TY - JOUR A1 - Cappella, Brunero A1 - Stark, Wolfgang T1 - Adhesion of amorphous polymers as a function of temperature probed with AFM force-distance curves N2 - Force–displacement curves have been obtained with a commercial atomic force microscope at different temperatures and probe rates on a thick film of poly(n-butyl methacrylate) and on two films of polystyrene with different molecular weight. In a previous publication [B. Cappella, S.K. Kaliappan, H. Sturm, Macromolecules 38 (2005)1874] the analysis of force–displacement curves has been focused on the stiffness and on the Young's modulus of the samples. In the present publication we consider the temperature dependence of the work of adhesion. We have obtained master curves of the work of adhesion at fixed maximum loads and, by comparing the results of the two analysis, we show that the work of adhesion follows the Williams–Landel–Ferry equation with the same coefficients previously found for the Young's modulus. Furthermore, we show that the temperature dependence of the work of adhesion of the polymers is a consequence of the temperature dependence of the tip–sample contact area and in the end of the temperature dependence of the stiffness and of the elastic–plastic properties of the samples. KW - Atomic force microscope KW - Force-distance curves KW - Indentation KW - Elastic-plastic properties KW - Adhesion KW - Time-temperature superposition principle KW - Glass transition temperature PY - 2005 DO - https://doi.org/10.1016/j.jcis.2005.09.043 SN - 0021-9797 SN - 1095-7103 SP - 1 EP - 8(?) PB - Elsevier CY - Orlando, Fla. AN - OPUS4-11187 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Cappella, Brunero A1 - Sturm, Heinz A1 - Schulz, Eckhard T1 - Stiffness and adhesion characterization of nanolithographed poly(methyl methacrylate) by means of force-displacement curves N2 - Poly(methyl methacrylate) (PMMA) surfaces have been modified by dynamic plowing lithography. The resulting modified structures, presenting regions of different densities and stiffnesses, have been studied by force–displacement curves. The elasto-plastic response, the stiffness, and the adhesion of the modified samples have been characterized. Force–displacement curves are able to distinguish between unmodified PMMA and two different structures resulting from the lithography, i.e. compressed PMMA and low density PMMA. In particular, the low density regions are made up of cluster-like globular particles, whose elasto-plastic response and adhesion are measured and whose contribution to the total elasto-plastic response and to the adhesion has been studied in detail. KW - AFM KW - Lithography KW - Force-displacement curves KW - Stiffness KW - Adhesion KW - Elasto-plastic response PY - 2002 DO - https://doi.org/10.1163/156856102760136472 SN - 0169-4243 SN - 1568-5616 VL - 16 IS - 7 SP - 921 EP - 933 PB - VNU Science Press CY - Utrecht AN - OPUS4-1609 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Silbernagl, Dorothee A1 - Sturm, Heinz A1 - Cappella, Brunero T1 - Influence of film-substrate adhesion on the mechanical properties of thin polymer films KW - Adhesion KW - AFM KW - Thin film KW - Mechanical properties KW - Force-distance curves PY - 2009 DO - https://doi.org/10.1021/la8041007 SN - 0743-7463 SN - 1520-5827 VL - 25 IS - 9 SP - 5091 EP - 5097 PB - American Chemical Society CY - Washington, DC AN - OPUS4-19363 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -