TY - JOUR A1 - Recknagel, Christoph A1 - Goebbels, Jürgen A1 - Meinel, Dietmar T1 - Möglichkeiten der Strukturkennzeichnung von Asphalten mittels 3D-Computertomographie JF - Straße und Autobahn N2 - Die Struktur eines Materials bestimmt wesentlich dessen Gebrauchsverhalten. Diese einfache Weisheit ist Motivation für die ständige Weiterentwicklung des Untersuchungsinstrumentariums zur Gefügekennzeichnung von Baustoffen. Nachdem die Gefügeaufklärung insbesondere bei mineralischen Baustoffen bereits integrierter Bestandteil der Baustoffcharakterisierung ist, erhöht insbesondere die zunehmende Spezialisierung und Weiterentwicklung der Asphaltbaustoffe zusammen mit der Forderung nach gebrauchsgerechtem Leistungsnachweis den Bedarf an methodischer Entwicklung bei der Strukturkennzeichnung. Besondere Möglichkeiten zur tiefenaufgelösten und zerstörungsfreien räumlichen Visualisierung des Gefüges, der Ableitung strukturbeschreibender Kennwerte aber auch für eine anschließende Diskretisierung der inneren Struktur mittels finiter Elemente bietet das Verfahren der Computertomographie mit Röntgenstrahlen. Mit Hilfe verschiedener Anwendungen soll auf die Möglichkeiten dieser Methodik aufmerksam gemacht werden. KW - Innere Struktur KW - Asphalte KW - Hohlraumgehalt und -verteilung KW - Phasenanalyse KW - Strukturelle Artefakte PY - 2008 SN - 0039-2162 VL - 2 SP - 65 EP - 74 PB - Kirschbaum-Verl. CY - Bonn-Bad Godesberg AN - OPUS4-16725 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Goebbels, Jürgen T1 - Charakterisierung typischer Defektstrukturen in modernen Werkstoffen mittels Computertomographie T2 - Bauweisenkolloquium 2008 der DRL T2 - Bauweisenkolloquium 2008 der DRL CY - Stuttgart, Germany DA - 2008-03-05 PY - 2008 AN - OPUS4-16695 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Ewert, Uwe A1 - Goebbels, Jürgen A1 - Hentschel, Manfred P. A1 - Jaenisch, Gerd-Rüdiger A1 - Redmer, Bernhard A1 - Müller, Christina A1 - Zscherpel, Uwe A1 - Ehrig, Karsten A1 - Haarring, Holger A1 - Illerhaus, Bernhard A1 - Meinel, Dietmar A1 - Onel, Yener A1 - Staude, Andreas A1 - Wolk, Thomas T1 - Industrielle Computertomographie T2 - Fachtagung Wels T2 - Fachtagung Wels CY - Wels, Austria DA - 2008-02-27 PY - 2008 AN - OPUS4-16696 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Rack, A. A1 - Zabler, S. A1 - Riesemeier, Heinrich A1 - Weidemann, Gerd A1 - Müller, Bernd R. A1 - Helfen, L. A1 - Stiller, M. A1 - Knabe, C. A1 - Goebbels, Jürgen A1 - Banhart, J. T1 - Nondestructive 3D insights into foamy metals and bioregenerative ceramics T2 - BESSY highlights 2007 KW - X-ray Computed Tomography KW - Metal foams KW - Bioregenerative ceramics PY - 2008 UR - http://www.helmholtz-berlin.de/media/media/oea/web/pr_webseite/druckschriften/infos/bessy/highlights2007.pdf#page=34 SN - 1611-6127 SP - 34 EP - 35 PB - Berliner Elektronenspeicherring-Gesellschaft für Synchrotronstrahlung CY - Berlin AN - OPUS4-17538 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Rack, A. A1 - Riesemeier, Heinrich A1 - Zabler, S. A1 - Weitkamp, T. A1 - Müller, Bernd R. A1 - Weidemann, Gerd A1 - Modregger, P. A1 - Banhart, J. A1 - Helfen, L. A1 - Danilewsky, A.N. A1 - Gräber, H.G. A1 - Heldele, R. A1 - Mayzel, B. A1 - Goebbels, Jürgen A1 - Baumbach, T. ED - Stuart R. Stock, T1 - The high-resolution synchrotron-based imaging stations at the BAMline (BESSY) and TopoTomo (ANKA) T2 - Developments in X-Ray Tomography VI (Proceedings of SPIE) N2 - The BAMline at the BESSY light source in Berlin and the TopoTomo beamline at the ANKA synchrotron facility in Karlsruhe (both Germany) operate in the hard X-ray regime (above 6 keV) with similiar photon flux density. For typical imaging applications, a double multilayer monochromator or a filtered white beam is used. In order to optimise the field of view and the resolution of the available indirect pixel detectors, different optical systems have been installed, adapted, respectively, to a large field of view (macroscope) and to high spatial resolution (microscope). They can be combined with different camera systems, ranging from 16-bit dynamic range slow-scan CCDs to fast CMOS cameras. The spatial resolution can be brought substantially beyond the micrometer limit by using a Bragg magnifier. The moderate flux of both beamlines compared to other 3rd generation light sources is compensated by a dedicated scintillator concept. For selected applications, X-ray beam collimation has proven to be a reliable approach to increase the available photon flux density. Absorption contrast, phase contrast, holotomography and refraction-enhanced imaging are used depending on the application. Additionally, at the TopoTomo beamline digital white beam synchrotron topography is performed, using the digital X-ray pixel detectors installed. KW - Microtomography KW - Non-destructive evaluation KW - Coherent imaging KW - X-ray refraction KW - X-ray phase contrast KW - Synchrotron-CT KW - Synchrotron instrumentation KW - Scintillator KW - Bragg magnification KW - Holotomography KW - X-ray topography PY - 2008 DO - https://doi.org/10.1117/12.793721 SN - 0277-786X VL - 7078 SP - 70780X-1 - 70780X-9 AN - OPUS4-18296 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Staude, Andreas A1 - Goebbels, Jürgen A1 - Bartscher, M. A1 - Hilpert, U. A1 - Koch, M. A1 - Reinhart, C. T1 - Genauigkeitssteigerung der Defekterkennung in Gussteilen mit Computertomographie (CT) am Beispiel eines Aluminium-Zylinderkopfsegments T2 - DACH-Jahrestagung 2008 - Zerstörungsfreie Materialprüfung, ZfP in Forschung, Entwicklung und Anwendung, 28.- 30.4.2008, St. Gallen, Schweiz T2 - DACH-Jahrestagung 2008 - Zerstörungsfreie Materialprüfung, ZfP in Forschung, Entwicklung und Anwendung CY - St. Gallen, Schweiz DA - 2008-04-28 PY - 2008 SN - 978-3-940283-09-2 IS - DGZfP-BB 113 (Di.2.A.3) SP - 1 EP - 7 AN - OPUS4-18297 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Recknagel, Christoph A1 - Goebbels, Jürgen A1 - Meinel, Dietmar ED - Manfred N. Partl, T1 - Identification of the void structure of asphalt materials T2 - International ISAP Symposium on Asphalt Pavements and Environment, August 18-20, 2008, Zürich, Switzerland (Proceedings) T2 - International ISAP Symposium on Asphalt Pavements and Environment CY - Zürich, Switzerland DA - 2008-08-18 KW - Inner structure KW - Structure characteristics KW - Void KW - Asphalt KW - Open-pored asphalt PY - 2008 SN - 978-3-905594-51-5 SP - 566 EP - 577 AN - OPUS4-18284 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Goebbels, Jürgen A1 - Staude, Andreas T1 - Einfluss der Strahlenquellen auf das dimensionelle Messen T2 - Frauenhofer Gesellschaft: Workshop "Dimensionelles Messen mit Computertomographie" T2 - Frauenhofer Gesellschaft: Workshop "Dimensionelles Messen mit Computertomographie" CY - Saarbrücken, Germany DA - 2008-01-30 PY - 2008 AN - OPUS4-16515 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Goebbels, Jürgen T1 - Structural index of metal matrix composites evaluated with computed tomography T2 - World Conference Non-Destructive Testing T2 - World Conference Non-Destructive Testing CY - Shanghai, China DA - 2008-08-27 PY - 2008 AN - OPUS4-17371 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Rack, A. A1 - Zabler, S. A1 - Müller, Bernd R. A1 - Riesemeier, Heinrich A1 - Weidemann, Gerd A1 - Lange, Axel A1 - Goebbels, Jürgen A1 - Hentschel, Manfred P. A1 - Görner, Wolf T1 - High resolution synchrotron-based radiography and tomography using hard X-rays at the BAMline (BESSY II) JF - Nuclear instruments and methods in physics research A N2 - The use of high brilliance and partial coherent synchrotron light for radiography and computed tomography (CT) allows to image micro-structured, multi-component specimens with different contrast modes and resolutions up to submicrometer range. This is of high interest for materials research, life science and non-destructive evaluation applications. An imaging setup for microtomography and radiography installed at BESSY II (a third generation synchrotron light source located in Berlin, Germany) as part of its first hard X-ray beamline (BAMline) can now be used for absorption, refraction as well as phase contrast — dedicated to inhouse research and applications by external users. Monochromatic synchrotron light between 6 keV and 80 keV is attained via a fully automated double multilayer monochromator. For imaging applications the synchrotron beam transmitted by the sample is converted with a scintillator into visible light. By use of microscope optics this luminescence image is then projected onto, e.g., a CCD chip. Several scintillating materials are used in order to optimise the performance of the detector system. Different optical systems are available for imaging ranging from a larger field of view and moderate resolutions (macroscope — up to 14 mm x 14 mm field of view) to high resolution (microscope — down to 0.35 μm pixel size), offering magnifications from 1.8× to 40×. Additionally asymmetric cut Bragg crystals in front of the scintillator can be used for a further magnification in one dimension by a factor of about 20. Slow and fast cameras are available, with up to 16 bit dynamic range. We show the suitability of the setup for numerous applications from materials research and life science. KW - Microtomography KW - Non-destructive evaluation KW - Synchrotron instrumentation KW - Coherent imaging KW - X-ray refraction KW - Phase contrast KW - Holotomography KW - Synchrotron-CT KW - Scintillator KW - Bragg magnification PY - 2008 DO - https://doi.org/10.1016/j.nima.2007.11.020 SN - 0168-9002 SN - 0167-5087 VL - 586 IS - 2 SP - 327 EP - 344 PB - North-Holland CY - Amsterdam AN - OPUS4-17738 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -