matter i nearly one. Due to the density differences at inner surfaces most of the incident X-rays ar deflected. As the scattered intensity of refraction is proportional to the specific surface of sample, a reference standard gives a quantitative measure for analytical determinations. Figure 1 represents a two-dimensional damage distribution of an impact in a 0/90° CFR laminate of 3 mm, thickness. Unlike in ultrasonic testing, there is no shadowing effect o the successive layers. By use of X-ray refraction the exact concentration of debonde fibres is calculated for each position. Additionally the refraction allows the selection of th fibre orientation. T2 - 7th European Conference on Non-Destructive Testing (ECNDT) CY - Copenhagen, Denmark DA - 1998-05-26 PY - 1998 UR - http://www.ndt.net/abstract/ecndt98/435.htm SN - 87-986898-0-0 VL - 3 CY - Broendy, Denmark AN - OPUS4-3328 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Hentschel, Manfred P. A1 - Ekenhorst, Derk A1 - Harbich, Karl-Wolfram A1 - Lange, Axel A1 - Schors, Jörg ED - Green, R. E. T1 - New X-ray refractography for non-destructive evaluation of advanced materials T2 - 8th International Symposium on Nondestructive Characterization of Materials CY - Boulder, CO, USA DA - 1997-06-15 PY - 1998 SN - 0-306-45900-0 VL - 8 SP - 409 EP - 416 PB - Plenum Press CY - New York AN - OPUS4-3330 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -