TY - JOUR A1 - Matschat, Ralf A1 - Czerwensky, Michael A1 - Kuxenko, Sandra A1 - Heinrich, Hans-Joachim T1 - Certification of high purity metals as primary reference materials - a challenge for multielement trace analysis N2 - The Bundesanstalt für Materialforschung und -prüfung (Federal Institute for Materials Research and Testing) (BAM) is establishing a system of primary reference materials to meet the demands for metrological traceability and to act as national standards in the field of elemental analysis. For all elements of the periodic table - except those that are gases or radioactive - two different kinds of reference materials are being certified. One is for analyte calibration (Type A) and one for problems concerning matrix matching (Type B). These substances are of very high purity and of defined stoichiometry. As far as possible, pure elements and metals rather than pure compounds are used. The certification of both types of material requires most elements of the periodic table to be certified at very low levels using trace element analysis methods. The application of these methods is described and examples of the certification of copper and iron are given. KW - Elementspurenanalytik KW - Primäre Referenzmaterialien PY - 2002 DO - https://doi.org/10.1002/1521-396X(200201)189:1%3C107::AID-PSSA107%3E3.0.CO;2-1 SN - 1862-6300 SN - 0031-8965 N1 - Geburtsname von Kuxenko, Sandra: Pattberg, S. - Birth name of Kuxenko, Sandra: Pattberg, S. VL - 189 IS - 1 SP - 107 EP - 122 PB - Wiley-VCH CY - Berlin AN - OPUS4-837 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Czerwensky, Michael A1 - Birkholz, M. A1 - Kanschat, P. A1 - Weiss, Thomas A1 - Lips, K. T1 - Low-temperature electron-paramagnetic-resonance study of extrinsic and intrinsic defects in CuGaSe2 KW - Electron-paramagnetic resonance KW - EPR PY - 1999 SN - 1098-0121 SN - 0163-1829 SN - 0556-2805 SN - 1095-3795 SN - 1550-235X VL - 59 IS - 19 SP - 12268 EP - 12271 PB - American Institute of Physics CY - Melville, NY AN - OPUS4-785 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Czerwensky, Michael T1 - Spurenanalyse von Reinstmetallen mit dem Sektorfeld ICP-MS für den Aufbau des primären Kalibriersystems der BAM T2 - 6. Symposium Massenspektrometrische Verfahren der Elementspurenanalyse / 18. ICP-MS Anwendertreffen CY - Berlin, Germany DA - 2003-10-06 PY - 2003 AN - OPUS4-3700 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Matschat, Ralf A1 - Kipphardt, Heinrich A1 - Czerwensky, Michael A1 - Richter, Silke A1 - Heinrich, Hans-Joachim ED - Abiko, K. ED - Takaki, S. T1 - The System of Primary Pure Metals Established at BAM - Recent Developments T2 - 9th international conference on ultrahigh-purity base metals CY - Sendai, Japan DA - 2002-10-14 PY - 2002 SP - 119 CY - Sendai AN - OPUS4-1601 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -