TY - JOUR A1 - Guadagnino, E. A1 - Matschat, Ralf A1 - Dette, Angelika A1 - Sundberg, P. T1 - Certification of the mass fractions of trace elements in glass to be used for multi-element determination by XRF: a joint collaborative work in cooperation between BAM and ICG KW - Glasreferenzmaterial KW - Röntgenfluoreszenzanalyse KW - Multielementspurenbestimmung PY - 2005 SN - 0391-4259 IS - 4 SP - 5 EP - 16 PB - Aurora Pubbl. CY - Venezia AN - OPUS4-11665 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Dette, Angelika A1 - Guadagnino, E. A1 - Matschat, Ralf A1 - Sundberg, P. T1 - Certification of the mass fractions of total and hexavalent chromium in glass: a joint collaborative work in co-operation with BAM and ICG KW - Glasreferenzmaterial KW - Hexavalentes Chrom KW - Verpackungsverordnung PY - 2004 SN - 0391-4259 IS - 1 SP - 5 EP - 14 PB - Aurora Pubbl. CY - Venezia AN - OPUS4-11868 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Matschat, Ralf A1 - Dette, Angelika A1 - Richter, Silke A1 - Recknagel, Sebastian A1 - Barth, P. T1 - Certification of a boron carbide powder reference material for chemical analysis N2 - The certification of a boron carbide reference material for chemical composition is described. The mass fractions of 16 elements and two boron species are certified in an international interlaboratory comparison with 35 participating laboratories from six different countries. Beside chemical characterization the certification process includes homogeneity and stability testing of the candidate material boron carbide (type F360, 305M422). Details of the analytical methods used for chemical characterization and of the calculation of the uncertainties of the certified mass fractions are given. The new reference material ERM®-ED102 with certified mass fractions of 18 parameters (elements and species) and of the amount fraction of the isotope 10B is a valuable tool for laboratories working in the field of advanced ceramic materials analysis to improve their analytical results. KW - Boron carbide KW - Certified reference material KW - ERM KW - Certification PY - 2011 U6 - https://doi.org/10.1111/j.1551-2916.2011.04657.x SN - 0002-7820 SN - 1551-2916 VL - 94 IS - 11 SP - 4009 EP - 4016 PB - Blackwell Publishing CY - Malden AN - OPUS4-24967 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Matschat, Ralf A1 - Haßler, J. A1 - Traub, Heike A1 - Dette, Angelika T1 - Multielement trace determination in SiC powders: assessment of interlaboratory comparisons aimed at the validation and standardization of analytical procedures with direct solid sampling based on ETV ICP OES and DC arc OES N2 - The members of the committee NMP 264 Chemical analysis of non-oxidic raw and basic materials of the German Standards Institute (DIN) have organized two interlaboratory comparisons for multielement determination of trace elements in silicon carbide (SiC) powders via direct solid sampling methods. One of the interlaboratory comparisons was based on the application of inductively coupled plasma optical emission spectrometry with electrothermal vaporization (ETV ICP OES), and the other on the application of optical emission spectrometry with direct current arc (DC arc OES). The interlaboratory comparisons were organized and performed in the framework of the development of two standards related to the determination of mass fractions of metallic impurities in powders and grain sizes of ceramic raw and basic materials by both methods. SiC powders were used as typical examples of this category of material. The aim of the interlaboratory comparisons was to determine the repeatability and reproducibility of both analytical methods to be standardized. This was an important contribution to the practical applicability of both draft standards. Eight laboratories participated in the interlaboratory comparison with ETV ICP OES and nine in the interlaboratory comparison with DC arc OES. Ten analytes were investigated by ETV ICP OES and eleven by DC arc OES. Six different SiC powders were used for the calibration. The mass fractions of their relevant trace elements were determined after wet chemical digestion. All participants followed the analytical requirements described in the draft standards. In the calculation process, three of the calibration materials were used successively as analytical samples. This was managed in the following manner: the material that had just been used as the analytical sample was excluded from the calibration, so the five other materials were used to establish the calibration plot. The results from the interlaboratory comparisons were summarized and used to determine the repeatability and the reproducibility (expressed as standard deviations) of both methods. The calculation was carried out according to the related standard. The results are specified and discussed in this paper, as are the optimized analytical conditions determined and used by the authors of this paper. For both methods, the repeatability relative standard deviations were <25%, usually ~10%, and the reproducibility relative standard deviations were <35%, usually ~15%. These results were regarded as satifactory for both methods intended for rapid analysis of materials for which decomposition is difficult and time-consuming. Also described are some results from an interlaboratory comparison used to certify one of the materials that had been previously used for validation in both interlaboratory comparisons. Thirty laboratories (from eight countries) participated in this interlaboratory comparison for certification. As examples, accepted results are shown from laboratories that used ETV ICP OES or DC arc OES and had performed calibrations by using solutions or oxides, respectively. The certified mass fractions of the certified reference materials were also compared with the mass fractions determined in the interlaboratory comparisons performed within the framework of method standardization. Good agreement was found for most of the analytes. KW - Inductively coupled plasma optical emission spectrometry KW - Electrothermal vaporization KW - ETV ICP OES KW - Direct current optical emission spectrometry KW - DC arc OES KW - Direct solid sampling technique KW - Silicon carbide powder KW - Method validation KW - Method standardization KW - Direkte Feststoffanalytik KW - Normung KW - Methodenvalidierung KW - Ringversuche KW - Siliciumcarbid PY - 2005 U6 - https://doi.org/10.1007/s00216-005-3415-x SN - 1618-2642 SN - 1618-2650 VL - 383 IS - 7-8 SP - 1060 EP - 1074 PB - Springer CY - Berlin AN - OPUS4-10890 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Heinrich, Hans-Joachim A1 - Dette, Angelika ED - Bernhard Welz, T1 - Anwendung der Glaskohlenstoffplattform in der Graphitrohrofen-AAS T2 - CANAS `95 - Colloquium Analytische Atomspektroskopie CY - Konstanz, Deutschland DA - 1995-04-02 PY - 1996 SN - 0945-2524 SP - 109 EP - 114 CY - Überlingen AN - OPUS4-15831 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Dette, Angelika A1 - Richter, Silke A1 - Heinrich, Hans-Joachim A1 - Recknagel, Sebastian A1 - Jakubowski, Norbert T1 - Bestimmung von Spurenverunreinigungen und deren Bindungsformen in hochreinem SiC T2 - ICP-OES Anwendertreffen, Thermo Scientific CY - Hanover, Germany DA - 2010-11-04 PY - 2010 AN - OPUS4-21992 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Dette, Angelika A1 - Richter, Silke A1 - Heinrich, Hans-Joachim A1 - Peplinski, Burkhard A1 - Recknagel, Sebastian A1 - Jakubowski, Norbert T1 - Bestimmung von Spurenverunreinigungen und deren Bindungsformen in hochreinem SiC T2 - 3. Anwendertreffen Direkte Feststofftechniken CY - Berlin, Germany DA - 2009-10-08 PY - 2009 AN - OPUS4-20377 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -