TY - CONF A1 - Müller, Bernd R. A1 - Lange, Axel A1 - Hentschel, Manfred P. A1 - Kupsch, Andreas ED - Kastner, J. T1 - A comfortable procedure for correcting X-ray detector backlight T2 - Conference on industrial computed tomography (Proceedings) T2 - Conference on industrial computed tomography CY - Wels, Austria DA - 2012-09-19 KW - X-ray detector backlighting KW - Radiography KW - Fluorescent screen KW - Diffuse background KW - Computed tomography PY - 2012 SN - 978-3-8440-1281-1 SN - 1610-4773 SP - 151 EP - 157 PB - Shaker CY - Aachen AN - OPUS4-26768 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Lange, Axel A1 - Kupsch, Andreas A1 - Hentschel, Manfred P. A1 - Müller, Bernd R. T1 - Straightforward correction of X-ray detector backlighting T2 - 18th WCNDT - World conference on nondestructive testing (Proceedings) N2 - A novel approach to strongly suppress artifacts in radiography and computed tomography caused by the effect of diffuse background signals ('backlighting') of 2D X-ray detectors is suggested. Depending on the detector geometry the mechanism may be different, either based on the optical scattering of the fluorescent screen materials into optical detection devices or Compton or X-ray fluorescence scattering by the detector components. Consequently, these erroneous intensity portions result in locally different violations of Lambert Beer’s law in single projections (radiographs) as function of the detector area coverage and the magnitude of the attenuation. The absorption of multiple metal sheets is investigated by monochromatic synchrotron radiation, thus excluding beam hardening. The proposed correction procedure simply requires the individual subtraction of one and the same fraction of the primary and transmitted mean intensity, as a constant (non-local) scattering mechanism is assumed. T2 - 18th WCNDT - World conference on nondestructive testing CY - Durban, South Africa DA - 2012-04-16 KW - X-ray detector backlighting KW - Radiography KW - Fluorescent screen KW - Diffuse background KW - Computed tomography PY - 2012 UR - http://www.ndt.net/article/wcndt2012/papers/205_wcndtfinal00205.pdf SN - 978-0-620-52872-6 SP - 1 EP - 8(?) AN - OPUS4-25835 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Kupsch, Andreas A1 - Lange, Axel A1 - Hentschel, Manfred P. A1 - Lück, S. A1 - Schmidt, V. A1 - Hilger, A. A1 - Garcia-Moreno, F. A1 - Manke, I. T1 - Reconstruction of limited view tomography data by DIRECTT T2 - 18th WCNDT - World conference on nondestructive testing (Proceedings) N2 - Incomplete tomographic data sets such as limited view (missing wedge) data represent a well-known challenge for reconstruction algorithms, since they unavoidably lead to substantial image artefacts. Such data sets may occur in industrial computed tomography of limited access (e.g. extended components, fixed objects), directional opacity, limited sample life time or laminographic set-up. We present strategies to effectively suppress the typical elongation artefacts (e.g. lemon-like deformed pores) by our iterative algorithm DIRECTT which offers the opportunity to vary the versatile reconstruction parameters within each cycle. Those strategies are applied to experimental data obtained from metallic foams as well as model simulations. Comparison is drawn to state-ofthe- art techniques (filtered backprojection and algebraic techniques). Further reference is made to reconstructions of complete data sets serving as gold standards. For quantitative assessment of the reconstruction quality adapted techniques based on spatial statistics are introduced. T2 - 18th WCNDT - World conference on nondestructive testing CY - Durban, South Africa DA - 2012-04-16 KW - Computed tomography KW - Limited tomographic data KW - Iterative reconstruction KW - DIRECTT KW - Limited view KW - Missing wedge KW - Spatial statistics PY - 2012 UR - http://www.ndt.net/article/wcndt2012/papers/208_wcndtfinal00208.pdf SN - 978-0-620-52872-6 SP - 1 EP - 9(?) AN - OPUS4-25834 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -