TY - CONF A1 - Nolze, Gert A1 - Winkelmann, Aimo A1 - Hielscher, R. A1 - Han, M. A1 - Li, L. A1 - Payton, E. T1 - EBSD: more reliable and accurate N2 - The presentation discusses numerous new approaches in order to increase precision and accuracy of electrom backscatter diffraction measurements. T2 - 1st EBSD Workshop CY - Belo Horizonte, Brazil DA - 17.09.2015 KW - Orientation mapping KW - Electron backscatter diffraction KW - Lattice parameter determination KW - Orientation precision KW - Orientation noise PY - 2015 AN - OPUS4-37797 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -