TY - JOUR A1 - Cappella, Brunero A1 - Geuss, Markus A1 - Sturm, Heinz A1 - Heyde, M. A1 - Rademann, K. A1 - Spangenberg, T. A1 - Niehus, H. T1 - Dynamic plowing nanolithography on polymethylmethacrylate using an atomic force microscope N2 - We present dynamic plowing nanolithography on polymethylmethacrylate films, performed with a scan-linearized atomic force microscope able to scan up to 250 μm with high resolution. Modifications of the surface are obtained by plastically indenting the film surface with a vibrating tip. By changing the oscillation amplitude of the cantilever, i.e., the indentation depth, surfaces can be either imaged or modified. A program devoted to the control of the scanning process is also presented. The software basically converts the gray scale of pixel images into voltages used to control the dither piezo driving cantilever oscillations. The advantages of our experimental setup and the dependence of lithography efficiency on scanning parameters are discussed. Some insights into the process of surface modifications are presented. KW - Nanolithography PY - 2001 UR - http://rsi.aip.org/ U6 - https://doi.org/10.1063/1.1326053 SN - 0034-6748 SN - 1089-7623 VL - 72 SP - 136 EP - 141 PB - American Institute of Physics CY - Melville, NY AN - OPUS4-874 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Sturm, Heinz A1 - Cappella, Brunero A1 - Heyde, M. A1 - Ritter, C. A1 - Rademann, K. T1 - Dislocation of antimony clusters on graphite by means of dynamic plowing nanolithography N2 - Antimony clusters of different shapes and dimensions have been obtained by evaporating antimony on graphite. The dependence of the shape and dimensions of the particles on the evaporation parameters (effective layer thickness, temperature, pressure) is discussed. A characterisation of the different structures is presented. In particular, the decoration of graphite steps is discussed. Clusters have been dislocated by means of dynamic plowing nanolithography, both in vector and in image pattern mode. The dependence of the energy needed to dislocate a cluster on its dimensions and position is discussed. KW - Antimony clusters KW - Nanolithography PY - 2001 U6 - https://doi.org/10.1016/S0039-6028(00)01113-4 SN - 0039-6028 VL - 476 IS - 1-2 SP - 54 EP - 62 PB - Elsevier CY - Amsterdam AN - OPUS4-875 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Munz, Martin A1 - Cappella, Brunero A1 - Sturm, Heinz A1 - Geuss, Markus A1 - Schulz, Eckhard T1 - Materials contrasts and nanolithography techniques in scanning force microscopy (SFM) and their application to polymers and polymer composites N2 - Beyond measuring the topography of surfaces, scanning force microscopy (SFM) has proved to be valuable both for mapping of various materials properties and for modifying surfaces via lithography techniques. Thus, SFM has gained relevance as a surface analysis technique as well as a tool for nanoscale engineering purposes. Different kinds of tip-sample interactions are exploitable, e.g. mechanical, thermal and electrical ones. Owing to its versatility, SFM has found plenty of applications in polymer science. Among others, the examples reported on in this review article encompass issues related to commodity polymers, various polymer-based composites, polymer blends, or ferroelectric polymers. For instance, stiffness imaging is elucidated as a technique for detecting interphases occurring in composites with inorganic fillers. The described applications are mainly related to mechanical and electrical tip-sample interactions. The respective fundamentals are outlined as well as some aspects of the measurement of materials contrasts. The presented techniques of nano-scale modification are a dynamical sort of plowing lithography and electrical poling, both performed by means of SFM-probes. KW - Local electrical-properties KW - Probing micromechanical properties KW - Spreading resistance microscopy KW - Modulated friction techniques KW - Nanometer-scale modification KW - Ferroelectric domain-walls KW - Interfacial shear-strength KW - Self-assembled monolayers KW - Maxwell-stress microscopy KW - Solid-liquid interfaces KW - Contact mechanics KW - Electrical properties KW - Interface/interphase KW - Nanolithography KW - Polymer-matrix composites (PMC) scanning/atomic force KW - Microscopy (SFM/AFM) thermal diffusivity PY - 2003 SN - 3-540-00530-7 U6 - https://doi.org/10.1007/b11055 SN - 0065-3195 SN - 1436-5030 N1 - Serientitel: Advances in polymer science – Series title: Advances in polymer science IS - 164 SP - 87 EP - 210 PB - Springer CY - Berlin AN - OPUS4-2892 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Cappella, Brunero T1 - Dynamic Plowing Lithography T2 - Seminar am MPI für Polymerforschung CY - Mainz, Germany DA - 2003-05-12 PY - 2003 AN - OPUS4-2919 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Cappella, Brunero A1 - Sturm, Heinz T1 - Comparison between dynamic plowing lithography and nanoindentation methods N2 - Two different methods of nanolithography, namely dynamic plowing lithography (DPL) and indentation by means of force-displacement curves (FDI), have been compared by performing them on two different polymers, poly (methylmethacrylate) and polystyrene. No fundamental differences can be found out in the efficiency of the two methods, i.e., in the depth of the lithographed structure as a function of the scanning parameters. The main drawback of FDI is that it is much more time consuming than DPL. On the other hand, when the sample is lithographed with DPL, the border walls that surround the lithographed structure are very much bigger than the border walls created through FDI. The physicochemical properties of the border walls created through DPL have been investigated. Several experimental data reveal that such border walls are very much softer and looser than unmodified polymers and suggest that during DPL the fast oscillating tip is able to break polymer chains. This does not happen with FDI, where border walls are simply made up of the material carved out by the tip. A method to eliminate these undesirable border walls is suggested. PY - 2002 U6 - https://doi.org/10.1063/1.1421632 SN - 0021-8979 SN - 1089-7550 VL - 91 IS - 1 SP - 506 EP - 512 PB - American Institute of Physics CY - Melville, NY AN - OPUS4-1632 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Cappella, Brunero A1 - Sturm, Heinz T1 - Dynamic Plowing Lithography of Single Holes on Polymethylmethacrylate Using an Atomic Force Microscope N2 - Dynamic Plowing Lithography is employed to carve holes in a PMMA surface by indenting the sample during Tapping Mode imaging. The dependence of the dimensions of the holes on the tip shape, on the modulation voltage amplitude, and on the number of contacts between the tip and sample is studied. The results give some insights in the physico-chemical mechanisms accompanying such rapid modifications. Two-dimensional arrays of holes have also been carved, in order to study the result of the superposition of single holes. PY - 2001 SN - 0044-376x VL - 10 Suppl. 1 SP - 8 EP - 15 PB - Hirzel CY - Stuttgart, Germany AN - OPUS4-1633 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Cappella, Brunero A1 - Sturm, Heinz A1 - Weidner, Steffen T1 - Breaking polymer chains by dynamic plowing lithography N2 - The adhesion of poly(methyl methacrylate) (PMMA) and polystyrene (PS) films, whose surface has been previously structured by dynamic plowing lithography (DPL), has been measured by means of force–displacement curves. The different adhesion of modified and unmodified PS leads to the assumption that polymer chains are broken during DPL. After measuring the energy dissipated by the tip during DPL, in order to check that the transferred energy is sufficient to break covalent bonds, the polymer chain scission caused by the lithographic process has been definitely confirmed by size exclusion chromatography measurements of the lithographed films. KW - AFM KW - Nanolithography KW - Chain scission PY - 2002 U6 - https://doi.org/10.1016/S0032-3861(02)00285-9 SN - 0032-3861 SN - 1873-2291 VL - 43 IS - 16 SP - 4461 EP - 4466 PB - Springer CY - Berlin AN - OPUS4-1608 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Cappella, Brunero A1 - Sturm, Heinz A1 - Schulz, Eckhard T1 - Stiffness and adhesion characterization of nanolithographed poly(methyl methacrylate) by means of force-displacement curves N2 - Poly(methyl methacrylate) (PMMA) surfaces have been modified by dynamic plowing lithography. The resulting modified structures, presenting regions of different densities and stiffnesses, have been studied by force–displacement curves. The elasto-plastic response, the stiffness, and the adhesion of the modified samples have been characterized. Force–displacement curves are able to distinguish between unmodified PMMA and two different structures resulting from the lithography, i.e. compressed PMMA and low density PMMA. In particular, the low density regions are made up of cluster-like globular particles, whose elasto-plastic response and adhesion are measured and whose contribution to the total elasto-plastic response and to the adhesion has been studied in detail. KW - AFM KW - Lithography KW - Force-displacement curves KW - Stiffness KW - Adhesion KW - Elasto-plastic response PY - 2002 U6 - https://doi.org/10.1163/156856102760136472 SN - 0169-4243 SN - 1568-5616 VL - 16 IS - 7 SP - 921 EP - 933 PB - VNU Science Press CY - Utrecht AN - OPUS4-1609 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Cappella, Brunero A1 - Sturm, Heinz T1 - Lithography of Polymer Surfaces using SPM T2 - Frühjahrstagung DPG CY - Regensburg, Germany DA - 2002-03-13 PY - 2002 AN - OPUS4-6529 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Cappella, Brunero A1 - Sturm, Heinz T1 - Stiffness and Adhesion Characterisation of Nanolithographed PMMA T2 - Frühjahrstagung DPG CY - Regensburg, Germany DA - 2002-03-13 PY - 2002 AN - OPUS4-6530 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Cappella, Brunero A1 - Sturm, Heinz A1 - Schulz, Eckhard T1 - Nanolithography on Polymers using the AFM T2 - Dreiländertagung für Elektronenmikroskopie CY - Innsbruck, Austria DA - 2001-11-09 PY - 2001 AN - OPUS4-6516 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Cappella, Brunero A1 - Sturm, Heinz T1 - Lithography of Polymer Surfaces using Scanning Probe Microscopy T2 - The 2nd International Conference on Scanning Probe Microscopy of Polymers CY - Weingarten, Germany DA - 2001-07-21 PY - 2001 AN - OPUS4-6517 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Cappella, Brunero T1 - DPL auf Polymeroberflächen T2 - Humboldt Universität Berlin CY - Berlin, Germany DA - 2002-11-11 PY - 2002 AN - OPUS4-7437 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Cappella, Brunero T1 - Dynamic Plowing Lithography - Punkt und Linie zu Fläche T2 - - CY - Munich, Germany DA - 2001-07-18 PY - 2001 AN - OPUS4-7854 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Butt, H.-J. A1 - Cappella, Brunero A1 - Kappl, M. T1 - Force measurements with the atomic force microscope - Technique, interpretation and applications N2 - The atomic force microscope (AFM) is not only a tool to image the topography of solid surfaces at high resolution. It can also be used to measure force-versus-distance curves. Such curves, briefly called force curves, provide valuable information on local material properties such as elasticity, hardness, Hamaker constant, adhesion and surface charge densities. For this reason the measurement of force curves has become essential in different fields of research such as surface science, materials engineering, and biology. Another application is the analysis of surface forces per se. Some of the most fundamental questions in colloid and surface science can be addressed directly with the AFM: What are the interactions between particles in a liquid? How can a dispersion be stabilized? How do surfaces in general and particles in particular adhere to each other? Particles and surfaces interactions have major implications for friction and lubrication. Force measurements on single molecules involving the rupture of single chemical bonds and the stretching of polymer chains have almost become routine. The structure and properties of confined liquids can be addressed since force measurements provide information on the energy of a confined liquid film. After the review of Cappella [B. Cappella, G. Dietler, Surf. Sci. Rep. 34 (1999) 1–104] 6 years of intense development have occurred. In 1999, the AFM was used only by experts to do force measurements. Now, force curves are used by many AFM researchers to characterize materials and single molecules. The technique and our understanding of surface forces has reached a new level of maturity. In this review we describe the technique of AFM force measurements. Important experimental issues such as the determination of the spring constant and of the tip radius are discussed. Current state of the art in analyzing force curves obtained under different conditions is presented. Possibilities, perspectives but also open questions and limitations are discussed. KW - AFM KW - Force curves KW - Surface forces KW - Atomic force microscope PY - 2005 U6 - https://doi.org/10.1016/j.surfrep.2005.08.003 SN - 0167-5729 VL - 59 IS - 1-6 SP - 1 EP - 152 PB - North-Holland CY - Amsterdam AN - OPUS4-11181 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Cappella, Brunero A1 - Stark, Wolfgang T1 - Adhesion of amorphous polymers as a function of temperature probed with AFM force-distance curves N2 - Force–displacement curves have been obtained with a commercial atomic force microscope at different temperatures and probe rates on a thick film of poly(n-butyl methacrylate) and on two films of polystyrene with different molecular weight. In a previous publication [B. Cappella, S.K. Kaliappan, H. Sturm, Macromolecules 38 (2005)1874] the analysis of force–displacement curves has been focused on the stiffness and on the Young's modulus of the samples. In the present publication we consider the temperature dependence of the work of adhesion. We have obtained master curves of the work of adhesion at fixed maximum loads and, by comparing the results of the two analysis, we show that the work of adhesion follows the Williams–Landel–Ferry equation with the same coefficients previously found for the Young's modulus. Furthermore, we show that the temperature dependence of the work of adhesion of the polymers is a consequence of the temperature dependence of the tip–sample contact area and in the end of the temperature dependence of the stiffness and of the elastic–plastic properties of the samples. KW - Atomic force microscope KW - Force-distance curves KW - Indentation KW - Elastic-plastic properties KW - Adhesion KW - Time-temperature superposition principle KW - Glass transition temperature PY - 2005 U6 - https://doi.org/10.1016/j.jcis.2005.09.043 SN - 0021-9797 SN - 1095-7103 SP - 1 EP - 8(?) PB - Elsevier CY - Orlando, Fla. AN - OPUS4-11187 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Cappella, Brunero A1 - Kaliappan, Senthil Kumar A1 - Sturm, Heinz T1 - Using AFM Force-Distance Curves To Study the Glass-to-Rubber Transition of Amorphous Polymers and Their Elastic-Plastic Properties as a Function of Temperature N2 - Force-displacement curves have been obtained with a commercial atomic force microscope (AFM) at different temperatures and probe rates on a thick film of poly(n-butyl methacrylate) (PnBMA). The analysis of the force-displacement curves has been focused on the contact portion of the curves, giving information about the stiffness of the sample and its Young's modulus. A novel model of sample deformations that extends the basic equations of the elastic continuum contact theories to the plastic deformations is presented. This model gives several insights into the processes of deformation of soft samples and permits to calculate not only the parameters of the Williams-Landel-Ferry equation but also the Young's modulus and the yielding force of the polymer as a function of temperature and/or probe rate. These quantities have been measured in a wide range of temperatures (70 K) and probe rates (6 decades) for the first time with the AFM, and the results are in very good agreement with measurements performed with customary techniques, such as broadband spectroscopy and dynamic mechanical analysis. KW - AFM KW - Polymers KW - Glas transition temperature PY - 2005 U6 - https://doi.org/10.1021/ma040135f SN - 0024-9297 SN - 1520-5835 VL - 38 SP - 1874 EP - 1881 PB - American Chemical Society CY - Washington, DC AN - OPUS4-7274 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Cappella, Brunero T1 - Atomic force microscope as a tool for the modification and analysis of surfaces KW - AFM KW - Lithography KW - Surface forces PY - 2004 VL - 1 SP - 1 EP - 30 PB - Transworld Research Network CY - Trivandrum AN - OPUS4-4745 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Cappella, Brunero A1 - Silbernagl, Dorothee T1 - Nanomechanica lProperties of Mechanical Double-Layers: A Novel Semiempirical Analysis N2 - Force-displacement curves have been acquired with a commercial atomic force microscope on a thin film of poly(n-butyl methacrylate) on glass substrates. The film thickness is nonuniform, ranging in the measured area from 0 to 30 nm, and gives the possibility to survey the so-called "mechanical double-layer" topic, i.e., the influence of the substrate on the mechanical properties of the film in dependence of the film thickness. The stiffness and the deformation for each force-distance curve were determined and related to the film thickness. We were able to estimate the resolution of the film thickness that can be achieved by means of force-distance curves. By exploiting the data acquired in the present and in a previous experiment, a novel semiempirical approach to describe the mechanical properties of a mechanical double-layer is introduced. The mathematical model, with which deformation-force curves can be described, permits to calculate the Young's moduli of film and substrate in agreement with literature values and to determine the film thickness in agreement with the topography. PY - 2007 U6 - https://doi.org/10.1021/la701234q SN - 0743-7463 SN - 1520-5827 VL - 23 IS - 21 SP - 10779 EP - 10787 PB - American Chemical Society CY - Washington, DC AN - OPUS4-17808 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Cappella, Brunero A1 - Silbernagl, Dorothee T1 - Nanomechanical properties of polymer thin films measured by force-distance curves N2 - Force–displacement curves have been acquired with a commercial atomic force microscope on thin films of poly(n-butyl methacrylate) on glass substrates. Different film thicknesses, from 10 up to 430 nm, were chosen to examine in detail the so called “mechanical double-layer” topic, i.e., the influence of the substrate on the determination of the mechanical properties of thin films. Taking advantage of the Hertz theory we calculated for all films the contact radius between tip and sample as a function of the applied load. Further Young's modulus of the samples was derived from the experimental data as a function of the applied load and, alternatively, of the deformation. The results of this analysis for 10 different film thicknesses were fitted with several half empirical equations proposed by several researchers. The focus of this work is to evaluate such existing half empirical theories for mechanical double-layers and to show the need for an alternative consistent approach. KW - Atomic force microscopy KW - Polymer thin films KW - Indentation KW - Young´s modulus PY - 2008 U6 - https://doi.org/10.1016/j.tsf.2007.09.042 SN - 0040-6090 VL - 516 IS - 8 SP - 1952 EP - 1960 PB - Elsevier CY - Amsterdam AN - OPUS4-17809 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Cappella, Brunero T1 - Dynamic Plowing Lithography - Punkt und Linie zu Fläche T2 - - CY - Ulm, Germany DA - 2001-07-16 PY - 2001 AN - OPUS4-7499 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Cappella, Brunero T1 - Dynamic Plowing Lithography T2 - Workshop "Restersondenmikroskopie in Forschung und Industrie" CY - Berlin, Germany DA - 2001-03-08 PY - 2001 AN - OPUS4-7500 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Cappella, Brunero T1 - Lithography Techniques with AFM T2 - - CY - Pisa, Italy DA - 2001-07-23 PY - 2001 AN - OPUS4-7501 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Cappella, Brunero T1 - Lithography of Polymer Surfaces T2 - Fachbereich Chemie der Universität Siegen CY - Siegen, Germany DA - 2003-12-01 PY - 2003 AN - OPUS4-4082 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hartelt, Manfred A1 - Cappella, Brunero A1 - Wäsche, Rolf T1 - Verschleißbestimmung im nm-Bereich N2 - Die Verschleißbeträge können im nm-Bereich quantifiziert werden durch die Berechnung eines Mittelwert-Profils. Grundlage dieser Berechnung ist die hochauflösende Erfassung der 3D-Topographiedaten, die tribologisch beanspruchte und nichtbeanspruchte Oberflächenbereiche gleichermaßen beinhalten. Ein bestimmtes Messverfahren (taktil oder optisch) wird nicht favorisiert. Die vertikale Auflösung des Messverfahrens sollte im nm-Bereich liegen.--------------------------------------------------------------------------------------------------------------------------------------------------------------------- The wear rates can be quantified in the nm range by calculating a mean profile. Based on this calculation is the high-resolution recording of the 3D topography data containing tribologically worn and unworn surface areas alike. A specific measurement method (tactile or visual) is not favored. The vertical resolution of the measurement process should be in the nm range. T2 - 54. Tribologie-Fachtagung - Reibung, Schmierung und Verschleiß - Forschung und praktische Anwendungen CY - Göttingen, Germany DA - 2013-09-30 PY - 2013 SN - 978-3-00-022603-8 VL - I SP - 31/1 EP - 31/10 AN - OPUS4-29640 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Reichelt, Manuel A1 - Cappella, Brunero T1 - Atomic force microscope study of friction at the submicron-scale during tribotests with self-mated steel N2 - Friction at the microscale during reciprocal sliding tribotests was studied for the first time with self-mated steel (100Cr6/AISI 52100) taking advantage of an atomic force microscope (AFM). To this aim, microsized steel particles were glued to the AFM-cantilever and employed as colloidal tips to perform tribotests on a steel disc. The torsion of the cantilever, which correlates with the friction force, was measured during the tests. Few tests with the same load did not yield any wear and show that the load and adhesion contributions to friction stay constant when the shape of the test particle does not change. Most of the presented tribotests engendered wear. For those tests, the increase of friction during the tribotests was attributed to the emerging plowing contribution. Furthermore, analysis of both torsion and local slope gives information on the creation of wear particles and their influence on friction. KW - Friction KW - Microtribology KW - Sliding KW - Wear PY - 2022 U6 - https://doi.org/10.1115/1.4054251 VL - 144 IS - 10 SP - 1 EP - 9 PB - ASME AN - OPUS4-54839 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Friedrich, Sebastian A1 - Cappella, Brunero T1 - Correction to: Study of micro- and nanoscale wetting properties of lubricants using AFM force-distance curves N2 - The article "Study of micro- and nanoscale wetting properties of lubricants using AFM force-distance Curves" was originally published Online First in the journal "Tribology letters" without Open Access. After publication in volume 68, issue 1, the authors decided to opt for Open Choice and to make the article an Open Access publication. Therefore, the copyright of the article has been changed to © The Authors 2021 and the article is forthwith distributed under the terms of the Creative Commons Attribution 4.0 International License. PY - 2021 U6 - http://nbn-resolving.de/urn/resolver.pl?urn:nbn:de:kobv:b43-542710 SN - 1573-2711 VL - 69 SP - 1 PB - Springer CY - Cham AN - OPUS4-54271 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Cappella, Brunero A1 - Reichelt, Manuel T1 - Origin of lognormal distribution of wear coefficient values N2 - Wear test results exhibit often large scattering. Hence, the study of spreading of experimental results requires big datasets. In various studies, wear coefficients were found to have lognormal distributions. Therefore, it was supposed that the wear coefficient is affected by two normally distributed variables, which combine through a product. In the present study, we demonstrate that a lognormal distribution may arise from a nonconstant wear coefficient, too, i.e., when a system does not follow Archard’s law. KW - Wear KW - Archard's law KW - Statistical distributions KW - Spreading PY - 2021 U6 - https://doi.org/10.1016/j.triboint.2021.107207 SN - 0301-679X VL - 164 PB - Elsevier Ltd. AN - OPUS4-53100 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Reichelt, Manuel A1 - Cappella, Brunero T1 - Large scale multi-parameter analysis of wear of self-mated 100Cr6 steel - A study of the validity of Archard's law N2 - Considerable scattering of experimental wear results affects seriously the evaluation of repeatability and reproducibility of tribological measurements and hampers detecting, studying, and verifying tribological laws. An accurate characterization of the statistics of results, the detection of the influence of operating parameters, and the verification of equations describing tribological phenomena can be achieved only through the analysis of large datasets with wide variation of parameters. Taking advantage of more than 400 experiments performed with the same material pairing under the same conditions on four different tribometers, the repeatability and reproducibility of volumetric wear measurements has been evaluated using Welch's test. By testing Archard's law over seven orders of magnitude of sFN, it was found that this law is not universally valid and that, under certain conditions, the wear coefficient depends on sFN itself. KW - Wear KW - Archard's law KW - 100Cr6 steel KW - Scattering PY - 2021 U6 - https://doi.org/10.1016/j.triboint.2021.106945 VL - 159 SP - 6945 PB - Elsevier Ltd. AN - OPUS4-52244 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Reichelt, Manuel A1 - Cappella, Brunero T1 - Micro- and nanowear of self-mated steel generated and studied with an AFM at the single asperity level N2 - We show for the first time tribotests performed with self-mated 100Cr6 steel, taking advantage of an AFM, employed as a tribometer for the tribotests as well as for the inspection of wear of both tribopartners. Emphasis is put on the morphology of the scars, on wear particles, and on wear of the “colloidal” particles glued on the AFM cantilever. Measurements demonstrate the possibility of characterizing single asperity events leading to very small wear. We highlight several phenomena, which are elementary key constituents of tribological processes. Such phenomena, probably occurring also at the macroscale, can be detected, identified, and characterized with high spatial and time resolution only at the nanoscale, thus giving insight into conditions and causes of their emergence. KW - Nanowear KW - Atomic force microscope KW - 100Cr6 (AISI 52100) steel KW - Wear particles KW - Single asperity contact KW - Particle transfer KW - Zero wear PY - 2021 U6 - http://nbn-resolving.de/urn/resolver.pl?urn:nbn:de:kobv:b43-531389 SN - 2297-3079 VL - 7 SP - 1 EP - 16 PB - Frontiers Media CY - Lausanne AN - OPUS4-53138 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Friedrich, Sebastian A1 - Cappella, Brunero T1 - Friction and mechanical properties of AFM-scan-induced ripples in polymer films N2 - In the present paper, friction and mechanical properties of AFM-Scan-Induced ripple structures on films of polystyrene and poly-n-(butyl methacrylate) are investigated. Force volume measurements allow a quantitative analysis of the elastic moduli with nanometer resolution, showing a contrast in mechanical response between bundles and troughs. Additionally, analysis of the lateral cantilever deflection shows a clear correlation between friction and the sample topography. Those results support the theory of crack propagation and the formation of voids as a mechanism responsible for the formation of ripples. This paper also shows the limits of the presented measuring methods for soft, compliant, and small structures. KW - AFM KW - Polymer KW - Ripples KW - Mechanical properties KW - Friction PY - 2021 U6 - http://nbn-resolving.de/urn/resolver.pl?urn:nbn:de:kobv:b43-532772 SN - 2297-3079 VL - 7 SP - 1 EP - 8 PB - Frontiers Media CY - Lausanne AN - OPUS4-53277 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Cappella, Brunero A1 - Spaltmann, Dirk A1 - Gee, M. T1 - Editorial: Tribology and Atomic Force Microscopy - Towards Single Asperity Contact N2 - The concept behind this Research Topic (RT) was to collect works, in which Atomic Force Microscopy (AFM) techniques are employed to study tribological phenomena and to push the resolution of measurements towards single asperity contact. Thanks to the direct determination of sample height with sub-nanometer resolution and the possibility of measuring local friction, AFM can be employed after a tribotest to detect topography and friction changes at the nanometer scale. Recently, efforts are being expended to use AFM cantilevers as tribometers, i.e., as probes altering the volume of suitable samples, thereby measuring tip and/or sample wear and friction at the nano/microscale. Thus, single asperity contact, friction, and wear can be investigated. Since friction and wear at the macroscale are the result of asperities interactions, such experiments are of great importance for better understanding of tribological processes. KW - Nanotribology KW - Friction KW - Wear KW - Single asperity KW - AFM PY - 2022 U6 - http://nbn-resolving.de/urn/resolver.pl?urn:nbn:de:kobv:b43-571037 SN - 2297-3079 VL - 8 SP - 1 EP - 2 PB - Frontiers Media CY - Lausanne AN - OPUS4-57103 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Griepentrog, Michael A1 - Krämer, Günther A1 - Cappella, Brunero T1 - Comparison of nanoindentation and AFM methods for the determination of mechanical properties of polymers N2 - Force-deformation curves have been acquired using nanoindentation and atomic force microscopy on two amorphous polymer samples. The shape and size of the indenter tip was characterized using a white light interferometer and AFM. The measured nanoindentation curves were fitted with the Hertz equation to calculate the Young's modulus of the polymers. Once the Young's moduli of the polymers were known, AFM was used to acquire force-distance-curves on the same samples. We also used the Hertz theory for the analysis in this case. As a result, the tip radius of the AFM cantilever tip could be measured. This procedure is proposed as a method to determine the shape and size of AFM tips for the quantitative characterization of surface forces through force-distance curves. KW - Mechanical properties KW - Polymers KW - AFM KW - Nanoindenter PY - 2013 U6 - https://doi.org/10.1016/j.polymertesting.2013.01.011 SN - 0142-9418 VL - 32 IS - 3 SP - 455 EP - 460 PB - Elsevier Science CY - Amsterdam [u.a.] AN - OPUS4-32073 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Cappella, Brunero T1 - Mechanical properties of homogeneous and microstructured polymer films T2 - Institut für Physikalische und Theoretische Chemie der Universität Siegen CY - Siegen, Germany DA - 2014-06-23 PY - 2014 AN - OPUS4-32026 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Krämer, Günther A1 - Griepentrog, Michael A1 - Bonaccurso, E. A1 - Cappella, Brunero T1 - Study of morphology and mechanical properties of polystyrene-polybutadiene blends with nanometre resolution using AFM and force-distance curves N2 - Thin polybutadiene/polystyrene blend films were deposited on glass substrates by spin-coating. The two polymers were chosen, as they are immiscible and differ strongly in their mechanical properties. The blend was characterized with Tapping Mode and force–distance curves. Several advantages of force–distance curves measurements compared to Tapping Mode are shown, most of all the capability of yielding quantitative information about several properties, such as Young's modulus and adhesion. Also the aging behaviour of the blend exposed to air could be observed, in particular the increase of the Young's modulus due to cross-linking and dewetting processes. Additionally, the sample was used to improve the resolution of force–distance curves up to 6 nm, which is to date the best resolution achieved with force–distance curves. Such an improvement resolves the major disadvantage of force–distance curves, compared to other scanning mode, i.e. its inferior resolution. KW - Polymer blends KW - Mechanical properties KW - Atomic force microscopy KW - Force-distance curves KW - High-resolution force-volume PY - 2014 U6 - https://doi.org/10.1016/j.eurpolymj.2014.03.026 SN - 0014-3057 SN - 1873-1945 VL - 55 SP - 123 EP - 134 PB - Elsevier CY - Oxford AN - OPUS4-30625 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Silbernagl, Dorothee A1 - Sturm, Heinz A1 - Cappella, Brunero T1 - Influence of film-substrate adhesion on the mechanical properties of thin polymer films KW - Adhesion KW - AFM KW - Thin film KW - Mechanical properties KW - Force-distance curves PY - 2009 U6 - https://doi.org/10.1021/la8041007 SN - 0743-7463 SN - 1520-5827 VL - 25 IS - 9 SP - 5091 EP - 5097 PB - American Chemical Society CY - Washington, DC AN - OPUS4-19363 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Silbernagl, Dorothee A1 - Cappella, Brunero T1 - Mechanical properties of thin polymer films on stiff substrates N2 - Force–displacement curves have been acquired with a commercial atomic force microscope on thin films of poly(n-butyl methacrylate) on glass substrates in order to examine the so-called 'mechanical double layer' topic, i.e. the influence of the substrate on the mechanical properties of the film in dependence of the film thickness. The hyperbolic fit, a novel semi-empirical equation introduced in previous articles, has been further corroborated. The interpretation of this equation has been deepened, yielding a quantitative and demonstrative characterization of the mechanical properties of double layers. Provided that the Young's moduli of bulk polymer and substrate are measured from the deformation curves, this mathematical model permits to fit the deformation–force curves on the double layers and to determine the thickness of the polymer films in wide range (0–200 nm). KW - Atomic force microscopy KW - Indentation KW - Rheology KW - Polymers KW - Thin films PY - 2010 U6 - https://doi.org/10.1002/sca.20196 SN - 0161-0457 SN - 1932-8745 VL - 32 IS - 5 SP - 282 EP - 293 PB - Wiley CY - Hoboken, NJ AN - OPUS4-22681 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Silbernagl, Dorothee A1 - Cappella, Brunero T1 - Reconstruction of a hidden topography by single AFM force-distance curves N2 - Force–distance curves have been acquired with an Atomic Force Microscope on polymethyl methacrylate with embedded glass spheres. The glass spheres provide a stiff substrate with an irregular and complex topography hidden underneath a compliant and even polymer film. This situation is a special case of a mechanical double-layer, which we examined in detail in previous experiments. Up to now uniform and non-uniform polymer films on an even substrate were examined. The film thickness on each point of the sample surface was known and force–distance curves could be averaged in groups according to the film thickness. In this way we were able to develop a semi empirical approach which allows describing the shape of averaged force–distance curves depending on the Young’s moduli of the involved materials and on the film thickness. In this experiment we reconstruct a hidden topography, i.e., we determine the polymer thickness on each point of the sample by analyzing single force–distance curves with our semi empirical equation. The accuracy reached by this approach permits to obtain a reconstruction of the shape and position of the embedded particles limited by a maximum detection depth. Single curves are also analyzed qualitatively in order to locate areas where the adhesion at the polymer/glass interface is weak or the two phases are detached. KW - Atomic Force Microscopy KW - Force-distance curves KW - Composite materials KW - Mechanical properties KW - Interfaces PY - 2009 U6 - https://doi.org/10.1016/j.susc.2009.04.029 SN - 0039-6028 VL - 603 IS - 16 SP - 2363 EP - 2369 PB - Elsevier CY - Amsterdam AN - OPUS4-22682 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Cappella, Brunero T1 - Force-distance curves on lubricant films: An approach to the characterization of the shape of the AFM tip N2 - Force-distance curves have been acquired with an atomic force microscope on perfluorpolyether films. It is shown that curves acquired on films of different thickness, at different rates and with different dwell times can be overlapped by rescaling the time or distance axis.When the time or distance axis is rescaled,the force depends only on the surface tension of perfluorpolyether and on geometrical properties of thetip (aperture and perimeter of the tip at a given distance from the apex). Hence, curves acquired with thesame tip overlap. By comparing curves acquired at different rates the dynamics of tip-wetting can be investigated. Fur-thermore, rescaled force-distance curves have been matched with the perimeter of cross sections ofthe tip, i.e. with the perimeter of the three-phase contact line. Such measurements pave the way for anon-destructive investigation of the tip shape. KW - Lubricant films KW - Surface tension KW - Atomic force microscopy KW - Force-distance curves KW - AFM tip shape PY - 2017 U6 - https://doi.org/10.1016/j.micron.2016.11.006 SN - 0968-4328 VL - 93 SP - 20 EP - 28 AN - OPUS4-38391 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Pisonero, J. A1 - Bouzas-Ramos, D. A1 - Traub, Heike A1 - Cappella, Brunero A1 - Alvarez-Llamas, C. A1 - Richter, Silke A1 - Mayo, J. C. A1 - Costa-Fernandez, J. M. A1 - Bordel, N. A1 - Jakubowski, Norbert T1 - Critical evaluation of fast and highly resolved elemental distribution in single cells using LA-ICP-SFMS N2 - The analytical potential of a nanosecond laser ablation inductively coupled plasma mass spectrometer (ns-LA-ICP-SFMS) system, equipped with an ultra-fast wash-out ablation chamber, is critically investigated for fast and highly spatially resolved (∼μm) qualitative elemental distribution within single cells. Initially, a low surface roughness (< 10 nm) thin In–SnO2 layer (total coating thickness ∼200 nm) deposited on glass is employed to investigate the size, morphology and overlapping of laser-induced craters obtained at different laser repetition rates, making use of Atomic Force Microscopy (AFM). Conical craters with a surface diameter of about 2 µm and depths of about 100 nm were measured after a single laser shot. Furthermore, the influence of the sampling distance (i.e. distance between the sample surface and the inner sniffer of the ablation chamber) on the LA-ICP-MS ion signal wash-out time is evaluated. A significant decrease of the transient 120Sn+ ion signal is noticed after slight variations (±200 μm) around the optimum sampling position. Ultra-fast wash-outs (< 10 ms) are achieved reducing the aerosol mixing from consecutive laser shots even when operating the laser at high repetition rates (25 – 100 Hz). Fast and highly spatially resolved images of elemental distribution within mouse embryonic fibroblast cells (NIH/3T3 fibroblast cells) and human cervical carcinoma cells (HeLa cells), incubated with gold nanoparticles (Au NPs) and Cd-based quantum dots (QDs), respectively, are determined at the optimized operating conditions. Elemental distribution of Au and Cd in single cells is achieved using a high scanning speed (50 µm/s) and high repetition rate (100 Hz). The results obtained for the distribution of fluorescent Cd-based QDs within the HeLa cells are in good agreement with those obtained by confocal microscopy. The size, morphology and overlapping of laser-induced craters in the fixed cells are also investigated using AFM, observing conical craters with a surface diameter of about 2.5 µm and depths of about 800 nm after a single laser shot. KW - Laser ablation KW - ICP-MS KW - Nanoparticle KW - Atomic Force Microscopy KW - Cell PY - 2018 U6 - https://doi.org/10.1039/c8ja00096d SP - 1 EP - 9 PB - Royal Society of Chemistry CY - Cambridge AN - OPUS4-45564 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Fahrbach, M. A1 - Friedrich, Sebastian A1 - Cappella, Brunero A1 - Peiner, Erwin T1 - Calibrating a high-speed contact-resonance profilometer N2 - A European EMPIR project, which aims to use large-scale piezoresistive microprobes for contact resonance applications, a well-established measurement mode of atomic force microscopes (AFMs), is being funded. As the probes used in this project are much larger in size than typical AFM probes some of the simplifications and assumptions made for AFM probes are not applicable. This study presents a guide on how to systematically create a model that replicates the dynamic behavior of microprobes, including air damping, nonlinear sensitivities, and frequency dependencies. The model is then verified by analyzing a series of measurements. KW - Piezoresistive cantilever KW - AFM KW - contact resonance PY - 2020 U6 - http://nbn-resolving.de/urn/resolver.pl?urn:nbn:de:kobv:b43-509899 VL - 9 SP - 179 EP - 187 PB - Copernicus Publications AN - OPUS4-50989 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Reichelt, Manuel A1 - Cappella, Brunero T1 - Comparative analysis of error sources in the determination of wear volumes of oscillating ball-on-plane tests N2 - The accurate determination of wear volumes is a prerequisite for the study of numerous tribological phenomena. Wear volumes can be measured with different techniques or else be calculated starting from some quantities measured from the wear scar. Advantages and drawbacks of the measuring techniques are shown by means of wear scars and calottes resulting from ball-on-plane tests with 100Cr6 specimens. When measuring wear volumes, white light interferometry results to be one of the most suitable techniques. When wear volumes are calculated, errors result mainly from two sources: (1) the arbitrary choice of one or few line profiles for the determination of the width and of the planimetric wear, and (2) approximations in the calculation, which are even necessary when values of the wear volumes of the single tribological partners and not only the total volume are of interest. The effect of both error sources on the accuracy in the determination of wear volumes is characterized and elucidated by examples. It is found that errors due to approximations are negligible when compared to errors due to the arbitrary choice of one line profile. KW - Error sources analysis KW - White light interferometry KW - Statistical analysis KW - AFM KW - Wear KW - Oscillating ball-on-disc test PY - 2020 U6 - http://nbn-resolving.de/urn/resolver.pl?urn:nbn:de:kobv:b43-508407 VL - 6 SP - Article 25 AN - OPUS4-50840 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Cappella, Brunero A1 - Hartelt, Manfred A1 - Wäsche, Rolf T1 - High resolution imaging of macroscopic wear scars in the initial stage N2 - The topography of wear scars on the surface of a steel disc coated with a diamond-like carbon (DLC) layer has been investigated with an Atomic Force Microscope (AFM). AFM topography images have been combined together taking advantage of the stitching technique for the study of wear scars in their initial stage. Moreover, the topography of the sample has been acquired before and after the sliding tests. In this way even very small changes of the sample surface (<10 nm) can be detected. Three main phenomena taking place at the very initial stage of wear could be identified: the abrasion of small asperities bulging out of the sample surface, the carving of swallow grooves with depth under 20 nm, and the partial or total closure of cavities present on the surface. This last phenomenon shows that, before the carving of a wear scar, the plastic deformation of particular regions of the sample, i.e. the volume around the cavities, takes place already after few cycles (in this case between 400 and 800) in the initial phase of the sliding test. KW - Atomic force microscopy KW - Stitching technique KW - Running in KW - Plastic deformation PY - 2015 U6 - https://doi.org/10.1016/j.wear.2015.07.013 SN - 0043-1648 VL - 338-339 SP - 372 EP - 378 PB - Elsevier B.V. CY - Amsterdam AN - OPUS4-34734 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Cappella, Brunero A1 - Wassenberg, J. R. A1 - Heim, L.-O. A1 - Klostermann, M. A1 - Venzmer, J. A1 - Bonaccurso, E. T1 - Mechanical properties of silicone methacrylate microparticles determined by AFM colloidal probe technique N2 - The mechanical properties of seven types of silicone methacrylate microparticles prepared by solution polymerization with a Pickering emulsifier were investigated by Atomic Force Microscope force–displacement curves acquired in air with the Colloidal Probe Technique, i.e., with spherical SiO2 particles of known radius glued on tipless cantilevers. The deformation curves derived from the force–displacement curves were fitted with Hertz equation for the contact between two spherical particles, which lead to the determination of the elastic modulus of the samples. The performed measurements and the analysis provide quite exact values of the elastic modulus of all investigated polymer particles. Moreover, the results of the measurements were repeatable over large time intervals, also with different experimental setups. The influence of the sample preparation (polymerization method, cross-linking density of the polymer, and thickness of the external shell of the Pickering emulsifier) is discussed as well. The elastic moduli correlate with the cross-linking density (from 2 MPa for low cross-linking density up to 100–130 MPa for medium cross-linking density), whereas the thickness of the external shell formed by the Pickering emulsifier has no measurable influence on the mechanical properties of the microparticles. KW - Colloidal probe technique KW - Hertz model KW - Silicone elastomer PY - 2014 U6 - https://doi.org/10.1016/j.polymer.2014.01.021 SN - 0032-3861 SN - 1873-2291 VL - 55 IS - 5 SP - 1209 EP - 1216 PB - Elsevier Ltd. AN - OPUS4-30316 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Wäsche, Rolf A1 - Hartelt, Manfred A1 - Cappella, Brunero T1 - The use of AFM for high resolution imaging of macroscopic wear scars N2 - In this article we demonstrate the use of atomic force microscopy (AFM) measurements for the study of macroscopic wear scars. By stitching AFM images acquired over the wear scar, the detailed structure of the scar can be characterized even when the scar is much wider than the typical maximum scan range of the AFM (50–100 µm). The results obtained by AFM are compared with those yielded by white light interferometry (WLI). The comparison validates the WLI measurements; at the same time, it shows decisive differences in the resolutions of these two methods. As a consequence, AFM measurements are necessary whenever a precise characterization of the structure of the scar is required. However, since stitching of AFM images is rather time-consuming, white light interferometry is recommended as a faster method whenever experiments are aimed at just a gross characterization of the scar and the measurement of mean quantities (e.g. the wear volume). KW - Wear scar KW - Imaging KW - Roughness KW - Wear volume KW - Atomic force microscopy KW - White light interferometry PY - 2014 U6 - https://doi.org/10.1016/j.wear.2013.11.009 SN - 0043-1648 VL - 309 IS - 1-2 SP - 120 EP - 125 PB - Elsevier CY - Amsterdam AN - OPUS4-30289 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Reichelt, Manuel A1 - Cappella, Brunero T1 - Influence of relative humidity on wear of self-mated 100 Cr6 steel N2 - The influence of relative humidity on friction and wear is subject of several studies in the last decades. A comprehensive understanding of physical and chemical phenomena affecting the tribology is hampered by the lack of reproducible experimental results, by the large number of variables, and by several difficulties in the detection of tribochemical processes and products. In the present work, we analyze the wear coefficient and the wear volumes of 686 unlubricated tests performed on different oscillating tribometers with 100Cr6 balls on 100Cr6 planes at different relative humidity. Aim of this work is to assess the repeatability and reproducibility of data, to determine the dependence of the wear coefficient on the relative humidity, to understand the underlying physicochemical phenomena and to build three dimensional maps of the wear coefficient as a function of both humidity and the product of normal force and sliding distance. KW - Wear KW - 100Cr6 KW - Relative humidity PY - 2020 U6 - https://doi.org/10.1016/j.wear.2020.203239 VL - 450-451 SP - 203239 AN - OPUS4-50583 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Friedrich, Sebastian A1 - Cappella, Brunero T1 - Study of micro- and nanoscale wetting properties of lubricants using AFM force-distance curves N2 - Atomic force microscopy (AFM) plays an important role as a multifuntional tool in nanotribology.In the present work it was shown that the main features of force-distance curves on different lubricants have been characterized and the underlying phenomena could be explained. KW - Lubricants KW - Atomic force microscopy KW - Force-distance curves PY - 2020 U6 - http://nbn-resolving.de/urn/resolver.pl?urn:nbn:de:kobv:b43-504631 SN - 1573-2711 VL - 68 IS - 1 SP - 1 EP - 12 PB - Springer CY - Cham AN - OPUS4-50463 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Pisonero, J. A1 - Bouzas-Ramos, D. A1 - Traub, Heike A1 - Cappella, Brunero A1 - Álvarez-Llamas, C. A1 - Richter, Silke A1 - Mayo, J. C. A1 - Costa-Fernandez, J. M. A1 - Bordel, N. A1 - Jakubowski, Norbert T1 - Critical evaluation of fast and highly resolved elemental distribution in single cells using LA-ICP-SFMS N2 - The analytical potential of a nanosecond laser ablation coupled plasma mass spectrometer (ns-LA-ICP-SFMS)system is investigated for fast and highly spatially resolved (~µm) elemental distribution within single cells. The size, morphology and overlapping of laser-induced craters has been investigated with Atomic Force Microscopy (AFM). KW - Atomic Force Microscopy KW - Laser Ablation KW - Elemental Distribution PY - 2019 U6 - https://doi.org/10.1039/c8ja00096d SN - 0267-9477 VL - 34 IS - 4 SP - 655 EP - 663 PB - RSC AN - OPUS4-48549 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Friedrich, Sebastian A1 - Cappella, Brunero T1 - Application of contact-resonance AFM methods to polymer samples N2 - Contact-resonance AFM (CR-AFM) has been used in recent years for the measurement of mechanical properties. Compared with other techniques, CR-AFM has a much shorter acquisition time, compensating the incomplete theoretical understanding of the underlying physical phenomena. In the present paper, we propose a procedure, which allows to determine the elastic modulus of the sample as a parameter of the fit of the CR frequency as a function of the load. It is concluded that CR measurements are not appropriate for polymer samples. Major drawbacks are the bad resolution for moduli lower than ca. 10 GPa and the lack of a comprehensive physical model. KW - Atomic force microscopy KW - Contact resonance KW - Mechanical properties KW - Polymers KW - Wear PY - 2020 U6 - http://nbn-resolving.de/urn/resolver.pl?urn:nbn:de:kobv:b43-515621 VL - 11 SP - 1714 EP - 1727 AN - OPUS4-51562 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Pisonero, J. A1 - Traub, Heike A1 - Cappella, Brunero A1 - Álvarez-Llamas, C. A1 - Méndez, A. A1 - Richter, Silke A1 - Ruiz Encinar, J. A1 - Costa-Fernandez, J. M. A1 - Bordel, N. T1 - Exploring quantitative cellular biomaging and assessment of CdSe/ZnS quantum dots cellular uptake in single cells, using ns-LA-ICP-SFMS N2 - High spatially resolved quantitative bioimaging of CdSe/ZnS Quantum Dots uptake in two kinds of cells is investigated combining laser ablation inductively coupled plasma mass spectrometry and the spatially resolved analysis of dried pL-droplets from a solution with a known concentration of Quantum Dots. Single cells and dried pL-droplets are morphologically characterized by Atomic Force Microscopy. A number concentration of CdSe/ZnS QDs between 3.5 104 and 48 104 is estimated to be uptaken by several selected single cells, after being incubated in the presence of a QDs suspension added to a standard cell culture medium. Mono-elemental bioimaging at subcellular resolution seems to show a higher number concentration of the CdSe/ZnS QDs in the cytosol around the cell nucleus. KW - LA-ICP-SFMS KW - Fast single pulse response KW - Quantitative bioimaging KW - Cellular uptake KW - HT22 KW - HeLa KW - Single cell KW - pL-droplets KW - CdSe/ZnS quantum Dots KW - AFM PY - 2021 U6 - https://doi.org/10.1016/j.talanta.2021.122162 SN - 0039-9140 VL - 227 SP - 122162 PB - Elsevier B.V. AN - OPUS4-52121 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Fahrbach, M. A1 - Friedrich, Sebastian A1 - Behle, H. A1 - Xu, Min A1 - Cappella, Brunero A1 - Brand, U. A1 - Peiner, E. T1 - Customized piezoresistive microprobes for combined imaging of topography and mechanical properties N2 - Customized piezoresistive cantilever microprobes with a deflection range of 120 μm and silicon tips of 100 μm height were operated in a Cypher AFM showing their functionality for measuring topography together with stiffness, adhesion, and viscoelastic properties of thin films. KW - Cantilever microprobe KW - Piezoresistive KW - Atomic force microscopy KW - Force-distance curves KW - Contact resonance KW - Lubricants PY - 2021 U6 - http://nbn-resolving.de/urn/resolver.pl?urn:nbn:de:kobv:b43-524225 VL - 15 SP - 100042 PB - Elsevier Ltd. AN - OPUS4-52422 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Zubia Aranburu, Judith A1 - Cappella, Brunero A1 - Zabala Eguren, A. A1 - Buruaga Lamarain, L. A1 - Aginagalde Lopez, A. A1 - Bonse, Jörn A1 - Schwibbert, Karin T1 - Quantification of the adhesion force of E. coli on Ti via single-cell force spectroscopy N2 - Antibiotic resistance is a growing global problem which poses a massive threat to human health. Although human activity contributes to the acceleration of the process, bacteria have a self-driven stabilisation mechanism to protect themselves from such and other external threats: biofilm formation. Nonetheless, it is the adhesion of a single bacterial cell to a surface that triggers the formation of such network of biomolecules and microorganisms, as well as its hazardous consequences. The main objective of this work was to quantify the adhesion force of a single E. coli cell on a Ti substrate via the AFM-related single-cell force spectroscopy, with both the cell and the substrate material being of high clinical relevance. A set of 25 x 25 force displacement curves was acquired with a maximum force of 3.2 nN without dwell time, yielding a topography map and an adhesion force map that showed to be correlated. A mean adhesion force of 0.85 ± 0.175 nN was measured and the presence of cell appendages on the bacterial cell wall was verified through individual force-displacement curves. Bacterial viability was assessed after the measurements via live/dead staining. T2 - XL Congreso Anual de la Sociedad Española de Ingeniería Biomédica CASEIB 2022 CY - Valladolid, Spain DA - 23.11.2022 KW - Bacteria KW - Atomic force microscopy KW - Force distance curve PY - 2022 SN - 978-84-09-45972-8 SP - 217 EP - 220 AN - OPUS4-57039 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -