TY - JOUR A1 - Fahrbach, M. A1 - Friedrich, Sebastian A1 - Cappella, Brunero A1 - Peiner, Erwin T1 - Calibrating a high-speed contact-resonance profilometer N2 - A European EMPIR project, which aims to use large-scale piezoresistive microprobes for contact resonance applications, a well-established measurement mode of atomic force microscopes (AFMs), is being funded. As the probes used in this project are much larger in size than typical AFM probes some of the simplifications and assumptions made for AFM probes are not applicable. This study presents a guide on how to systematically create a model that replicates the dynamic behavior of microprobes, including air damping, nonlinear sensitivities, and frequency dependencies. The model is then verified by analyzing a series of measurements. KW - Piezoresistive cantilever KW - AFM KW - contact resonance PY - 2020 UR - https://nbn-resolving.org/urn:nbn:de:kobv:b43-509899 DO - https://doi.org/10.5194/jsss-9-179-2020 VL - 9 SP - 179 EP - 187 PB - Copernicus Publications AN - OPUS4-50989 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Friedrich, Sebastian A1 - Cappella, Brunero T1 - Application of contact-resonance AFM methods to polymer samples N2 - Contact-resonance AFM (CR-AFM) has been used in recent years for the measurement of mechanical properties. Compared with other techniques, CR-AFM has a much shorter acquisition time, compensating the incomplete theoretical understanding of the underlying physical phenomena. In the present paper, we propose a procedure, which allows to determine the elastic modulus of the sample as a parameter of the fit of the CR frequency as a function of the load. It is concluded that CR measurements are not appropriate for polymer samples. Major drawbacks are the bad resolution for moduli lower than ca. 10 GPa and the lack of a comprehensive physical model. KW - Atomic force microscopy KW - Contact resonance KW - Mechanical properties KW - Polymers KW - Wear PY - 2020 UR - https://nbn-resolving.org/urn:nbn:de:kobv:b43-515621 DO - https://doi.org/10.3762/bjnano.11.154 VL - 11 SP - 1714 EP - 1727 AN - OPUS4-51562 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Fahrbach, M. A1 - Friedrich, Sebastian A1 - Behle, H. A1 - Xu, Min A1 - Cappella, Brunero A1 - Brand, U. A1 - Peiner, E. T1 - Customized piezoresistive microprobes for combined imaging of topography and mechanical properties N2 - Customized piezoresistive cantilever microprobes with a deflection range of 120 μm and silicon tips of 100 μm height were operated in a Cypher AFM showing their functionality for measuring topography together with stiffness, adhesion, and viscoelastic properties of thin films. KW - Cantilever microprobe KW - Piezoresistive KW - Atomic force microscopy KW - Force-distance curves KW - Contact resonance KW - Lubricants PY - 2021 UR - https://nbn-resolving.org/urn:nbn:de:kobv:b43-524225 DO - https://doi.org/10.1016/j.measen.2021.100042 VL - 15 SP - 100042 PB - Elsevier Ltd. AN - OPUS4-52422 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Friedrich, Sebastian A1 - Cappella, Brunero T1 - Correction to: Study of micro- and nanoscale wetting properties of lubricants using AFM force-distance curves N2 - The article "Study of micro- and nanoscale wetting properties of lubricants using AFM force-distance Curves" was originally published Online First in the journal "Tribology letters" without Open Access. After publication in volume 68, issue 1, the authors decided to opt for Open Choice and to make the article an Open Access publication. Therefore, the copyright of the article has been changed to © The Authors 2021 and the article is forthwith distributed under the terms of the Creative Commons Attribution 4.0 International License. PY - 2021 UR - https://nbn-resolving.org/urn:nbn:de:kobv:b43-542710 DO - https://doi.org/10.1007/s11249-021-01491-1 SN - 1573-2711 VL - 69 SP - 1 PB - Springer CY - Cham AN - OPUS4-54271 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Friedrich, Sebastian A1 - Cappella, Brunero T1 - Study of micro- and nanoscale wetting properties of lubricants using AFM force-distance curves N2 - Atomic force microscopy (AFM) plays an important role as a multifuntional tool in nanotribology.In the present work it was shown that the main features of force-distance curves on different lubricants have been characterized and the underlying phenomena could be explained. KW - Lubricants KW - Atomic force microscopy KW - Force-distance curves PY - 2020 UR - https://nbn-resolving.org/urn:nbn:de:kobv:b43-504631 DO - https://doi.org/10.1007/s11249-020-1275-3 SN - 1573-2711 VL - 68 IS - 1 SP - 1 EP - 12 PB - Springer CY - Cham AN - OPUS4-50463 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Friedrich, Sebastian A1 - Cappella, Brunero T1 - Friction and mechanical properties of AFM-scan-induced ripples in polymer films N2 - In the present paper, friction and mechanical properties of AFM-Scan-Induced ripple structures on films of polystyrene and poly-n-(butyl methacrylate) are investigated. Force volume measurements allow a quantitative analysis of the elastic moduli with nanometer resolution, showing a contrast in mechanical response between bundles and troughs. Additionally, analysis of the lateral cantilever deflection shows a clear correlation between friction and the sample topography. Those results support the theory of crack propagation and the formation of voids as a mechanism responsible for the formation of ripples. This paper also shows the limits of the presented measuring methods for soft, compliant, and small structures. KW - AFM KW - Polymer KW - Ripples KW - Mechanical properties KW - Friction PY - 2021 UR - https://nbn-resolving.org/urn:nbn:de:kobv:b43-532772 DO - https://doi.org/10.3389/fmech.2021.672898 SN - 2297-3079 VL - 7 SP - 1 EP - 8 PB - Frontiers Media CY - Lausanne AN - OPUS4-53277 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Friedrich, Sebastian T1 - Characterization of lubricants using AFM force-distance curves N2 - Auf dünnen Filmen von Schmiermitteln wurden Kraft-Abstand-Kurven aufgenommen. Die Schmiermittel benetzen die AFM-Spitze, sodass eine Kapillarkraft auftritt. Diese hängt von der Form der Spitze sowie von physikalischen Eigenschaften wie Viskosität und Oberflächenspannung ab, die zusätzlich mit anderen Verfahren bestimmt wurden. So konnte ihr Einfluss auf die Kurvenform untersucht werden. N2 - Force-distance curves have been recorded on thin films of lubricants. The lubricants wet the AFM tip, which causes a capillary force. This force depends on the shape of the tip, as well as on physical properties like viscosity and surface tension, which have been determined additionally with other methods. This way, their influence on the shape of the curves could be analyzed. T2 - 60. Tribologie-Fachtagung der Gesellschaft für Tribologie/GfT CY - Göttingen, Germany DA - 23.09.2019 KW - AFM-Kraft-Abstand-Kurven KW - Schmiermittel KW - Viskosität PY - 2019 AN - OPUS4-49906 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -