TY - CONF A1 - Hodoroaba, Vasile-Dan A1 - Benemann, Sigrid A1 - Motzkus, C. A1 - Macé, T. A1 - Palmas, P. A1 - Vaslin-Reimann, S. T1 - Advanced Analysis of spherical SiO2 Aerosol Nanoparticles with a high-resolution SEM T2 - Microscopy and Microanalysis 2012 T2 - Microscopy and Microanalysis 2012 CY - Phoenix, AZ, USA DA - 2012-07-29 PY - 2012 AN - OPUS4-26307 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan A1 - Benemann, Sigrid A1 - Motzkus, C. A1 - Macé, T. A1 - Palmas, P. A1 - Vaslin-Reimann, S. T1 - Advanced Analysis of spherical SiO2 Aerosol Nanoparticles with a high-resolution SEM T2 - Nano-Additive T2 - Nano-Additive CY - Berlin, Germany DA - 2012-11-19 PY - 2012 AN - OPUS4-27152 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan A1 - Procop, Mathias A1 - Unger, Wolfgang T1 - A Test Material and quick Procedure for Checking the Performance of X-Ray Spectrometers attached to a SEM T2 - ECASIA '11 14th European Conference on Application of Surface and Interface Analysis T2 - ECASIA '11 14th European Conference on Application of Surface and Interface Analysis CY - Cardiff, Wales DA - 2011-09-04 PY - 2011 AN - OPUS4-24241 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - A joint NIST/BAM Pilot Study for EPMA (WD & ED) - A Proposal T2 - "Surface Analysis Working Group" (SAWG) Meeting, CCQM T2 - "Surface Analysis Working Group" (SAWG) Meeting, CCQM CY - Paris, France DA - 2010-04-14 PY - 2010 AN - OPUS4-21170 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan A1 - Reuter, Dirk T1 - A basic physical Model of X-Ray Scattering for improved X-Ray Fluoescence Analysis - Polychromatic X-Ray Tube Excitation T2 - ICXOM20, 20th International Congress on X-ray Optics and Microanalysis T2 - ICXOM20, 20th International Congress on X-ray Optics and Microanalysis CY - Karlsruhe, Germany DA - 2009-09-14 PY - 2009 AN - OPUS4-19534 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -