TY - CONF A1 - Beckhoff, B. A1 - Kolbe, M. A1 - Hahn, Oliver A1 - Karydas, A.G. A1 - Zarkadas, C. A1 - Sokaras, D. A1 - Mantler, M. T1 - X-Ray fluorescence analysis: Part 1: Experiments with synchrotron radiation T2 - TECHNART 2007, Non-destructive and Microanalytikal Techniques in Art and Cultural Heritage Research CY - Lisbon, Portugal DA - 2007-04-25 PY - 2007 AN - OPUS4-15022 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Mantler, M. A1 - Beckhoff, B. A1 - Kolbe, M. A1 - Karydas, A.G. A1 - Zarkadas, C. A1 - Sokaras, D. T1 - Reference-Free X-Ray flourescence analysis: Part 2: Theoretical considerations T2 - TECHNART 2007, Non-destructive and Techniques in Art and Cultural Heritage Research CY - Lisbon, Portugal DA - 2007-04-25 PY - 2007 AN - OPUS4-15025 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Kolbe, M. A1 - Beckhoff, B. A1 - Hahn, Oliver A1 - Karydas, A.G. A1 - Zarkadas, C. A1 - Sokaras, D. A1 - Mantler, M. T1 - Reference-free investigation of an ancient Chinese ceramic by X-ray fluorescence analysis KW - X-ray fluorescence analysis KW - Reference-free investigation PY - 2007 UR - http://www.helmholtz-berlin.de/media/media/oea/web/pr_webseite/druckschriften/berichte/bessy/annual_report_2006.pdf#page=32 SN - 0179-4159 SP - 32 EP - 34 PB - Berliner Elektronenspeicherring-Gesellschaft für Synchrotronstrahlung CY - Berlin AN - OPUS4-14853 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Streeck, C. A1 - Wirth, Thomas A1 - Unger, Wolfgang A1 - Beckhoff, B. T1 - Qualifying calibration samples for advanced thin film materials characterisation N2 - In this article the question of the certification of calibration samples for the characterisation of advanced thin film materials is addressed within the framework of reliable process control or quality management purposes. Reference measurement techniques can be used in order to address the gap in appropriate certified reference materials (CRMs) for thin film analyses. They allow for qualifying out-of-production samples originating from an operating production line as calibration samples. As a template for this procedure, CIGS [Cu(In,Ga)Se2] layers, that are absorber layers for high efficiency thin-film solar cells, have been used for establishing and validating reference-free X-ray fluorescence (XRF) analysis and Auger-electron spectroscopy (AES) as reference measurement techniques. The focus was on determining the average mole fractions in the CIGS layers obtaining results traceable to the SI unit system. Reference-free XRF is physically traceable and is based upon radiometrically calibrated instrumentation and knowledge of atomic fundamental data. Sputter-assisted AES can be established as a chemically traceable method after careful calibration using a certified reference material (CRM) based on a total number counting method. KW - CIGS KW - X-ray fluorescence (XRF) KW - Auger-electron spectroscopy (AES) PY - 2018 UR - https://www.spectroscopyeurope.com/article/qualifying-calibration-samples-advanced-thin-film-materials-characterisation VL - 30 IS - 1 SP - 11 EP - 14 PB - John Wiley & Sons Ltd CY - Chichester, West Sussex PO19 8SQ, UK AN - OPUS4-44260 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Beckhoff, B. A1 - Hahn, Oliver A1 - Weser, J. A1 - Wilke, M. A1 - Ulm, G. A1 - Jann, Oliver T1 - Environmental analysis by TXRF - NEXAFS and IR- spectroscopy: speciation of Br in organics and characterization of the organic matrix T2 - EXRS 2006 CY - Paris, France DA - 2006-06-19 PY - 2006 AN - OPUS4-13234 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hahn, Oliver A1 - Beckhoff, B. A1 - Weser, J. A1 - Wilke, M. A1 - Ulm, G. A1 - Jann, Oliver T1 - Environmental analysis by TXRF - NEXAFS and IR- spectroscopy: speciation of Br in organics and characterization of the organic matrix T2 - PRORA (Fachtagung), Prozessnahe Röntgenanalytik, Wista Adlershof CY - Berlin, Germany DA - 2005-11-24 PY - 2005 AN - OPUS4-11482 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hahn, Oliver A1 - Beckhoff, B. A1 - Seeger, Stefan A1 - Weser, J. A1 - Ulm, G. A1 - Jann, Oliver T1 - Environmental analysis by TXRF - NEXAFS and IR- spectroscopy: speciation of Br in organics and characterization of the organic matrix T2 - Healthy Buildings 2006 CY - Lisbon, Portugal DA - 2006-06-04 PY - 2006 AN - OPUS4-12312 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Beckhoff, B. A1 - Hahn, Oliver A1 - Weser, J. A1 - Wilke, M. A1 - Ulm, G. A1 - Jann, Oliver T1 - Environmental Analyses by TXRF - NEXAFS and IR-Spectroscopy: Speciation of Br in Organics and Characterization of the Organic Matrix KW - TXRF-NEXAFS KW - FTIR KW - Environmental analyses PY - 2006 UR - http://www.helmholtz-berlin.de/media/media/oea/web/pr_webseite/druckschriften/berichte/bessy/annualreport2005.pdf#page=30 SN - 0179-4159 SP - 28 EP - 30 PB - Berliner Elektronenspeicherring-Gesellschaft für Synchrotronstrahlung CY - Berlin AN - OPUS4-12410 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Beckhoff, B. A1 - Hahn, Oliver A1 - Jann, Oliver A1 - Ulm, G. A1 - Wilke, M. A1 - Weser, J. T1 - Encviromental Analyses by TXRF-NEXAFS and IR-spectroscopy: Speciation of Bromine in Organics and Characterization of the Organic Matrix T2 - VVIII INternational Bonderence on "X-ray Optics and MIcroanlaysis" CY - Frascati, Italy DA - 2005-09-25 PY - 2005 AN - OPUS4-10543 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hahn, Oliver A1 - Malzer, W. A1 - Kanngießer, B. A1 - Beckhoff, B. A1 - Waldschläger, U. T1 - Characterization of iron gall inks in historical manuscripts using micro X-ray fluorescence spectrometry T2 - European Conference on Energy Dispersive X-Ray Spectrometry (EDXRS) CY - Berlin, Germany DA - 2002-06-16 PY - 2002 SP - 83 AN - OPUS4-1404 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -