TY - CONF A1 - Hodoroaba, Vasile-Dan A1 - Lippitz, Judith A1 - Kraft, Benedikt A1 - Rackwitz, Vanessa A1 - Terborg, R. T1 - Performance check of EDS X-ray spectrometers; extension to high count rates T2 - EMAS 2011, 12th european workshop on modern developments and applications in microbeam analysis T2 - EMAS 2011, 12th european workshop on modern developments and applications in microbeam analysis CY - Angers, France DA - 2011-05-15 PY - 2011 AN - OPUS4-23550 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan A1 - Kraft, B. A1 - Terborg, R. T1 - Performance Check of EDS X-Ray spectrometers - Extensions to high Count Rates T2 - PRORA 2011 Fachtagung Prozessnahe Röntgenanalytik T2 - PRORA 2011 Fachtagung Prozessnahe Röntgenanalytik CY - Berlin, Germany DA - 2011-11-24 PY - 2011 AN - OPUS4-24922 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan A1 - Lippitz, Andreas A1 - Kraft, Benedikt A1 - Rackwitz, Vanessa A1 - Terborg, R. T1 - Performance Check of EDS X-Ray Spectrometers - Extension to high Count Rates T2 - Microscopy & Microanalysis 2011 Meeting T2 - Microscopy & Microanalysis 2011 Meeting CY - Nashville, TN, USA DA - 2011-08-07 PY - 2011 AN - OPUS4-24132 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan A1 - Rackwitz, Vanessa A1 - Ostermann, Markus T1 - Nachweisgrenzen der µ-RFA mit REM/EDS für RoHS-Elemente T2 - µ-RFA-Workshop, BAM T2 - µ-RFA-Workshop, BAM CY - Berlin, Germany DA - 2011-09-22 PY - 2011 AN - OPUS4-24462 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Evaluation of the performance of energy dispersive X-ray spectrometers - ISO 15632 and more T2 - IUMAS, 5th International Union of Microbeam Analysis Society T2 - IUMAS, 5th International Union of Microbeam Analysis Society CY - Seoul, South Korea DA - 2011-05-22 PY - 2011 AN - OPUS4-23776 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan A1 - Marinenko, R. A1 - Small, J. A1 - Unger, Wolfgang T1 - EPMA on Copper-Gold Alloys - A CCQM/SAWG Pilot Study T2 - Microscopy and Microanalysis 2011 Meeting T2 - Microscopy and Microanalysis 2011 Meeting CY - Nashville, TN, USA DA - 2011-08-07 PY - 2011 AN - OPUS4-24136 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan A1 - Kim, K. Y. A1 - Unger, Wolfgang T1 - ED-EPMA Measurements of elemental Composition and Thickness of Fe-Ni Alloy Films T2 - IUMAS, 5th International Union of Microbeam Analysis Societies T2 - IUMAS, 5th International Union of Microbeam Analysis Societies CY - Seoul, South Korea DA - 2011-05-22 PY - 2011 AN - OPUS4-23774 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan A1 - Kühn, Julius A1 - Linke, S. A1 - Moritz, W. A1 - Unger, Wolfgang T1 - Characterization of Pd-Ni-Co Alloy Thin Films by ED-EPMA and Data Reduction by the STRATAGEM Software T2 - IUMAS, 5th International Union of Microbeam Analysis Societies T2 - IUMAS, 5th International Union of Microbeam Analysis Societies CY - Seoul, South Korea DA - 2011-05-22 PY - 2011 AN - OPUS4-23779 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan A1 - Marinenko, R. A1 - Small, J. T1 - CCQM-P130: A Joint NIST/BAM Pilot Study for ED- and WD-EPMA T2 - Surface Analysis Working Group (SAWG) Meeting, CCQM T2 - Surface Analysis Working Group (SAWG) Meeting, CCQM CY - Sèvres, France DA - 2011-04-12 PY - 2011 AN - OPUS4-23567 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Bestimmung der ED-Röntgenspektrometer-Eigenschaften mit dem BAM-Testmaterial EDS-TM001 T2 - µ-RFA-Workshop, BAM T2 - µ-RFA-Workshop, BAM CY - Berlin, Germany DA - 2011-09-22 PY - 2011 AN - OPUS4-24460 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan A1 - Salge, T. A1 - Terborg, R. A1 - Rackwitz, Vanessa T1 - Advanced Elemental Analysis with ED-EPMA, WE-EPMA and µ-XRF at a SEM T2 - IUMAS, 5th International Union of Microbeam Analysis Societies T2 - IUMAS, 5th International Union of Microbeam Analysis Societies CY - Seoul, South Korea DA - 2011-05-22 PY - 2011 AN - OPUS4-23778 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan A1 - Salge, T. A1 - Terborg, R. A1 - Rackwitz, Vanessa T1 - Advanced Elemental Analysis with ED-EPMA, WD-EPMA and µ-XRF at a SEM T2 - Microscopy & Microanalysis 2011 Meeting T2 - Microscopy & Microanalysis 2011 Meeting CY - Nashville, TN, USA DA - 2011-08-07 PY - 2011 AN - OPUS4-24149 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan A1 - Procop, Mathias A1 - Unger, Wolfgang T1 - A Test Material and quick Procedure for Checking the Performance of X-Ray Spectrometers attached to a SEM T2 - ECASIA '11 14th European Conference on Application of Surface and Interface Analysis T2 - ECASIA '11 14th European Conference on Application of Surface and Interface Analysis CY - Cardiff, Wales DA - 2011-09-04 PY - 2011 AN - OPUS4-24241 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -