TY - CONF A1 - Hodoroaba, Vasile-Dan A1 - Rades, Steffi A1 - Salge, T. A1 - Ortel, Erik A1 - Mielke, Johannes A1 - Wirth, Thomas A1 - Kalbe, Henryk A1 - Unger, Wolfgang T1 - Morphological and compositional high-resolution imaging of individual nanoparticles by analytical methods using excitation with a scanning electron beam T2 - IUVSTA Workshop: Nanoparticle concentration, chemistry and interfaces CY - Peckforton Castle, Cheshire, UK DA - 2015-04-20 PY - 2015 AN - OPUS4-34185 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan A1 - Mielke, Johannes T1 - Technique evaluation and method development for the characterization and classification of materials according to the EC nano-definition T2 - Public NanoDefine Workshop: Characterization and classification of materials according to the EC nano-definiton CY - Brussels, Belgium DA - 2015-06-17 PY - 2015 AN - OPUS4-33883 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan A1 - Holzweber, Markus A1 - Ortel, Erik A1 - Unger, Wolfgang T1 - What about ionic liquids as a "hot" reference material candidate to check your EDS below 1 keV? T2 - Microscopy & Microanalysis 2015 CY - Portland, Oregon, USA DA - 2015-08-02 PY - 2015 AN - OPUS4-33880 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan A1 - Rades, Steffi A1 - Ortel, Erik A1 - Mielke, Johannes A1 - Salge, T. A1 - Schmidt, R. T1 - Characterization of nanoparticles by means of high-resolution SEM/EDS T2 - EMAS 2015 - 14th European Workshop on Modern Developments and applications in microbeam analysis CY - Portoroz, Slovenia DA - 2015-05-03 PY - 2015 AN - OPUS4-33250 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan A1 - Terborg, R. A1 - Procop, M. T1 - Determination of the Collection Solid Angle of EDS Detectors T2 - EMAS 2015 - 14th European Workshop on Modern Developments and applications in microbeam analysis CY - Portoroz, Slovenia DA - 2015-05-03 PY - 2015 AN - OPUS4-33249 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan A1 - Terborg, R. A1 - Procop, M. T1 - Determination of the Collection Solid Angle of EDS Detectors T2 - EMAS 2015 - 14th European Workshop on Modern Developments and applications in microbeam analysis CY - Portoroz, Slovenia DA - 2015-05-03 PY - 2015 AN - OPUS4-33248 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan A1 - Salge, T. A1 - Terborg, R. A1 - Ball, A. D. A1 - Broad, G. R. A1 - Kearsley, A. T. A1 - Jones, C. G. A1 - Smith, C. A1 - Rades, Steffi T1 - Advanced SEM/EDS analysis using an Annular Silicon Drift Detector (SDD): Applications in Nano, LIfe, Earth and Planetary Sciences below Micrometer Scale T2 - EMAS 2015 - 14th European Workshop on Modern Developments and applications in microbeam analysis CY - Portoroz, Slovenia DA - 2015-05-03 PY - 2015 AN - OPUS4-33247 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan A1 - Salge, T. A1 - Ball, A. D. A1 - Broad, G. R. A1 - Jones, C. G. A1 - Ma, X. A1 - Smith, C. A1 - Kearsley, A. T. A1 - Rades, Steffi A1 - Musat, N. A1 - Falke, M. A1 - Hansen, B. A1 - Terborg, R. T1 - SEM/EDS analysis examples below the nanometre scale using an annular SDD: Applications in nano, life, cultural heritage, earth and planetary sciences T2 - EMAS 2015 - 14th European Workshop on Modern Developments and applications in microbeam analysis CY - Portoroz, Slovenia DA - 2015-05-03 PY - 2015 AN - OPUS4-33246 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan A1 - Mielke, Johannes A1 - Rades, Steffi A1 - Ortel, Erik A1 - Salge, T. T1 - Eds elemental selectivity with respect to nanoparticle analysis T2 - EMAS 2015 CY - Portoroz, Slovenia DA - 2015-05-03 PY - 2015 AN - OPUS4-33149 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan A1 - Rades, Steffi A1 - Ortel, Erik A1 - Salge, T. A1 - Mielke, Johannes T1 - Eds elemental selectivity with respect to nanoparticle analysis T2 - EMAS 2015 CY - Portoroz, Slovenia DA - 2015-05-03 PY - 2015 AN - OPUS4-33148 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -