TY - CONF A1 - Daum, Werner T1 - VDI/VDE Standardization Activities of DIC Measurement Techniques N2 - With more than 180.000 engineers and scientists VDI Association of German Engineers and VDE Association for Electrical, Electronic & Information Technologies are belonging to the major technical and scientific associations in Europe. Both organizations promote the advancement of technology and among other things by developing recognized technical regulations as national and international standards. Since 2011 Technical Committee 2.15 Optical Measuring Methods for Structure Analysis and Monitoring as a common committee of both organizations is working among other things on the development of standards for optical measuring and testing methods. The committee consists of 27 members representing industrial users, system manufacturers, research institutes and universities. Currently the committee is drafting the new standard VDI/VDE 2626 Part 1 - Optical measuring procedures – Image correlation methods – Basics and equipment, which will be introduced in this presentation. Draft VDI/VDE 2626 Part 1 describes practical acceptance and reverification procedures for the evaluation of the accuracy of optical measuring systems based on digital image correlation (DIC) methods. The document applies to DIC measurement systems used a) for full-field determination of two- or three-dimensional displacement of surfaces, and b) for full-field determination of the elongation or strain of surfaces. The standard describes quality parameters as well as methods and reference objects for their determination. The quality parameters serve to specify DIC systems, and to compare different systems. They are equally suitable a) for acceptance tests as well as b) for reverification of DIC systems within the framework of a quality management system. The acceptance test is used to determine whether the DIC system complies with the quality parameter limits specified by the manufacturer, or with contractually agreed limits by the manufacturer and user, respectively. For this test the quality parameters zero-displacement error, zero-strain error, and displacement error are defined and used. Zero-displacement error and zero-strain error describe minimum measurement uncertainties of the DIC system a user has to reckon with. They are influenced by different uncertainty contributions. The quality parameter displacement error is used to check the ability of the DIC system to determine absolute displacements within the measurement volume and to confirm the traceability of this measurement to the SI system. Reverification of DIC systems serves to ensure long-term compliance with specified limits for the quality parameters. By comparing the results of successive reverification measurements of the quality parameters used for the acceptance test, it is possible to analyze trends with respect to changes in DIC system characteristics. T2 - Annual International DIC Society Conference 2017 CY - Barcelona, Spain DA - 06.11.2017 KW - Digital image correlation KW - Standardization PY - 2017 AN - OPUS4-43373 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Daum, Werner T1 - Wireless technologies for structural health monitoring and transportation monitoring of dangerous goods T2 - IAEA Consultancy Meeting on Application of Wireless Technologies in Nuclear Power Plant Instrumentation and Control Systems CY - Vienna, Austria DA - 2014-04-08 PY - 2014 AN - OPUS4-30657 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Daum, Werner T1 - Die Entwicklung der internationalen Normung auf dem Gebiet der faseroptischen Sensorik T2 - Sensorikzentrum Mittelsachsen e.V.-Workshop "Faseroptische Sensortechnik" - Anwendungsfelder und Entwicklungstrends CY - Mittweida, Germany DA - 2014-08-28 PY - 2014 AN - OPUS4-31410 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Daum, Werner T1 - Karriere in der Forschung T2 - VDI-Kongress der Studenten und Jungingenieure CY - Berlin, Germany DA - 2014-06-13 PY - 2014 AN - OPUS4-30834 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Daum, Werner T1 - New self diagnostic fiber optical sensor technique for structural health monitoring T2 - 32nd Danubia-Adria Symposium on Advances in Experimental Mechanics CY - Stary Smokovec, Slovakia DA - 2015-09-22 PY - 2015 AN - OPUS4-34371 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Daum, Werner T1 - Sensorik und Messtechnik für die Zustandsüberwachung T2 - GESA Expertenforum 2007. Experimentelle Strukturanalyse für die Zustandsüberwachung CY - Nuremberg, Germany DA - 2007-05-22 PY - 2007 AN - OPUS4-23268 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Daum, Werner T1 - Aktuelle Entwicklungen und Verfahren zur Abschätzung der Ergebnisunsicherheit im Prüfwesen T2 - 2. VDI/VDE-GMA-Fachtagung "Messunsicherheit praxisgerecht bestimmen" CY - Oberhof, Germany DA - 2004-11-30 PY - 2004 AN - OPUS4-5806 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Daum, Werner T1 - Chemiluminescence investigation of high temperature and humidity again of PMAA based polymer optical fibres (POF) T2 - The 12th International Conference on polymer Optical Fibres CY - Seattle, WA, USA DA - 2003-09-14 PY - 2003 AN - OPUS4-5103 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Daum, Werner T1 - Optical fibers for adverse environment T2 - Technowatch 2003 CY - Brussels, Belgium DA - 2003-10-29 PY - 2003 AN - OPUS4-5139 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Daum, Werner T1 - Einflussfaktoren auf die Zuverlässigkeit von Glasfasern und POF T2 - 15. Fachgruppentreffen der ITG-Fachgruppe 5.4.1 "Optische Polymerfasern" CY - Offenburg, Germany DA - 2003-03-25 PY - 2003 AN - OPUS4-5107 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -