TY - JOUR A1 - Buzanich, Günter A1 - Radtke, Martin A1 - Reinholz, Uwe A1 - Riesemeier, Heinrich A1 - Streli, C. T1 - Micro-X-ray absorption spectroscopy with compound refractive lenses JF - Journal of analytical atomic spectrometry N2 - A study regarding the possibility to use compound refractive lenses (CRLs) for X-ray absorption spectroscopy (XAS) was conducted. For XAS measurements the energy of the monochromatic incident beam has to be tuned over an energy range which is broader than the energy bandwidth of a CRL. To prove that µ-XAS with compound refractive lenses is possible, it had to be investigated how changes in the energy influence the beam parameters. This was done by tuning the energy around the nominal energy of the lens and recording images with a high resolution X-ray imaging setup. To investigate the changes in the spot size the scintillator was placed at the nominal focal distance and scans along the beam axis were performed. The effect on the photon flux of the incident beam due to absorption in the lens was investigated by performing XANES measurement on different reference materials with and without CRL. The results of these measurements using a CRL designed for 9 keV are shown and discussed. KW - Micro-XAS KW - Compound refractive lens PY - 2012 DO - https://doi.org/10.1039/c2ja30130j SN - 0267-9477 SN - 1364-5544 VL - 27 IS - 10 SP - 1803 EP - 1808 PB - Royal Society of Chemistry CY - London AN - OPUS4-26790 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Buzanich, Günter A1 - Radtke, Martin A1 - Reinholz, Uwe A1 - Riesemeier, Heinrich A1 - Thünemann, Andreas A1 - Streli, C. T1 - Impurities in multicrystalline silicon wafers for solar cells detected by synchrotron micro-beam X-ray fluorescence analysis JF - Journal of analytical atomic spectrometry N2 - We report on the trace analysis of copper and iron impurities in multicrystalline silicon wafers with the microbeam X-ray fluorescence (µ-XRF) technique. The efficiency of solar cells, which are based on multicrystalline silicon wafers, is strongly influenced by minor contamination with metals such as copper and iron. Application of compound refractive lenses (CRLs) in µ-XRF allows versatile two-dimensional mapping of relevant contaminations and localization of their sites of deposition. In this context, the measured bulk average limit of detection (LOD) was one picogram of iron and copper per gram of silicon. We suggest that µ-XRF is a valuable tool for non-destructive spatial (3D) quantification of metal impurities in a wide range of materials and devices whose functioning could be critically affected by impurities. KW - X-ray micro beam KW - Compound refractive lens KW - Solar cell KW - Silicon impurities PY - 2012 DO - https://doi.org/10.1039/c2ja30188a SN - 0267-9477 SN - 1364-5544 VL - 27 IS - 11 SP - 1875 EP - 1881 PB - Royal Society of Chemistry CY - London AN - OPUS4-26791 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -