TY - JOUR A1 - Link, T. A1 - Österle, Werner T1 - Röntgenmikroanalyse im Elektronenmikroskop, Teil IV: Superlegierungen PY - 1991 SN - 0032-678X VL - 28 SP - 101 EP - 114 PB - Hanser CY - München AN - OPUS4-2469 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Österle, Werner T1 - Gefüge und Festigkeit metallischer Werkstoffe PY - 1987 SN - 0028-1042 SN - 1432-1904 VL - 77 SP - 317 EP - 325 PB - Springer CY - Berlin AN - OPUS4-2454 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Materna-Morris, E. A1 - Österle, Werner A1 - Schwaab, P. T1 - Röntgenmikroanalyse im Elektronenmikroskop, Teil II: Härtbare, warmfeste Stähle PY - 1990 SN - 0032-678X VL - 27 SP - 383 EP - 402 PB - Hanser CY - München AN - OPUS4-2460 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Klaar, H.J. A1 - Schwaab, P. A1 - Österle, Werner T1 - Ringversuch zur quantitativen Ermittlung der Versetzungsdichte im Elektronenmikroskop PY - 1992 SN - 0032-678X VL - 29 SP - 3 EP - 25 PB - Hanser CY - München AN - OPUS4-2473 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Österle, Werner T1 - Zur Problematik der elektronenmikroskopischen Ermittlung der Versetzungsdichte in kaltverformten kohlenstoffarmen Stählen PY - 1992 SN - 0032-678X VL - 29 SP - 400 EP - 413 PB - Hanser CY - München AN - OPUS4-2474 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Bettge, Dirk A1 - Österle, Werner A1 - Ziebs, Josef T1 - Temperature dependence of additional cyclic hardening of the nickel-base superalloy IN 738 LC during out-of-phase multiaxial deformation PY - 1995 SN - 1359-6462 SN - 1872-8456 VL - 32 IS - 10 SP - 1601 EP - 1606 PB - Elsevier CY - Oxford AN - OPUS4-2480 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Österle, Werner T1 - Bohrer für den Nanometerbereich - Mikrobearbeitung und Gefügedarstellung mit der Technik des fokussierten Ionenstrahls (FIB) KW - FIB KW - Mikrobearbeitung KW - TEM KW - Nanotechnologie PY - 2004 DO - https://doi.org/10.3139/120.100573 SN - 0025-5300 VL - 46 IS - 3 SP - 113 EP - 117 PB - Carl Hanser Verlag CY - München AN - OPUS4-3495 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Österle, Werner A1 - Dörfel, Ilona A1 - Gesatzke, Wolfgang A1 - Rooch, Heidemarie A1 - Urban, Ingrid T1 - Charakterisierung tribologischer Kontakte mit FIB und TEM KW - FIB KW - TEM KW - Verbundwerkstoff KW - Bremse KW - Diamantschicht PY - 2004 SN - 0032-678X N1 - Sprachen: Deutsch/Englisch - Languages: German/English VL - 41 IS - 4 SP - 166 EP - 179 PB - Hanser CY - München AN - OPUS4-3496 LA - mul AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Österle, Werner A1 - Ressel, P. T1 - XTEM investigation of Ge/Pd shallow contact to p-IN0.53Ga0.47As N2 - Cross-sectional transmission electron microscopy, in combination with energy dispersive X-ray spectroscopy and focused beam microdiffraction, was applied to study the solid-state reactions taking place during contact formation of the system Ge(115 nm)/Pd(50 nm)—In0.53Ga0.47As. In order to get information about the sequence of the different processes, rapid thermal, annealing experiments in the range 225–400 °C were performed. The following features were observed: at 225 °C Pd reacted with the substrate forming the quaternary phase PdxIn0.53Ga0.47As (x ˜ 4), and with the Ge-layer forming mainly PdGe and Pd2Ge. Between PdxIn0.53Ga0.47As and In0.53Ga0.47As, a 5 nm thick amorphous Pd-In-Ga-As layer remained, indicating that the first reaction step was solid-state amorphization. After annealing at 350 °C, PdxIn0.53Ga0.47As disappeared and regrowth of In0.53Ga0.47As occured. Finally, at 400 °C, residual Ge from the amorphous top layer diffused to the interface and grew epitaxially on the regrown In0.53Ga0.47As, thus separating the III–V compound semiconductor from the Pd-Ge reaction products. The interface remained flat, while only about 10 nm of the active In0.53Ga0.47As layer had been modified during the annealing processes. PY - 1996 DO - https://doi.org/10.1016/0921-5107(96)01580-2 SN - 0921-5107 SN - 1873-4944 VL - 40 IS - 1 SP - 42 EP - 49 PB - Elsevier CY - Amsterdam AN - OPUS4-2513 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Ressel, P. A1 - Österle, Werner A1 - Urban, Ingrid A1 - Dörfel, Ilona A1 - Klein, A. A1 - Vogel, K. A1 - Kräutle, H. T1 - Transmission electron microscopy study of rapid thermally annealed Pd/Ge contacts on IN0.53Ga0.47As PY - 1996 SN - 0021-8979 SN - 1089-7550 VL - 88 SP - 3910 EP - 3914 PB - American Institute of Physics CY - Melville, NY AN - OPUS4-2514 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Klein, A. A1 - Urban, Ingrid A1 - Ressel, P. A1 - Nebauer, E. A1 - Merkel, U. A1 - Österle, Werner T1 - Preparation, transmission electron microscopy, and microanalytical investigations of metal-III-V semiconductor interfaces PY - 1996 SN - 1044-5803 SN - 1873-4189 VL - 37 SP - 143 EP - 151 PB - Elsevier CY - New York, NY AN - OPUS4-2528 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Witke, Klaus A1 - Österle, Werner A1 - Skopp, André A1 - Woydt, Mathias T1 - Raman microprobe spectroscopy and transmission electron microscopy of thermal sprayed ZrO2 coatings before and after rub testing of outer air seals N2 - 8 wt% Y2O3-ZrO2 spray powder and thermally sprayed as thermal barrier coatings on outer air seals were characterized by Raman microprobe spectroscopy (RMS) and transmission electron microscopy to investigate the lateral distribution, composition, structure and grain size of ZrO2 phases and to separate ZrO2 and Y2O3. RMS of transfer layers on ZrO2-coated shrouds after rub tests against SiC laser-tipped metallic blades showed the formation of metallic oxides MeIMeII2O4 of spinel type. Wear tracks were partly covered by graphite and spinel-type oxides. In some cases, the latter were better detectable after laser enhanced cleaning by burning off the covering carbon layer. PY - 2001 DO - https://doi.org/10.1002/jrs.791 SN - 0377-0486 SN - 1097-4555 VL - 32 IS - 12 SP - 1008 EP - 1014 PB - Wiley CY - Chichester AN - OPUS4-1230 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Österle, Werner A1 - Griepentrog, Michael A1 - Klaffke, Dieter T1 - Microstructural characterization of wear particles formed during tribological stressing of TiC and Ti(C,N) coatings N2 - An attempt was undertaken to obtain a better understanding of the tribological properties of two wear-resistant coatings on tool steel by structural and microchemical analysis of wear particles using a transmission electron microscope. Coatings were deposited by physical vapor deposition and plasma-assisted chemical vapor deposition techniques and tribological properties were derived from reciprocating sliding tests of the coatings against alumina balls. Three types of wear particles were identified by electron diffraction and energy dispersive X-ray spectroscopy: nanocrystalline rutile (TiO2), nanocrystalline graphite and microcrystalline graphite. Low coefficients of friction, of the order of 0.2, were attributed to the formation of solid lubricant films of sub-stoichiometric TiO2-x Magnéli phases and/or graphite. KW - Third body KW - Solid lubrication KW - Coating, debris KW - Wear particle KW - TEM PY - 2002 DO - https://doi.org/10.1023/A:1015491027710 SN - 1023-8883 SN - 1573-2711 VL - 12 IS - 4 SP - 229 EP - 234 PB - Springer Science Business Media B.V. CY - Dordrecht AN - OPUS4-1379 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Österle, Werner A1 - Nebauer, E. A1 - Hilsenbeck, J. A1 - Würfl, J. A1 - Klein, A. T1 - XTEM and TFXRD investigations of ohmic Ti/Al/Ti/Au/WSiN contacts on AlGaN/GaN HFET layer systems N2 - The microstructural features of the high-temperature-stable ohmic contact system Ti/Al/Ti/Au/WSiN on AlGaN/GaN were investigated using analytical transmission electron microscopy and thin film x-ray diffraction. For two typical rapid thermal annealing steps at 750 °C (non-ohmic behaviour) and 850 °C (ohmic behaviour) the intermetallic phases at the metal-semiconductor interface are presented. Increased annealing leads to the transformation of an Al2Au-AlAuTi phase mixture to a mixture of Al2Au-Al3Au8 phases and the formation of Ti-Al-nitride layers at the interfaces. In light of these results the electrical contact properties are discussed. PY - 2002 DO - https://doi.org/10.1088/0268-1242/17/3/312 SN - 0268-1242 SN - 1361-6641 VL - 17 IS - 3 SP - 249 EP - 254 PB - IOP Publ. CY - Bristol AN - OPUS4-1380 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Österle, Werner A1 - Dörfel, Ilona A1 - Urban, Ingrid A1 - Reier, T. A1 - Schultze, J. T1 - XPS and XTEM study of AlN formation by N+2 implantation of aluminium N2 - X-ray photoelectron spectroscopy (XPS) and cross-sectional transmission electron microscopy (XTEM) were used to study the formation of AlN films by N+2 ion implantation of aluminium at energies of 3 keV and 100 keV. In both cases, a two-stage mechanism was found, comprising first the oriented precipitation of small particles of the hexagonal AlN-phase, followed by growth and coalescence finally forming a continuous AlN-layer while increasing the implantation dose from 1×1017 cm-2 to 2×1017 cm-2. The results of both methods are in excellent agreement and furthermore provide complementary information concerning chemical composition and binding energies as well as microstructural details. KW - AIN KW - Aluminium KW - N2+ KW - Implantation KW - XPS KW - XTEM PY - 1998 DO - https://doi.org/10.1016/S0257-8972(98)00355-7 SN - 0257-8972 VL - 102 IS - 1-2 SP - 168 EP - 174 PB - Elsevier Science CY - Lausanne AN - OPUS4-2363 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Dörfel, Ilona A1 - Österle, Werner A1 - Urban, Ingrid A1 - Bouzy, E. T1 - Microstructural characterization of binary and ternary hard coating systems for wear protection - Part I: PVD coatings N2 - Different wear-resistant coatings produced by physical vapour deposition (PVD) were characterized with the aid of cross-sectional transmission electron microscopy (XTEM). All coating systems were optimized by the producers and exhibited good properties with respect to their special applications. The microstructure, texture and chemical composition of binary and ternary systems produced by the arc process [TiN, CrN, Cr2N (Ti, Cr)N on steel substrates] and magnetron sputtering process [TiN, CrN on steel substrates, (Ti, Al)N on Si-substrate] were investigated. All coatings had a more or less columnar microstructure, which was interrupted by interlayers in some cases. Whereas arc coatings always did show some kind of substrate modification, the latter was not observed after magnetron sputtering. Electron diffraction normally revealed a mono-phase fcc structure, except at sites very near to the interface. Only for the systems Cr–N and (Ti, Cr)–N were different additional phases observed at low nitrogen partial pressures. KW - Arc bond sputtering KW - Arc deposition KW - Magnetron sputtering KW - TEM KW - XTEM PY - 1999 UR - http://www.sciencedirect.com/science?_ob=ArticleURL&_udi=B6TVV-3VTRSCY-G&_user=963821&_coverDate=01%2F29%2F1999&_rdoc=14&_fmt=summary&_orig=browse&_srch=doc-info(%23toc%235544%231999%23998889997%2360972%23FLA%23display%23Volume)&_cdi=5544&_sort=d&_docanch DO - https://doi.org/10.1016/S0257-8972(98)00735-X SN - 0257-8972 VL - 111 IS - 2-3 SP - 199 EP - 209 PB - Elsevier Science CY - Lausanne AN - OPUS4-2364 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Dörfel, Ilona A1 - Österle, Werner A1 - Urban, Ingrid A1 - Bouzy, E. A1 - Morlok, O. T1 - Microstructural characterization of binary and ternary hard coating sytems for wear protection - Part II: Ti(CN) PACVD coatings KW - Microstructure KW - PACVD KW - Solid lubrication KW - Texture KW - TiC KW - TiN KW - Ti(CN) PY - 1999 SN - 0257-8972 VL - 116-119 SP - 898 EP - 905 PB - Elsevier Science CY - Lausanne AN - OPUS4-2365 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Österle, Werner A1 - Bettge, Dirk A1 - Fedelich, Bernard A1 - Klingelhöffer, Hellmuth T1 - Modelling the orientation and direction dependence of the critical resolved shear stress of nickel-base superalloy single crystals PY - 2000 SN - 1359-6454 SN - 1873-2453 VL - 48 SP - 689 EP - 700 PB - Elsevier Science CY - Kidlington AN - OPUS4-2366 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Österle, Werner A1 - Urban, Ingrid A1 - Severin, D. A1 - Trepte, S. T1 - Correlations between surface modification and tribological performance of brake pads N2 - The formation of a third body layer on a conventional friction material during braking tests was studied in some detail using TEM, SEM, and X-ray photoelectron spectroscopy (XPS) techniques. Plate shaped micro-contact areas representing a compositional mix of all components of the tribocouple and exhibiting a nanocry stalline microstructure were identified after a run-in period. PY - 2001 DO - https://doi.org/10.1179/026708401101517700 SN - 0267-0844 SN - 1743-2944 VL - 17 IS - 2 SP - 123 EP - 125 PB - Institute of Metals CY - London AN - OPUS4-2367 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Nebauer, E. A1 - Mai, M. A1 - Würfl, J. A1 - Österle, Werner T1 - Au/Pt/Ti/Pt base contacts to n-InGaP/p+-GaAs for self-passivating HBT ledge structures N2 - Multi-layer ohmic contact systems such as Au/Pt/Ti/Pt on III-V double layers such as n-InGaP/p+-GaAs are of considerable technological relevance, e.g. for heterojunction bipolar transistors. The paper shows that such contacts can be effectively reacted through the InGaP layer and exhibit very good contact resistances (0.1 O mm) to the base layer if the thickness of the first Pt layer is properly matched to the thickness of the contacted InGaP layer. Interdiffusion and phase formation associated with the annealing processes are studied by cross-sectional analytical transmission electron microscopy, thin-film x-ray diffraction and Auger electron spectroscopy depth profiling. Thermal ageing experiments up to 400 °C show good electrical stability. Device related reliability tests do not show any degradation effect related to this novel base contact. PY - 2000 DO - https://doi.org/10.1088/0268-1242/15/8/306 SN - 0268-1242 SN - 1361-6641 VL - 15 IS - 8 SP - 818 EP - 822 PB - IOP Publ. CY - Bristol AN - OPUS4-2368 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -