TY - CONF A1 - Bartscher, M. A1 - Staude, Andreas A1 - Ehrig, Karsten A1 - Ramsey, A. T1 - The influence of data filtering on dimensional measurements with CT T2 - 18th WCNDT - World conference on nondestructive testing (Proceedings) N2 - Data processing is an essential part of the evaluation of measurement results, e.g. in X-ray computed tomography (CT). Some of these calculations are denoted as 'filtering'. Filtering is always a trade-off between an enhancement of data quality and a loss of information. The standard reconstruction technique for CT data is t he filtered back-projection. Additionally to the high-pass filter inherent to this technique, a suppression of high-frequency noise is in most cases also necessary. Many different possible filter algorithms are found in the literature. Although their effect on the signal-to-noise ratio and the spatial resolution is well-studied, it is not obvious how the different filters affect the determination of the object's surface in the reconstructed data and, thus, the results of dimensional CT measurements. We compare the results of industrial dimensional CT measurements obtained at the same data set of a calibrated reference standard – a calotte cube – when using different filters and discuss the implications. Filters under investigation are mainly median filters on projections and as well filters during filtered backprojection and filters on the reconstructed volume. T2 - 18th WCNDT - World conference on nondestructive testing CY - Durban, South Africa DA - 2012-04-16 KW - Computed tomography (CT) KW - Dimensional measurement KW - Data filtering KW - Resolution PY - 2012 SN - 978-0-620-52872-6 SP - 1 EP - 13 (Paper 429) AN - OPUS4-26252 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Ehrig, Karsten A1 - Bartscher, M. A1 - Goebbels, Jürgen A1 - Härtig, F. A1 - Kniel, K. A1 - Neukamm, M. A1 - Neuschaefer-Rube, U. A1 - Staude, Andreas ED - Denecke, M. ED - Walker, C. T1 - Dimensional control of micro components with synchrotron computed tomography T2 - 20th International congress on X-ray optics and microanalysis (Proceedings) T2 - 20th International congress on X-ray optics and microanalysis CY - Karlsruhe, Germany DA - 2009-09-14 KW - Synchrotron radiation KW - Computed tomography KW - Dimensional measurement KW - Micro components PY - 2010 SN - 978-0-7354-0764-0 SN - 0094-243X SP - 164 EP - 171 PB - American Institute of Physics AN - OPUS4-21293 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -