TY - JOUR A1 - Frenzel, F. A1 - Fiedler, S. A1 - Bardan, A. A1 - Güttler, Arne A1 - Würth, Christian A1 - Resch-Genger, Ute T1 - Influence of Measurement Geometry and Blank on Absolute Measurements of Photoluminescence Quantum Yields of Scattering Luminescent Films N2 - For a series of 500 μm-thick polyurethane films containing different concentrations of luminescent and scattering YAG:Ce microparticles, we systematically explored and quantified pitfalls of absolute measurements of photoluminescence quantum yields (Φf) for often employed integrating sphere (IS) geometries, where the sample is placed either on a sample holder at the bottom of the IS surface or mounted in the IS center. Thereby, the influence of detection and illumination geometry and sample position was examined using blanks with various scattering properties for measuring the number of photons absorbed by the sample. Our results reveal that (i) setup configurations where the scattering sample is mounted in the IS center and (ii) transparent blanks can introduce systematic errors in absolute Φf measurements. For strongly scattering, luminescent samples, this can result in either an under- or overestimation of the absorbed photon flux and hence an under- or overestimation of Φf. The size of these uncertainties depends on the scattering properties of the sample and instrument parameters, such as sample position, IS size, wavelength-dependent reflectivity of the IS surface coating, and port configuration. For accurate and reliable absolute Φf measurements, we recommend (i) a blank with scattering properties closely matching those of the sample to realize similar distributions of the diffusely scattered excitation photons within the IS, and (ii) a sufficiently high sample absorption at the excitation wavelength. For IS setups with center-mounted samples, measurement geometries should be utilized that prevent the loss of excitation photons by reflections from the sample out of the IS. KW - Quality assurance KW - Fluorescence KW - Nano KW - Particle KW - Quantum yield KW - Characterization KW - Silica KW - Scattering KW - Uncertainty KW - Film KW - Pphosphor KW - YAG:Ce KW - LED KW - Converter material KW - Solid material KW - Polymer KW - Composite material KW - Advanced material PY - 2025 UR - https://nbn-resolving.org/urn:nbn:de:kobv:b43-638304 DO - https://doi.org/10.1021/acs.analchem.4c06726 SN - 1520-6882 SP - 1 EP - 8 PB - ACS Publications AN - OPUS4-63830 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Güttler, Arne T1 - Certified Reference Materials for the Quantification and Standardization of Fluorescence-based Measurements N2 - The size and shape of photoluminescence signals is affected by wavelength-, polarization-, and time-dependent instrumentspecific contributions and the compound- and environment-specific photoluminescence quantum yield. The former hamper the comparability of fluorescence measurements performed on different measuring devices. The commonly relatively done determination of the performance parameter requires suitable quantum yield standards with well-known. The performance of such measurements is, e.g., described in the written standard IEC 62607 currently revised. T2 - Colloquium für Optische Spektrometrie 2025 CY - Jena, Germany DA - 24.09.2025 KW - Quality assurance KW - Fluorescence KW - Nano KW - Particle KW - Advanced material KW - Calibration KW - Characterization KW - Fluorescence quantum yield KW - Phosphor KW - Absolute KW - Integrating sphere spectroscopy KW - Dye KW - Standardization KW - Reference material KW - Interlaboratory comparison KW - Uncertainty PY - 2025 AN - OPUS4-64213 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Pauli, Jutta A1 - Würth, Christian A1 - Güttler, Arne A1 - Resch-Genger, Ute T1 - Reliable Determination of the Signal-Relevant Spectroscopic Key Characteristics of Luminescent Reporters and Optical Probes for Imaging in the vis/NIR/SWIR N2 - Introduction. Comparing different emitter classes and rationally designing the next generation of molecular and nanoscale probes for bioimaging applications require accurate and quantitative methods for the measurement of the key parameter photoluminescence quantum yield f.1 f equals the number of emitted per number of absorbed photons. This is particularly relevant for increasingly used fluorescence imaging in the short wave-infrared region (SWIR) ≥ 900 nm providing deeper penetration depths, a better image resolution, and an improved signal-to-noise or tumor-to-background ratio.2, 3 However, spectroscopic measurements in the SWIR are more challenging and require specific calibrations and standards. T2 - EMIM 2021 CY - Göttingen, Germany DA - 24.08.2021 KW - Fluorescence KW - Optical probe KW - Dye KW - Photophysics KW - Quantum yield KW - Mechanism KW - NIR KW - SWIR KW - Imaging KW - Reference material KW - Reliability KW - Nano KW - Particle KW - Method KW - Quality assurance PY - 2021 AN - OPUS4-53233 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Resch-Genger, Ute A1 - Pauli, J. A1 - Güttler, Arne A1 - Richter, Maria A1 - Fiedler, Saskia A1 - Frenzel, Florian A1 - Wegner, Karl David A1 - Würth, Christian T1 - Photoluminescence Quantum Yields of Luminescent Nanocrystals and Particles in the UV/vis/NIR/SWIR N2 - The rational design of functional luminescent materials such as semiconductor quantum dots and lanthanide-based upconversion nanoparticles, all photophysical and mechanistic studies, and the comparison of different emitters require accurate and quantitative photoluminescence measurements. Particularly the reliable determination of the key performance parameter photoluminescence quantum yield (f), the number of emitted per absorbed photons, and the brightness are of special importance for luminescence applications in the life and material sciences and nano(bio)photonics.[1] In this context, examples for absolute measurements of the photoluminescence quantum yields of UV/vis/NIR/SWIR emissive semiconductor quantum dots and rods, made from different materials, and spectrally shifting lanthanide upconversion nanocrystals with different surface chemistries in transparent matrices are presented including excitation wavelength and power density dependent studies utilizing integration sphere spectroscopy.[2,3] In addition, procedures for the absolute determination of the photoluminescence quantum yields of scattering dispersions of larger size quantum rods and differently sized inorganic particles have been developed as well as procedures for the characterization of solid luminescent nanomaterials such as different perovskites and YAG:Cer converter materials.[4] Thereby, challenges and pitfalls of f measurements in different wavelength regions including the SWIR and material-specific effects related to certain emitter classes are addressed, achievable uncertainties are quantified, and relative and absolute measurements of photoluminescence quantum yield measurements are compared to underline limitations of the former approach. Finally, a set of novel UV/vis/NIR quantum yield standards is presented including their certification with a complete uncertainty budget.[5] T2 - NANAX 10 CY - Klosterneuburg, Austria DA - 03.07.2023 KW - Fluorescence KW - Optical spectroscopy KW - Reference data KW - Traceability KW - NIR KW - Scattering KW - Reference material KW - Certification KW - Quality assurance KW - Dye KW - Reference product KW - SWIR KW - Nano KW - Particle KW - Perovskite KW - Integrating sphere spectroscopy KW - Quantum yield PY - 2023 AN - OPUS4-58238 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -