TY - JOUR A1 - Cappella, Brunero T1 - Force-distance curves on lubricant films: An approach to the characterization of the shape of the AFM tip N2 - Force-distance curves have been acquired with an atomic force microscope on perfluorpolyether films. It is shown that curves acquired on films of different thickness, at different rates and with different dwell times can be overlapped by rescaling the time or distance axis.When the time or distance axis is rescaled,the force depends only on the surface tension of perfluorpolyether and on geometrical properties of thetip (aperture and perimeter of the tip at a given distance from the apex). Hence, curves acquired with thesame tip overlap. By comparing curves acquired at different rates the dynamics of tip-wetting can be investigated. Fur-thermore, rescaled force-distance curves have been matched with the perimeter of cross sections ofthe tip, i.e. with the perimeter of the three-phase contact line. Such measurements pave the way for anon-destructive investigation of the tip shape. KW - Lubricant films KW - Surface tension KW - Atomic force microscopy KW - Force-distance curves KW - AFM tip shape PY - 2017 U6 - https://doi.org/10.1016/j.micron.2016.11.006 SN - 0968-4328 VL - 93 SP - 20 EP - 28 AN - OPUS4-38391 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Cappella, Brunero A1 - Stark, Wolfgang T1 - Adhesion of amorphous polymers as a function of temperature probed with AFM force-distance curves N2 - Force–displacement curves have been obtained with a commercial atomic force microscope at different temperatures and probe rates on a thick film of poly(n-butyl methacrylate) and on two films of polystyrene with different molecular weight. In a previous publication [B. Cappella, S.K. Kaliappan, H. Sturm, Macromolecules 38 (2005)1874] the analysis of force–displacement curves has been focused on the stiffness and on the Young's modulus of the samples. In the present publication we consider the temperature dependence of the work of adhesion. We have obtained master curves of the work of adhesion at fixed maximum loads and, by comparing the results of the two analysis, we show that the work of adhesion follows the Williams–Landel–Ferry equation with the same coefficients previously found for the Young's modulus. Furthermore, we show that the temperature dependence of the work of adhesion of the polymers is a consequence of the temperature dependence of the tip–sample contact area and in the end of the temperature dependence of the stiffness and of the elastic–plastic properties of the samples. KW - Atomic force microscope KW - Force-distance curves KW - Indentation KW - Elastic-plastic properties KW - Adhesion KW - Time-temperature superposition principle KW - Glass transition temperature PY - 2005 U6 - https://doi.org/10.1016/j.jcis.2005.09.043 SN - 0021-9797 SN - 1095-7103 SP - 1 EP - 8(?) PB - Elsevier CY - Orlando, Fla. AN - OPUS4-11187 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Fahrbach, M. A1 - Friedrich, Sebastian A1 - Behle, H. A1 - Xu, Min A1 - Cappella, Brunero A1 - Brand, U. A1 - Peiner, E. T1 - Customized piezoresistive microprobes for combined imaging of topography and mechanical properties N2 - Customized piezoresistive cantilever microprobes with a deflection range of 120 μm and silicon tips of 100 μm height were operated in a Cypher AFM showing their functionality for measuring topography together with stiffness, adhesion, and viscoelastic properties of thin films. KW - Cantilever microprobe KW - Piezoresistive KW - Atomic force microscopy KW - Force-distance curves KW - Contact resonance KW - Lubricants PY - 2021 U6 - http://nbn-resolving.de/urn/resolver.pl?urn:nbn:de:kobv:b43-524225 VL - 15 SP - 100042 PB - Elsevier Ltd. AN - OPUS4-52422 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Friedrich, Sebastian A1 - Cappella, Brunero T1 - Study of micro- and nanoscale wetting properties of lubricants using AFM force-distance curves N2 - Atomic force microscopy (AFM) plays an important role as a multifuntional tool in nanotribology.In the present work it was shown that the main features of force-distance curves on different lubricants have been characterized and the underlying phenomena could be explained. KW - Lubricants KW - Atomic force microscopy KW - Force-distance curves PY - 2020 U6 - http://nbn-resolving.de/urn/resolver.pl?urn:nbn:de:kobv:b43-504631 SN - 1573-2711 VL - 68 IS - 1 SP - 1 EP - 12 PB - Springer CY - Cham AN - OPUS4-50463 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Krämer, Günther A1 - Griepentrog, Michael A1 - Bonaccurso, E. A1 - Cappella, Brunero T1 - Study of morphology and mechanical properties of polystyrene-polybutadiene blends with nanometre resolution using AFM and force-distance curves N2 - Thin polybutadiene/polystyrene blend films were deposited on glass substrates by spin-coating. The two polymers were chosen, as they are immiscible and differ strongly in their mechanical properties. The blend was characterized with Tapping Mode and force–distance curves. Several advantages of force–distance curves measurements compared to Tapping Mode are shown, most of all the capability of yielding quantitative information about several properties, such as Young's modulus and adhesion. Also the aging behaviour of the blend exposed to air could be observed, in particular the increase of the Young's modulus due to cross-linking and dewetting processes. Additionally, the sample was used to improve the resolution of force–distance curves up to 6 nm, which is to date the best resolution achieved with force–distance curves. Such an improvement resolves the major disadvantage of force–distance curves, compared to other scanning mode, i.e. its inferior resolution. KW - Polymer blends KW - Mechanical properties KW - Atomic force microscopy KW - Force-distance curves KW - High-resolution force-volume PY - 2014 U6 - https://doi.org/10.1016/j.eurpolymj.2014.03.026 SN - 0014-3057 SN - 1873-1945 VL - 55 SP - 123 EP - 134 PB - Elsevier CY - Oxford AN - OPUS4-30625 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Silbernagl, Dorothee A1 - Cappella, Brunero T1 - Reconstruction of a hidden topography by single AFM force-distance curves N2 - Force–distance curves have been acquired with an Atomic Force Microscope on polymethyl methacrylate with embedded glass spheres. The glass spheres provide a stiff substrate with an irregular and complex topography hidden underneath a compliant and even polymer film. This situation is a special case of a mechanical double-layer, which we examined in detail in previous experiments. Up to now uniform and non-uniform polymer films on an even substrate were examined. The film thickness on each point of the sample surface was known and force–distance curves could be averaged in groups according to the film thickness. In this way we were able to develop a semi empirical approach which allows describing the shape of averaged force–distance curves depending on the Young’s moduli of the involved materials and on the film thickness. In this experiment we reconstruct a hidden topography, i.e., we determine the polymer thickness on each point of the sample by analyzing single force–distance curves with our semi empirical equation. The accuracy reached by this approach permits to obtain a reconstruction of the shape and position of the embedded particles limited by a maximum detection depth. Single curves are also analyzed qualitatively in order to locate areas where the adhesion at the polymer/glass interface is weak or the two phases are detached. KW - Atomic Force Microscopy KW - Force-distance curves KW - Composite materials KW - Mechanical properties KW - Interfaces PY - 2009 U6 - https://doi.org/10.1016/j.susc.2009.04.029 SN - 0039-6028 VL - 603 IS - 16 SP - 2363 EP - 2369 PB - Elsevier CY - Amsterdam AN - OPUS4-22682 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Silbernagl, Dorothee A1 - Sturm, Heinz A1 - Cappella, Brunero T1 - Influence of film-substrate adhesion on the mechanical properties of thin polymer films KW - Adhesion KW - AFM KW - Thin film KW - Mechanical properties KW - Force-distance curves PY - 2009 U6 - https://doi.org/10.1021/la8041007 SN - 0743-7463 SN - 1520-5827 VL - 25 IS - 9 SP - 5091 EP - 5097 PB - American Chemical Society CY - Washington, DC AN - OPUS4-19363 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -