TY - CONF A1 - Kupsch, Andreas A1 - Lange, Axel A1 - Hentschel, Manfred P. A1 - Bruno, Giovanni A1 - Onel, Yener A1 - Wolk, Thomas A1 - Staude, Andreas A1 - Ehrig, Karsten A1 - Müller, Bernd R. T1 - Evaluating porosity in cordierite diesel particulate filter materials: advanced X-ray techniques and new statistical analysis methods T2 - ECNDT 2014 - 11th European conference on non-destructive testing (Proceedings) T2 - ECNDT 2014 - 11th European conference on non-destructive testing CY - Prague, Czech Republic DA - 2014-10-06 KW - Porous ceramics KW - Diesel particulate filters KW - Pore orientation KW - X-ray computed tomography KW - X-ray refraction KW - DIVA algorithm KW - Phase contrast KW - Edge artefact KW - Soft matter radiography KW - Wavelet transform KW - Huygens elementary waves PY - 2014 SN - 978-80-214-5018-9 SP - 1 EP - 8(?) AN - OPUS4-31973 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Kupsch, Andreas A1 - Hentschel, Manfred P. A1 - Lange, Axel A1 - Bruno, Giovanni A1 - Müller, Bernd R. T1 - Direct X-ray refraction of micro structures T2 - ECNDT 2014 - 11th European conference on non-destructive testing (Proceedings) N2 - For the first time we present direct 2D imaging of refracted X-rays without any discrimination of the Primary radiation. X-refraction works in analogy to visible light optics: X-rays are entirely deflected at interfaces where discontinuities of (electron) density occur. This is demonstrated at the example of inner and outer surfaces of model samples of well-defined geometry (fibres, capillaries, and monodisperse micro particles). The samples are scanned through a 50 μm monochromatic (20 keV) pencil beam. In order to warrant a sufficient angular resolution a 2D detector (pixel size 7 μm) is placed 3 m downstream of the sample. Scanning the sample in micron steps allows for detecting local changes of interface / surface orientation directly in two dimensions. At the actual angular resolution of about 3 seconds of arc (scattering vector increments Δk = 10-3 nm-1) and 50 μm spatial resolution (scanning) the material’s inner surfaces (with nanometer separation) can be characterized even at sampling rates below 1 second per frame. Moreover, our technique is suited to directly determine particle diameters of up to 250 nm by means of diffraction fringes. Some potential applications to technical submicron structures are discussed. T2 - ECNDT 2014 - 11th European conference on non-destructive testing CY - Prague, Czech Republic DA - 06.10.2014 KW - X-ray refraction KW - Phase contrast KW - Edge artefact KW - Soft matter radiography KW - Wavelet transformation KW - Huygens elementary waves PY - 2014 SN - 978-80-214-5018-9 SP - 1 EP - 9 AN - OPUS4-31970 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -