TY - CONF A1 - Hodoroaba, Vasile-Dan A1 - Rackwitz, Vanessa A1 - Reuter, Dirk T1 - X-Ray Scattering and its Benefit for X-Ray Spectrometry at the SEM T2 - Microscopy & Microanalysis T2 - Microscopy & Microanalysis CY - Richmond, VA, USA DA - 2009-07-26 PY - 2009 AN - OPUS4-19441 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan A1 - Holzweber, Markus A1 - Ortel, Erik A1 - Unger, Wolfgang T1 - What about ionic liquids as a "hot" reference material candidate to check your EDS below 1 keV? T2 - Microscopy & Microanalysis 2015 T2 - Microscopy & Microanalysis 2015 CY - Portland, Oregon, USA DA - 2015-08-02 PY - 2015 AN - OPUS4-33880 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Welcoming elemental analysis of nanoparticles by EDX in combination with high-resolution electron microscopy in transmission mode T2 - 13th European Workshop on modern developments and applications in microbeam analysis (EMAS 2013) T2 - 13th European Workshop on modern developments and applications in microbeam analysis (EMAS 2013) CY - Oporto, Portugal DA - 2013-05-12 PY - 2013 AN - OPUS4-28510 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan A1 - Hoffmann, V. T1 - Verbesserung analytischer GD-OES-Parameter durch Zumischen von Wasserstoff sowie Untersuchungen von Beschichtungen als Kandidaten für H-ZRM T2 - 10. Deutsches Anwenndertreffen "Analytische Glimmladungs-Spektrometrie" T2 - 10. Deutsches Anwenndertreffen "Analytische Glimmladungs-Spektrometrie" CY - Lüdenscheid, Germany DA - 2003-09-15 PY - 2003 AN - OPUS4-5006 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan A1 - Procop, Mathias T1 - Simulation der Spektren von Röntgenröhren des Typs MCBM 50 im REM T2 - Fachtagung Prozessnahe Röntgenanalytik (PRORA 2005) T2 - Fachtagung Prozessnahe Röntgenanalytik (PRORA 2005) CY - Berlin, Germany DA - 2005-11-24 PY - 2005 AN - OPUS4-11325 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan A1 - Lippitz, Judith A1 - Kraft, Benedikt A1 - Rackwitz, Vanessa A1 - Terborg, R. T1 - Performance check of EDS X-ray spectrometers; extension to high count rates T2 - EMAS 2011, 12th european workshop on modern developments and applications in microbeam analysis T2 - EMAS 2011, 12th european workshop on modern developments and applications in microbeam analysis CY - Angers, France DA - 2011-05-15 PY - 2011 AN - OPUS4-23550 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan A1 - Kraft, B. A1 - Terborg, R. T1 - Performance Check of EDS X-Ray spectrometers - Extensions to high Count Rates T2 - PRORA 2011 Fachtagung Prozessnahe Röntgenanalytik T2 - PRORA 2011 Fachtagung Prozessnahe Röntgenanalytik CY - Berlin, Germany DA - 2011-11-24 PY - 2011 AN - OPUS4-24922 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan A1 - Lippitz, Andreas A1 - Kraft, Benedikt A1 - Rackwitz, Vanessa A1 - Terborg, R. T1 - Performance Check of EDS X-Ray Spectrometers - Extension to high Count Rates T2 - Microscopy & Microanalysis 2011 Meeting T2 - Microscopy & Microanalysis 2011 Meeting CY - Nashville, TN, USA DA - 2011-08-07 PY - 2011 AN - OPUS4-24132 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan A1 - Procop, Mathias T1 - Performance Check of a Wavelength Dispersive X-Ray Spectrometer (WDS) attached to a SEM T2 - Microscopy & Microanalysis T2 - Microscopy & Microanalysis CY - Richmond, VA, USA DA - 2009-07-26 PY - 2009 AN - OPUS4-19442 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan A1 - Terborg, R. A1 - Falke, M. A1 - Käppel, A. T1 - On the Characterization of the Geometrical Collection Efficiency of Modern EDS Systems T2 - Microscopy and Microanalysis M&M 2014 T2 - Microscopy and Microanalysis M&M 2014 CY - Hartford, CT, USA DA - 2014-08-02 PY - 2014 AN - OPUS4-31468 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan A1 - Guilherme, A. A1 - Benemann, Sigrid A1 - Coroado, J. A1 - Carvalho, M.L. T1 - Morphological and Compositional Features of Portuguese Polychrome Glazed Pottery Investigated by SEM/EDX - Hints about the Manufacturing Processes T2 - Microscopy and Microanalysis 2013 T2 - Microscopy and Microanalysis 2013 CY - Indianapolis, IN, USA DA - 2013-08-04 PY - 2013 AN - OPUS4-28941 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan A1 - Procop, Mathias A1 - Bjeoumikhov, A. A1 - Eggert, F. A1 - Wedell, R. T1 - Kombination von Elektronenstrahl-Mikroanalyse und Röntgenfluoreszenzanalyse im Rasterelektronenmikroskop T2 - 36. EDO Herbsttagung T2 - 36. EDO Herbsttagung CY - Wuppertal, Germany DA - 2006-10-04 PY - 2006 AN - OPUS4-13192 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan A1 - Holzweber, Markus A1 - Unger, Wolfgang T1 - Ionic liquids as reference material: A "hot" candidate to check your EDS below 1 keV T2 - 16th European Conference on Applications of Surface and Interface Analysis (ECASIA´15) T2 - 16th European Conference on Applications of Surface and Interface Analysis (ECASIA´15) CY - Granada, Spain DA - 2015-09-28 PY - 2015 AN - OPUS4-34702 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan A1 - Köster, M. T1 - GDS-Forum Website, freie Software für GDS-Anwender, Leitthema-Vorstellung, Anregungen T2 - 10. Deutsches Anwenndertreffen "Analytische Glimmladungs-Spektrometrie" T2 - 10. Deutsches Anwenndertreffen "Analytische Glimmladungs-Spektrometrie" CY - Lüdenscheid, Germany DA - 2003-09-15 PY - 2003 AN - OPUS4-5007 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan A1 - Hoffmann, V. A1 - Paatsch, Wolfgang A1 - Bohne, W. A1 - Lindner, S. A1 - Röhrich, J. A1 - Strub, E. T1 - Erste Ergebnisse bei der Suche nach geeigneten Kandidaten für die Herstellung von CRM für die Bestimmung von Wasserstoff in Festkörpern T2 - 11. Deutsches Anwendertreffen "Analytische Glimmladungs-Spektrometrie" T2 - 11. Deutsches Anwendertreffen "Analytische Glimmladungs-Spektrometrie" CY - Dresden, Germany DA - 2004-09-13 PY - 2004 AN - OPUS4-5980 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan A1 - Marinenko, R. A1 - Small, J. A1 - Unger, Wolfgang T1 - EPMA on Copper-Gold Alloys - A CCQM/SAWG Pilot Study T2 - Microscopy and Microanalysis 2011 Meeting T2 - Microscopy and Microanalysis 2011 Meeting CY - Nashville, TN, USA DA - 2011-08-07 PY - 2011 AN - OPUS4-24136 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan A1 - Mielke, Johannes A1 - Rades, Steffi A1 - Ortel, Erik A1 - Salge, T. T1 - Eds elemental selectivity with respect to nanoparticle analysis T2 - EMAS 2015 T2 - EMAS 2015 CY - Portoroz, Slovenia DA - 2015-05-03 PY - 2015 AN - OPUS4-33149 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan A1 - Kim, K. Y. A1 - Unger, Wolfgang T1 - ED-EPMA Measurements of elemental Composition and Thickness of Fe-Ni Alloy Films T2 - IUMAS, 5th International Union of Microbeam Analysis Societies T2 - IUMAS, 5th International Union of Microbeam Analysis Societies CY - Seoul, South Korea DA - 2011-05-22 PY - 2011 AN - OPUS4-23774 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan A1 - Terborg, R. A1 - Procop, M. T1 - Determination of the Collection Solid Angle of EDS Detectors T2 - EMAS 2015 - 14th European Workshop on Modern Developments and applications in microbeam analysis T2 - EMAS 2015 - 14th European Workshop on Modern Developments and applications in microbeam analysis CY - Portoroz, Slovenia DA - 2015-05-03 PY - 2015 AN - OPUS4-33249 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan A1 - Guilherme, A. A1 - Pessanha, S. A1 - Bendaoud, R. A1 - Zegzouti, A. A1 - Elaatmani, M. A1 - Coroado, J. A1 - Carvalho, M.L. T1 - Compositional and morphological features of Moroccan Zelli by XRF and SEM/EDX T2 - European Conference on x-Ray Spectrometry (EXRS) T2 - European Conference on x-Ray Spectrometry (EXRS) CY - Bologna, Italy DA - 2014-06-15 PY - 2014 AN - OPUS4-30966 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan A1 - Kühn, Julius A1 - Linke, S. A1 - Moritz, W. A1 - Unger, Wolfgang T1 - Characterization of Pd-Ni-Co Alloy Thin Films by ED-EPMA and Data Reduction by the STRATAGEM Software T2 - IUMAS, 5th International Union of Microbeam Analysis Societies T2 - IUMAS, 5th International Union of Microbeam Analysis Societies CY - Seoul, South Korea DA - 2011-05-22 PY - 2011 AN - OPUS4-23779 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan A1 - Terborg, R. A1 - Falke, M. A1 - Käppel, A. T1 - Characterization of EDS Systems with respect to the Geometrical Collection Efficiency T2 - 18th International Microscopy Congress IMC 2014 T2 - 18th International Microscopy Congress IMC 2014 CY - Prague, Czech Republic DA - 2014-09-07 PY - 2014 AN - OPUS4-31914 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan A1 - Rackwitz, Vanessa T1 - An Attempt of Exploiting the Compton-to-Rayleigh Intensity Ratio for Improved Analysis with µXRF at a SEM T2 - Microscopy and Microanalysis 2012 T2 - Microscopy and Microanalysis 2012 CY - Phoenix, AZ, USA DA - 2012-07-29 PY - 2012 AN - OPUS4-26308 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan A1 - Salge, T. A1 - Terborg, R. A1 - Ball, A. D. A1 - Broad, G. R. A1 - Kearsley, A. T. A1 - Jones, C. G. A1 - Smith, C. A1 - Rades, Steffi T1 - Advanced SEM/EDS analysis using an Annular Silicon Drift Detector (SDD): Applications in Nano, LIfe, Earth and Planetary Sciences below Micrometer Scale T2 - EMAS 2015 - 14th European Workshop on Modern Developments and applications in microbeam analysis T2 - EMAS 2015 - 14th European Workshop on Modern Developments and applications in microbeam analysis CY - Portoroz, Slovenia DA - 2015-05-03 PY - 2015 AN - OPUS4-33247 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan A1 - Benemann, Sigrid A1 - Motzkus, C. A1 - Macé, T. A1 - Palmas, P. A1 - Vaslin-Reimann, S. T1 - Advanced Analysis of spherical SiO2 Aerosol Nanoparticles with a high-resolution SEM T2 - Microscopy and Microanalysis 2012 T2 - Microscopy and Microanalysis 2012 CY - Phoenix, AZ, USA DA - 2012-07-29 PY - 2012 AN - OPUS4-26307 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan A1 - Benemann, Sigrid A1 - Motzkus, C. A1 - Macé, T. A1 - Palmas, P. A1 - Vaslin-Reimann, S. T1 - Advanced Analysis of spherical SiO2 Aerosol Nanoparticles with a high-resolution SEM T2 - Nano-Additive T2 - Nano-Additive CY - Berlin, Germany DA - 2012-11-19 PY - 2012 AN - OPUS4-27152 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan A1 - Procop, Mathias A1 - Unger, Wolfgang T1 - A Test Material and quick Procedure for Checking the Performance of X-Ray Spectrometers attached to a SEM T2 - ECASIA '11 14th European Conference on Application of Surface and Interface Analysis T2 - ECASIA '11 14th European Conference on Application of Surface and Interface Analysis CY - Cardiff, Wales DA - 2011-09-04 PY - 2011 AN - OPUS4-24241 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan A1 - Reuter, Dirk T1 - A basic physical Model of X-Ray Scattering for improved X-Ray Fluoescence Analysis - Polychromatic X-Ray Tube Excitation T2 - ICXOM20, 20th International Congress on X-ray Optics and Microanalysis T2 - ICXOM20, 20th International Congress on X-ray Optics and Microanalysis CY - Karlsruhe, Germany DA - 2009-09-14 PY - 2009 AN - OPUS4-19534 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -