TY - CONF A1 - Hilpert, U. A1 - Bartscher, M. A1 - Neugebauer, M. A1 - Goebbels, Jürgen A1 - Weidemann, Gerd A1 - Bellon, Carsten T1 - Simulation-aided computed tomography (CT) for dimensional measurements N2 - Carrying out dimensional measurements by CT means assessing coordinates in space. CT must therefore be treated as a coordinate measuring technique similar to optical or tactile Coordinate Measuring Machines (CMMs). The well-established standards and guidelines for the acceptance- and verificationtesting of CMMs require the use of calibrated reference standards to achieve measurement machine characteristics. Hence, transferring these concepts from coordinate metrology to CT, a dedicated CT-specific reference standard was designed, manufactured and calibrated using a tactile CMM. For comparison purposes, a CAD model was created by reverse engineering using the calibration data. The calibrated model was fed into a virtual CT and the measurement process was simulated. The reference standard was measured by micro-CT. By comparing the characteristics of the measurement output of CT and the output gained from simulation, the influences of measurement artefacts can be judged, for the first time, in analogy to existing Guidelines of coordinate metrology. T2 - DIR 2007 - International Symposium on Digital industrial Radiology and Computed Tomography CY - Lyon, France DA - 25.06.2007 KW - Computed tomography KW - X-ray KW - Simulation KW - Coordinate metrology PY - 2007 UR - http://www.ndt.net/article/dir2007/papers/12.pdf SP - Paper 6, 1 EP - 15 AN - OPUS4-37045 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -