TY - CONF A1 - Sokolowski-Tinten, K. A1 - Barty, A. A1 - Boutet, S. A1 - Shymanovich, U. A1 - Bogan, M. A1 - Marchesini, S. A1 - Hau-Riege, S. A1 - Stojanovic, N. A1 - Bonse, Jörn A1 - Tobey, R. A1 - Ehrke, H. A1 - Cavalleri, A. A1 - Duesterer, S. A1 - Frank, M. A1 - Bajt, S. A1 - Schulz, J. A1 - Seibert, M. A1 - Hajdu, J. A1 - Treusch, R. A1 - Chapman, H. T1 - Short-pulse laser induced transient structure formation and ablation studied with time-resolved coherent XUV-scattering T2 - Fall meeting of the materials research society 2009 - Symposium MM / Materials research society symposium proceedings N2 - XUV- and X-ray free-electron-lasers (FEL) combine short wavelength, ultrashort pulse duration, spatial coherence and high intensity. This unique combination of properties opens up new possibilities to study the dynamics of non-reversible phenomena with ultrafast temporal and nano- to atomic-scale spatial resolution. In this contribution we wish to present results of time-resolved experiments performed at the XUV-FEL FLASH (HASYLAB/Hamburg) aimed to investigate the nano-scale structural dynamics of laser-irradiated materials. Thin films and fabricated nano-structures, deposited on Si3N4-membranes, have been excited with ultrashort optical laser pulses. The dynamics of the non-reversible structural evolution of the irradiated samples during laser-induced melting and ablation has been studied in an optical pump - XUV-probe configuration by means of single-shot coherent scattering techniques (i.e. diffraction imaging [1]). In a first set of experiments we investigated the formation of laser induced periodic surface structures (LIPSS) on the surface of thin Si-films (thickness 100 nm). In a simplified view LIPPS are generated as a result of interference between the incident laser pulse and surface scattered waves which leads to a periodically modulated energy deposition. Time-resolved scattering using femtosecond XUV-pulses (with a wavelength of 13.5 nm and 7 nm) allowed us to directly follow LIPSS evolution on an ultrafast time-scale and with better than 40 nm spatial resolution. The observed scattering patterns show almost quantitative agreement with theoretical predictions [2] and reveal that the LIPSS start to form already during the 12 ps pump pulse. In the second set of measurements we studied picosecond and femtosecond laser induced ablation and disintegration of fabricated nano-structures. Correlations of coherent diffraction patterns measured at various time delays to the pattern of the undisturbed object show that order in the structure is progressively lost starting from short length scales. This structural rearrangement progresses at close to the speed of sound in the material. Under certain circumstances (e.g. adequate sampling) it became also possible to reconstruct real-space images of the object as it evolves over time [3]. The possibility of femtosecond single-shot imaging of ultrafast dynamic processes with nanoscale resolution provides yet more details of the physical processes involved. [1] H. N. Chapman et al. Nature Phys. 2, 839 (2006). [2] J. F. Young et al., Phys. Rev. B 27, 1155 (1983). [3] A. Barty et al. Nature Phot. 2, 415 (2008). T2 - Fall meeting of the materials research society 2009 CY - Boston, MA, USA DA - 2009-11-30 KW - Femtosecond laser ablation KW - Laser-induced periodic surface structures KW - Time-resolved coherent XUV scattering KW - Semiconductor KW - Silicon PY - 2010 DO - https://doi.org/10.1557/PROC-1230-MM05-03 N1 - Serientitel: Materials Research Society symposium proceedings – Series title: Materials Research Society symposium proceedings VL - 1230E IS - Paper 1230-MM05-03 SP - 1 EP - 6 AN - OPUS4-21438 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Bonse, Jörn A1 - Solis, J. A1 - Spielmann, C. A1 - Lippert, T. A1 - Krüger, Jörg T1 - Damage mechanisms in polymers upon NIR femtosecond pulse laser irradiation: sub-threshold processes and their implications for laser safety applications T2 - AIP Conference Proceedings 1278 N2 - This contribution investigates laser-induced damage of thin film and bulk polymer samples, with the focus on physical processes occurring close to the damage threshold. In-situ real-time reflectivity (RTR) measurements with picosecond (ps) and nanosecond (ns) temporal resolution were performed on thin polymer films on a timescale up to a few microseconds (µs). A model for polymer thin film damage is presented, indicating that irreversible chemical modification processes take place already below the fluence threshold for macroscopic damage. On dye-doped bulk polymer filters (as used for laser goggles), transmission studies using fs-and ps-laser pulses reveal the optical saturation behavior of the material and its relation to the threshold of permanent damage. Implications of the sub-threshold processes for laser safety applications will be discussed for thin film and bulk polymer damage. T2 - International high-power laser ablation conference CY - Santa Fe, USA DA - 2010-04-18 KW - Polymer KW - Laser damage KW - Ultrashort laser pulses KW - Time-resolved reflectivity measurements KW - Laser safety PY - 2010 UR - http://link.aip.org/link/?APCPCS/1278/56/1 SN - 978-0-7354-0828-9 DO - https://doi.org/10.1063/1.3507148 N1 - Serientitel: AIP conference proceedings – Series title: AIP conference proceedings IS - 1278 SP - 56 EP - 64 PB - American Institute of Physics CY - Melville, NY, USA AN - OPUS4-22156 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -