TY - CONF A1 - Kupsch, Andreas A1 - Müller, Bernd R. A1 - Hentschel, M. P. A1 - Lange, A. A1 - Trappe, Volker A1 - Laquai, René A1 - Shashev, Yury A1 - Evsevleev, Sergei A1 - Bruno, Giovanni T1 - Progress survey of X-Ray refraction imaging techniques N2 - The most substantial innovations in radiographic imaging techniques of the last two decades aim at enhanced image contrast of weakly absorbing micro and nano structures by taking advantage of X-ray refraction effects occurring at outer and inner surfaces. The applications range from fibre reinforced plastics to biological tissues. These techniques comprise, among others, X-ray refraction topography, diffraction enhanced imaging, phase contrast imaging, Talbot-Lau grating interferometry, and refraction enhanced imaging. They all make use of selective beam deflections up to a few minutes of arc: the X-ray refraction effect. In contrast to diffraction, this type of interaction has a 100 % scattering cross section, as shown experimentally. Since X-ray refraction is very sensitive to the orientation of interfaces, it is additionally a tool to detect, e.g., fibre or pore orientation. If the detector resolution exceeds the size of (small) individual features, one detects the integral information (of inner surfaces) within the gauge volume. We describe the above-mentioned techniques, and show their experimental implementation in the lab and at a synchrotron source. We also show strategies for data processing and quantitative analysis. T2 - 19th World Conference on Non-Destructive Testing CY - Munich, Germany DA - 13.06.2016 KW - grating KW - topography KW - refraction KW - X-ray PY - 2016 U6 - http://nbn-resolving.de/urn/resolver.pl?urn:nbn:de:kobv:b43-366194 SN - 978-3-940283-78-8 VL - 2016/158 SP - We.3.B.2, 1 EP - 9 AN - OPUS4-36619 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Kupsch, Andreas A1 - Trappe, Volker A1 - Nielow, D. A1 - Schumacher, David A1 - Lange, A. A1 - Hentschel, M.P. A1 - Redmer, Bernhard A1 - Ewert, U. A1 - Bruno, Giovanni T1 - X-ray laminographic inspection of sandwich shell segments for wind turbine rotor blades N2 - 3D structural investigations are described by X-ray laminography studies of sandwich shell segments, made of a PVC foam core, covered by non-crimp fabric glass fibre composite lay-ups processed by vacuum assisted resin infusion of epoxy. The specific scope of this study is to image transversal flaws within the foam core (joints) and of single ply overlaps. Test flaws were purposely implemented in order to simulate typical failure under cyclic load. In a dedicated test rig for shell structures, the flaw evolution/propagation is monitored by thermography and optical 3D inspection of deformation. Due to the unfavourable preconditions for classical computed tomography as of large aspect ratio, the samples were investigated by coplanar translational laminography. Its limited range of observation angles of ± 45°, results in anisotropic artefacts about the normal to the sample surface, but the typical flaws are well visualized in the as-prepared state, in a state of early damage, and in the repaired state. T2 - 12th European conference on Non-Destructive Testing CY - Gothenburg, Sweden DA - 11.06.2018 KW - X-ray laminography KW - Wind turbine KW - Rotor blade PY - 2018 U6 - http://nbn-resolving.de/urn/resolver.pl?urn:nbn:de:kobv:b43-453931 SN - 978-91-639-6217-2 SP - 1 EP - 8 AN - OPUS4-45393 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Al-Falahat, A.M. A1 - Kupsch, Andreas A1 - Hentschel, M.P. A1 - Lange, A. A1 - Kardjilov, N. A1 - Markötter, Henning A1 - Manke, I. T1 - Correction approach of detector backlighting in radiography N2 - In various kinds of radiography, deficient transmission imaging may occur due to backlighting inside the detector itself arising from light or radiation scattering. The related intensity mismatches barely disturb the high resolution contrast, but its long range nature results in reduced attenuation levels which are often disregarded. Based on X-ray observations and an empirical formalism, a procedure is developed for a first order correction of detector backlighting. A backlighting factor is modeled as a function of the relative detector coverage by the sample projection. Different cases of sample transmission are regarded at different backlight factors and detector coverage. The additional intensity of backlighting may strongly affect the values of materials’ attenuation up to a few 10%. The presented scenario provides a comfortable procedure for corrections of X-ray or neutron transmission imaging data. KW - X-ray imaging KW - Neutron imaging KW - Radiology KW - Backlighting KW - Digital detector array PY - 2019 U6 - https://doi.org/10.1063/1.5097170 SN - 0034-6748 VL - 90 IS - 12 SP - 125108 PB - American Institute of Physics CY - Melville, NY, USA AN - OPUS4-50217 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Hilger, A. A1 - Kardjilov, N. A1 - Lange, A. A1 - Kupsch, Andreas A1 - Hentschel, M. P. A1 - Manke, I. T1 - Neutron darkfield imaging of fiber composites N2 - While X-ray based darkfield imaging with grating interferometers is already widely used, darkfield imaging with neutrons has still a relatively small user community focused mostly on magnetic materials. Here, we demonstrate the application of neutron darkfield imaging byTalbot-Lau type grating interferometry to fiber reinforced plastics. Common carbon and glass fiber composites have been investigated including characteristic damage structures. The darkfield images show a strong signal response caused by fiber delamination, suitable fiber direction, particles, pores and cracks. The basic principles of neutron darkfield imaging applied to fiber composites are highlighted. KW - Neutron radiography KW - Darkfield imaging KW - Talbot-Lau interferometer KW - Fiber composites KW - Non-destructive testing PY - 2021 U6 - https://doi.org/10.1515/mt-2020-0103 SN - 2195-8572 SN - 0025-5300 VL - 63 IS - 7 SP - 623 EP - 629 PB - De Gruyter CY - Berlin AN - OPUS4-53077 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -