TY - CONF A1 - Daum, Werner A1 - Gründer, Klaus-Peter T1 - VDI/VDE Standardization Activities of DIC Measurement Techniques N2 - With more than 180.000 engineers and scientists VDI Association of German Engineers and VDE Association for Electrical, Electronic & Information Technologies are belonging to the major technical and scientific associations in Europe. Both organizations promote the advancement of technology and among other things by developing recognized technical regulations as national and international standards. Since 2011 Technical Committee 2.15 Optical Measuring Methods for Structure Analysis and Monitoring as a common committee of both organizations is working among other things on the development of standards for optical measuring and testing methods. The committee consists of 27 members representing industrial users, system manufacturers, research institutes and universities. Currently the committee is drafting the new standard VDI/VDE 2626 Part 1 - Optical measuring procedures – Image correlation methods – Basics and equipment, which will be introduced in this presentation. Draft VDI/VDE 2626 Part 1 describes practical acceptance and reverification procedures for the evaluation of the accuracy of optical measuring systems based on digital image correlation (DIC) methods. The document applies to DIC measurement systems used a) for full-field determination of two- or three-dimensional displacement of surfaces, and b) for full-field determination of the elongation or strain of surfaces. The standard describes quality parameters as well as methods and reference objects for their determination. The quality parameters serve to specify DIC systems, and to compare different systems. They are equally suitable a) for acceptance tests as well as b) for reverification of DIC systems within the framework of a quality management system. The acceptance test is used to determine whether the DIC system complies with the quality parameter limits specified by the manufacturer, or with contractually agreed limits by the manufacturer and user, respectively. For this test the quality parameters zero-displacement error, zero-strain error, and displacement error are defined and used. Zero-displacement error and zero-strain error describe minimum measurement uncertainties of the DIC system a user has to reckon with. They are influenced by different uncertainty contributions. The quality parameter displacement error is used to check the ability of the DIC system to determine absolute displacements within the measurement volume and to confirm the traceability of this measurement to the SI system. Reverification of DIC systems serves to ensure long-term compliance with specified limits for the quality parameters. By comparing the results of successive reverification measurements of the quality parameters used for the acceptance test, it is possible to analyze trends with respect to changes in DIC system characteristics. T2 - Annual International DIC Society Conference 2017 CY - Barcelona, Spain DA - 06.11.2017 KW - Digital image correlation KW - Standardization PY - 2017 AN - OPUS4-43373 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Bartholmai, Matthias A1 - Werner, Klaus-Dieter A1 - Johann, Sergej A1 - Daum, Werner ED - Cosmi, F. T1 - Characterization of the temperature behavior of a piezoresistive accelerometer N2 - Piezoresistive accelerometers use a strain-sensing element, generally made of semiconductor material, e.g., silicon to convert the mechanical motion into an electrical signal. This element is usually designed in form of a cantilever beam loaded with a mass. Acceleration causes bending of the beam, which produces a change of electrical resistance proportional to the applied acceleration. Main advantages of piezoresistive accelerometers in comparison to other types, e.g., piezoelectric and capacitive, is their robust and highly dynamic behavior, which qualifies them for application in high impact shock applications. Mechanical damping is typically implemented with silicon oil in a way that the output signal is undistorted over a wide frequency range. These characteristics principally qualify them for the application in drop tests carried out at BAM, for which they are calibrated over the frequency range from 1 to 4 kHz. However, using silicon oil for damping, has the drawback of temperature dependent change of its viscosity, leading to temperature dependent deviation of the accelerometer’s sensitivity. This study presents experimental results of the temperature behavior of a piezoresistive accelerometer with a dynamic range up to ±5000 g. This type of accelerometer is applied for drop tests which are partially performed at temperatures of -40 or +100 °C. T2 - 34th Danubia-Adria Symposium on Advances in Experimental Mechanics CY - Trieste, Italy DA - 19.09.2017 KW - Accelerometer KW - Temperature behavior KW - Drop test PY - 2017 UR - https://www.openstarts.units.it/handle/10077/14921 SN - 978-88-8303-863-1 SP - 93 EP - 95 CY - Trieste AN - OPUS4-42109 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -