TY - GEN A1 - Procop, Mathias A1 - Hodoroaba, Vasile-Dan A1 - Bjeoumikhov, A. A1 - Eggert, F. A1 - Wedell, R. T1 - Combination of electron probe microanalysis and X-ray fluorescence analysis in a scanning electron microscope T2 - 45th Annual Port Elizabeth Conference CY - Port Elizabeth, South Africa DA - 2006-11-29 KW - myXRF at SEM KW - EPMA KW - Detection limits PY - 2006 SN - 0-620-37294-X VL - 36 SP - 26 CY - Onderstepoort AN - OPUS4-14567 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -