TY - JOUR A1 - Weigel, W. A1 - Unger, Wolfgang A1 - Graf, Nora A1 - Gross, Thomas A1 - Wirth, Thomas T1 - Surface Chemical Analysis of DNA Microarrays - Application of XPS and ToF-SIMS for Surface Chemical Imaging on the µm Scale JF - BioForum Europe KW - Microarrays KW - Oberflächenanalytik KW - XPS KW - ToF-SIMS KW - Chemical imaging PY - 2008 SN - 1611-597X VL - 12 IS - 10 SP - 14 EP - 16 PB - GIT-Verlag CY - Darmstadt AN - OPUS4-18307 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Senoner, Mathias A1 - Unger, Wolfgang T1 - Chemical imaging in the nanoworld - A certified reference material for chemical imaging at the nanoscale JF - NanoS : the nanotech journal KW - Reference material KW - Nanoscale KW - ToF-SIMS KW - Chemical imaging PY - 2008 SN - 1614-7847 SN - 1614-7855 VL - 01 SP - 34 EP - 38 PB - Wiley-VCH CY - Weinheim AN - OPUS4-17392 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -