TY - CONF A1 - Peplinski, Burkhard A1 - Wenzel, J. A1 - Schultze, Dietrich T1 - Certification of the phase composition of a BAM reference material by an interlaboratory comparison applying X-ray and neutron diffraction T2 - Symposium "Reference Materials for Technologies in the New Millenium" T2 - Symposium "Reference Materials for Technologies in the New Millenium" CY - Berlin, BAM, Germany DA - 2000-05-22 PY - 2000 SP - 1(?) EP - 13(?) AN - OPUS4-12600 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Peplinski, Burkhard A1 - Schultze, Dietrich A1 - Schierhorn, Eike A1 - Schulz, Gert ED - Cernik, R. T1 - Improved X-ray powder diffraction data for the disordered n-Cu6Sn5 alloy phase T2 - Proceedings of the fourth European powder diffraction conference T2 - 4th European Powder Diffraction Conference CY - Chester, England, UK DA - 1995-07-10 PY - 1996 SN - 0-87849-744-7 SN - 0255-5476 SP - 577 EP - 582 PB - Trans Tech Publ. CY - Zuerich-Uetikon AN - OPUS4-12599 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -