TY - JOUR A1 - Serrano Munoz, Itziar A1 - Fernández, R. A1 - Saliwan Neumann, Romeo A1 - González-Doncel, G. A1 - Bruno, Giovanni T1 - Dislocation substructures in pure aluminium after creep deformation as studied by electron backscatter diffraction N2 - In the present work, electron backscatter diffraction was used to determine the microscopic dislocation structures generated during creep (with tests interrupted at the steady state) in pure 99.8% aluminium. This material was investigated at two different stress levels, corresponding to the power-law and power-law breakdown regimes. The results show that the formation of subgrain cellular structures occurs independently of the crystallographic orientation. However, the density of these cellular structures strongly depends on the grain crystallographic orientation with respect to the tensile axis direction, with <111> grains exhibiting the highest densities at both stress levels. It is proposed that this behaviour is due to the influence of intergranular stresses, which is different in <111> and <001> grains. KW - Creep KW - Pure aluminium KW - Electron backscatter diffraction KW - Cellular structures KW - Power law and power-law breakdown PY - 2022 U6 - http://nbn-resolving.de/urn/resolver.pl?urn:nbn:de:kobv:b43-552003 SN - 0021-8898 SN - 1600-5767 VL - 55 SP - 860 EP - 869 PB - Wiley-Blackwell CY - Copenhagen AN - OPUS4-55200 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -