TY - CONF A1 - Jaenisch, Gerd-Rüdiger A1 - Bellon, Carsten A1 - Ewert, Uwe T1 - Simulation for high energy radiography and reliability assessment T2 - National Seminar on NDE of the Indian Society for Non-Destructive Testing CY - Kolkata, India DA - 2005-12-02 KW - Radiation techniques KW - Simulation KW - High-energy radiography KW - CAD PY - 2005 SP - 14 pages PB - Indian Society for Non-Destructive Testing CY - Kalkutta AN - OPUS4-11834 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Jaenisch, Gerd-Rüdiger A1 - Bellon, Carsten A1 - Ewert, Uwe ED - Thompson, D. O. T1 - Reliability assessment by simulation for high energy radiography T2 - 33th Annual Review of Progress in Quantitative Nondestructive Evaluation CY - Portland, OR, USA DA - 2006-07-30 KW - Simulation KW - Radiography KW - CAD KW - Probability of Detection PY - 2007 SN - 978-0-7354-0399-4 SN - 0743-0760 SN - 0094-243X N1 - Serientitel: AIP conference proceedings – Series title: AIP conference proceedings IS - 894 SP - 1831 EP - 1838 PB - American Institute of Physics CY - Melville, NY AN - OPUS4-15696 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Jaenisch, Gerd-Rüdiger A1 - Bellon, Carsten A1 - Ewert, Uwe T1 - Simulation supported reliability analysis in radiography T2 - 10th European conference on non-destructive testing CY - Moscow, Russia DA - 2010-06-07 KW - Simulation KW - Zuverlässigkeit KW - POD PY - 2010 IS - Paper 4.02.18 SP - 1 EP - 13 AN - OPUS4-22767 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Jaenisch, Gerd-Rüdiger A1 - Ewert, Uwe A1 - Jechow, Mirko T1 - Scatter radiation in radiography T2 - 10th European conference on non-destructive testing CY - Moscow, Russia DA - 2010-06-07 KW - Simulation KW - Streustrahlung KW - Abbildungskontrast KW - Bildqualität PY - 2010 IS - Paper 4.02.18 SP - 1 EP - 9 AN - OPUS4-22765 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Gollwitzer, Christian A1 - Bellon, Carsten A1 - Deresch, Andreas A1 - Ewert, Uwe A1 - Jaenisch, Gerd-Rüdiger A1 - Zscherpel, Uwe A1 - Mistral, Q. ED - Thompson, D. O. ED - Chimenti, D. E. T1 - Simulation supported POD for RT test case - concept and modeling N2 - Within the framework of the European project PICASSO, the radiographic simulator aRTist (analytical Radiographic Testing inspection simulation tool) developed by BAM has been extended for reliability assessment of film and digital radiography. NDT of safety relevant components of aerospace industry requires the proof of probability of detection (POD) of the inspection. Modeling tools can reduce the expense of such extended, time consuming NDT trials, if the result of simulation fits to the experiment. Our analytic simulation tool consists of three modules for the description of the radiation source, the interaction of radiation with test pieces and flaws, and the detection process with special focus on film and digital industrial radiography. It features high processing speed with near–interactive frame rates and a high level of realism. A concept has been developed as well as a software extension for reliability investigations, completed by a user interface for planning automatic simulations with varying parameters and defects. Furthermore, an automatic image analysis procedure is included to evaluate the defect visibility. The radiographic modeling from 3D CAD of aero engine components and quality test samples are compared as a precondition for real trials. This enables the evaluation and optimization of film replacement for application of modern digital equipment for economical NDT and defined POD. T2 - 38th Annual Review of Progress in Quantitative Nondestructive Evaluation CY - Burlington, VT, USA DA - 2011-07-17 KW - X-ray imaging KW - Probability of detection KW - Simulation KW - ZfP KW - Radiographie KW - POD PY - 2012 SN - 978-0-7354-1013-8 U6 - https://doi.org/10.1063/1.4716283 SN - 0743-0760 SN - 0094-243X N1 - Serientitel: AIP conference proceedings – Series title: AIP conference proceedings VL - 31 IS - 1430 SP - 605 EP - 612 PB - American Institute of Physics CY - Melville, NY AN - OPUS4-26696 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Jaenisch, Gerd-Rüdiger A1 - Deresch, Andreas A1 - Bellon, Carsten A1 - Ewert, Uwe A1 - Przybilla, Waldemar ED - Thompson, D.O. ED - Chimenti, D.E. T1 - Measurement and modeling of scatter ratios at high energies N2 - Determining scatter ratios at high energies (> ~ 1MeV) presents challenges not immediately obvious from measurements at conventional X-ray energies. This includes reduced attenuation even in heavy elements as well as a stronger forward bias of scattering. In order to check the reliability of different measurement setups with regard to material thicknesses, distances, and collimation, attenuation and scattering were separately simulated using a Monte Carlo model. The simulation results help in understanding the sources of radiation scattered into the detection area, thereby aiding in eliminating undesired contributions. T2 - 37th Annual Review of Progress in Quantitative Nondestructive Evaluation CY - San Diego, CA, USA DA - 18.07.2010 KW - Radiography KW - Optimisation KW - X-ray detection KW - Simulation KW - High energy KW - Co-60 KW - Modeling KW - Scatter PY - 2011 SN - 978-0-7354-0888-3 U6 - https://doi.org/10.1063/1.3591895 SN - 0743-0760 SN - 0094-243X N1 - Serientitel: AIP conference proceedings – Series title: AIP conference proceedings IS - 1335 SP - 517 EP - 524 PB - American Institute of Physics CY - Melville, NY AN - OPUS4-25358 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Gollwitzer, Christian A1 - Bellon, Carsten A1 - Deresch, Andreas A1 - Jaenisch, Gerd-Rüdiger A1 - Baron, H.-U. A1 - Ewert, Uwe T1 - Reliability investigations of radiographic testing using aRTist as a simulation tool N2 - Within the framework of the European project PICASSO, the radiographic simulator aRTist (analytical Radiographic Testing inspection simulation tool) developed by BAM has been extended for reliability assessment of film and digital radiography. A simulation supported probability of detection (POD) methodology has been developed and the validity of the approach has been studied using an application from the aeronautics industry. An experimental POD has been determined with the help of a specialized software tool, developed to aid with the collection of large series of POD data. The resulting POD is compared to simulations of the same setting using aRTist and the newly available module for simulation supported POD. A quantitative agreement within a few percent is achieved between the experimental and the simulation supported POD. T2 - 18th WCNDT - World conference on nondestructive testing CY - Durban, South Africa DA - 2012-04-16 KW - X-ray imaging KW - Probability of detection KW - Simulation PY - 2012 SN - 978-0-620-52872-6 SP - 1 EP - 10 (Paper 338) AN - OPUS4-27400 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Ewert, Uwe A1 - Deresch, Andreas A1 - Bellon, Carsten A1 - Jaenisch, Gerd-Rüdiger ED - Chimenti, D.E. ED - Bond, L.J. ED - Thompson, D.O. T1 - A benchmark concept for simulation in radiographic testing N2 - The new standard ISO 17636–2:2013 'NDT of welds: Radiographic testing - Part 2: X- and gamma ray techniques with digital detectors' describes a complex procedure for film replacement by phosphor imaging plates and digital detector arrays. RT modeling software should consider these detector types, X-ray film, and the standard requirements for image quality. Practitioners expect the same visibility of image quality indicators (IQI) in the simulated radiographs as in the experimental exposures. The proposed benchmark test is based on the comparison of experimental radiographs taken at BAM with modeled ones of participants. The experimental setup and the determination of the equivalent penetrameter sensitivity (EPS) as described in the procedure of ASTM E 746 are used for quantitative evaluation of the achievable contrast sensitivity for step hole IQIs as considered in Annex B of ISO 17636-2. System classification data for Computed Radiography (CR) and film systems will be provided by BAM according to ISO 11699–1 for selected film systems and according to ASTM E 2446 for selected CR systems. The classification of films and digital detectors is based on the measurement of the dose response function, the basic spatial resolution (SRb) of the image, and the measured image noise, which depends on the detector efficiency, the quantum statistics, and the detector fixed pattern noise. T2 - 40th Annual review of progress in quantitative nondestructive evaluation CY - Baltimore, Maryland, USA DA - 21.07.2013 KW - Digital radiography KW - Computed radiography KW - Benchmark KW - EPS KW - Modeling KW - Simulation KW - Contrast to noise ratio KW - Observer model PY - 2014 SN - 978-0-7354-1212-5 SN - 978-0-7354-1211-8 U6 - https://doi.org/10.1063/1.4865044 SN - 0094-243X N1 - Serientitel: AIP conference proceedings – Series title: AIP conference proceedings VL - 33A SP - 1816 EP - 1823 PB - AIP Publishing AN - OPUS4-30904 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -