TY - JOUR A1 - Richter, S. A1 - Horstmann, J. A1 - Altmann, Korinna A1 - Braun, U. A1 - Hagendorf, C. T1 - A reference methodology for microplastic particle size distribution analysis: Sampling, filtration, and detection by optical microscopy and image processing JF - Applied research N2 - Microplastic (MP) contamination in natural water circulation is a concern for environmental issues and human health. Various types of polymer materials have been identified and were detected in MP analytic test procedures. Beyond MP polymer type, particle size and form play a major role in water analysis due to possible negative toxicologic effects on flora and fauna. However, the correct quantitative measurement of MP size distribution over several orders of magnitude is strongly influenced by sample preparation, filtration materials and processes, and microanalytical techniques, as well as data acquisition and analysis. In this paper, a reference methodology is presented aiming at an improved quantitative analysis of MP particles. An MP analysis workflow is demonstrated including all steps from reference materials to sample preparation, filtration handling, and MP particle size distribution analysis. Background-corrected particle size distributions (1–1000 µm) have been determined for defined polyethylene (PE) and polyethylene terephthalate (PET) reference samples. Microscopically measured particle numbers and errors have been cross-checked with the total initial mass. In particular, defined reference MP samples (PE, PET) are initially characterized and applied to filtration experiments. Optical microscopy imaging on full-area Si filters with subsequent image analysis algorithms is used for statistical particle size distribution analysis. To quantify the effects of handling and filtration, several blind tests with distilled water are carried out to determine the particle background for data evaluation. Particle size distributions of PE and PET reference samples are qualitatively and quantitatively reproduced with respect to symmetry, and maximum and cut-off diameter of the distribution. It is shown that especially MP particles with a radius of >50 µm can be detected and retrieved with high reliability. For particle sizes <50 µm, a significant interference with background contamination is observed. Data from blank samples allows a correction of background contaminations. Furthermore, for enhanced sampling statistics, the recovery of the initial amount of MP will be qualitatively shown. The results are intended as an initial benchmark for MP analytics quality. This quality is based on statistical MP particle distributions and covers the complete analytic workflow starting from sample preparation to filtration and detection. Microscopic particle analysis provides an important supplement for the evaluation of established spectroscopic methods such as Fourier-transform infrared spectroscopy or Raman spectroscopy. KW - Drinking water KW - Filtration KW - Microplastics detection KW - Quality control KW - Statistical particle distribution PY - 2022 UR - https://nbn-resolving.org/urn:nbn:de:kobv:b43-567625 DO - https://doi.org/10.1002/appl.202200055 SN - 2702-4288 SP - 1 EP - 10 PB - Wiley-VCH CY - Weinheim AN - OPUS4-56762 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Meyer, S. A1 - Timmel, S. A1 - Gläser, M. A1 - Braun, Ulrike A1 - Wachtendorf, Volker A1 - Hagendorf, C. T1 - Polymer foil additives trigger the formation of snail trails in photovoltaic modules JF - Solar energy materials & solar cells N2 - After several months of operation, many photovoltaic (PV) modules develop a discolouration defect called snail trails which appear as irregular dark traces across the cells. These traces are caused by silver nanoparticles accumulating within the encapsulation foil directly above the grid finger. In this work we systematically investigate combinations of encapsulation and back-sheet foils with respect to their susceptibility for snail trails. We can show that certain additive compositions within the encapsulation and back sheet foils are critical for the formation of the discolouring silver nanoparticles. We suggest a reaction model explaining the formation of snail trails from a chemical point of view. This fundamental understanding allows the rapid testing of foils for their snail trail sensitivity as well as the special design of resistant foils. KW - Snail trails KW - Encapsulation foil KW - Back-sheet foil KW - Additives KW - Silver nanoparticles PY - 2014 DO - https://doi.org/10.1016/j.solmat.2014.06.028 SN - 0927-0248 VL - 130 SP - 64 EP - 70 PB - Elsevier B.V. CY - Amsterdam [u.a.] AN - OPUS4-31249 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Meyer, S. A1 - Timmel, S. A1 - Richter, S. A1 - Werner, M. A1 - Gläser, M. A1 - Swatek, S. A1 - Braun, Ulrike A1 - Hagendorf, C. T1 - Silver nanoparticles cause snail trails in photovoltaic modules JF - Solar energy materials & solar cells N2 - After some months of operation, a number of PV modules develop a discolouration defect called 'snail trails', or 'snail traces', which appear as irregular dark stripes across the cells. Whereas these traces were soon identified as discoloured silver contacts along the cell edges or at micro cracks, the chemical and mechanistic reasons for this phenomenon have not yet been resolved in detail. In this work we show that silver nanoparticles accumulating within the encapsulation foil cause the brownish discolouration, and that certain additives of encapsulation and back sheet foils trigger the formation of these nanoparticles. KW - Snail trails KW - Cell cracks KW - Encapsulation foil KW - Ag contact finger KW - Nanoparticles PY - 2014 DO - https://doi.org/10.1016/j.solmat.2013.11.013 SN - 0927-0248 VL - 121 SP - 171 EP - 175 PB - Elsevier B.V. CY - Amsterdam [u.a.] AN - OPUS4-30059 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Meyer, S. A1 - Richter, S. A1 - Balski, Matthias A1 - Hagendorf, C. T1 - Trace element analysis in crystalline silicon JF - Photovoltaics international PY - 2011 SN - 1757-1197 VL - 14th Edition IS - 4th Quarter, November SP - 34 EP - 39 PB - Semiconductor Media CY - London AN - OPUS4-25284 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -