TY - CONF A1 - Heilmann, Maria A1 - Hodoroaba, Vasile-Dan T1 - Project 16 Measurement of (relative) number concentration of bimodal silica nanoparticles including deposition from liquid suspension N2 - The progress of the VAMAS Project 16 "Measurement of (relative) number concentration of bimodal silica nanoparticles including deposition from liquid suspension" in TWA 34 Nanoparticle Populations is presented. Follwowing points are discusssed: - Validate the performance of imaging methods to measure the relative number concentration • electron microscopy (SEM, TEM) and atomic force microscopy (AFM) • two modes of bimodal (30 and 60 nm) silica nanoparticles - Validate the performance of small angle X-ray scattering (SAXS) for the traceable measurement of the number concentration of the two modes. T2 - VAMAS Regional Workshop 2023 - What can pre-normative research do for industry? CY - Online meeting DA - 24.01.2023 KW - Nanoparticles KW - VAMAS KW - Inter-laboratory comparison KW - SiO2 KW - Electron microscopy KW - AFM PY - 2023 UR - https://www.bam.de/Content/EN/Events/2023/2023-01-24-vamas-regional-workshop.html AN - OPUS4-57221 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Liaison of ISO/TC 202 Microbeam Analysis with VAMAS/TWA 37 Quantitative Microstructural Analysis N2 - The progress in activities on Microbeam Analysis under VAMAS/TWA 37 is reviewed. Particularly the liaison with the new projects within the ISO technical committee TC 202 is presented and discussed with respect to the identification and launching corresponding VAMAS projects. The ongoing project "FIB sample processing for TEM" is presented in detail. T2 - 30th Meeting of ISO/TC 202 Microbeam Analysis CY - Berlin, Germany DA - 22.11.2023 KW - VAMAS KW - ISO/TC 202 KW - Microbeam Analysis KW - Standardisation KW - Electron microscopy KW - FIB PY - 2023 AN - OPUS4-58984 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Competence Center nano@BAM Welcomes ISO/TC 229 Meeting in Berlin N2 - The Competence Center nano@BAM is presented. Examples directly related to the activities of the ISO Technical Committee TC 229 Nanotechnologies as well as BAM projects on nano reference measurement procedures, nano reference materials and nano reference data sets are showed. T2 - The 32nd ISO/TC 229 IEC/TC 113 JWG2 General Meeting CY - Berlin, Germany DA - 06.11.2023 KW - ISO/TC 229 Nanotechnologies KW - Nanoparticles KW - Nano@BAM KW - Reference materials KW - Reference data KW - Reference procedures PY - 2023 AN - OPUS4-58814 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Accurate Measurement of Size of Graphene Oxide Flakes by Scanning Electron Microscopy (SEM) N2 - Accurate characterisation of the morphology (size) and chemistry of graphene-related 2D materials (GR2M) is key in understanding their extraordinary functionalities. Hence, not only the tailoring of these functionalities aiming at applications of increased-performance becomes possible, but also the correlation of the physico-chemical properties with the understanding of the potential toxicity eventually enables a safe and sustainable development of the GR2M for new applications. Whilst AFM and Raman Spectroscopy are recommended to measure the thickness of GO flakes, Scanning Electron Microscopy (SEM) is the most suited method to assess their lateral size, which varies between tens of µm down to below 100 nm. In this paper, procedures for the accurate determination of lateral size of graphene oxide (GO) flakes by SEM are presented. The prerequisite for accurate flake size analysis is the proper sample preparation, i.e. deposition of ideally isolated flakes on a substrate, with the flakes being unfolded, non-overlapped, parallel with the substrate, and having a high coverage density. Examples of optimum image caption conditions and image analysis procedures will be presented. The size descriptors and their measurement are described in the context of the corresponding analysis approach: i) length and width of the flakes with a quick and rough, but robust procedure, and ii) exact contouring of the flakes as part of a highly accurate, but more time-consuming measurement approach. The possibility of application of automated image analysis is discussed as the alternative to the manual flakes analysis. T2 - Graphene 2023 CY - Manchester, UK DA - 27.07.2023 KW - Graphene oxide KW - SEM KW - Size KW - Standardisation PY - 2023 UR - https://www.grapheneconf.com/2023/index.php AN - OPUS4-57910 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - VAMAS Regional Report Germany N2 - Regional standardisation activities and how VAMAS can help in any way to promote activities are reported. Activities related to organisational updates, government initiatives/priorities (especially related to Materials), details of any strategy documents publicly available, networks within Germany and how we engage are presented. T2 - Versailles Project on Advanced Materials and Standards (VAMAS) 48th Steering Committee Meeting CY - New Delhi, India DA - 09.10.2023 KW - VAMAS KW - Standardisation PY - 2023 UR - https://www.nplindia.org/index.php/amcsnzt_2023/ AN - OPUS4-58572 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Transmission and Scanning Electron Microscopy (SEM/TEM) N2 - Die Bestimmung der Nanopartikelgrößen- und -formverteilung nach OECD TG 125 mit der Transmission and Scanning Electron Microscopy (SEM/TEM) wird punktuell vorgestellt: - Generelles Messprinzip - Beispiele - Korrelative Mikroskopie - Welchen Durchmesser misst die Methode? - Welche Partikel kann diese Methode messen? - Welche Informationen kann diese Methode liefern? - Wo stößt die Methode an ihre Grenzen? - Implementierung und Datenauswertung, - Reporting. Anschließend wurde eine Q&A-Session für die Imaging-Methoden organisiert. T2 - Digital Info-Days „Nano or not Nano“ - Measuring according to OECD Test Guideline No. 125 CY - Online meeting DA - 16.02.2023 KW - Nanoparticles KW - OECD TG 125 KW - Partikelgrößenverteilung KW - Elektronenmikroskopie PY - 2023 UR - https://www.bam-akademie.de/kursangebot/kurs/digitale-info-tage-%E2%80%9Enano-or-not-nano%E2%80%9C-19.html AN - OPUS4-57217 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - SEM/EDS as THE Versatile and Powerful Tool for Micro and Nano Analysis N2 - The basic principles of generation of electrons and X-rays and the operation of SEM/EDS instruments are presented. Examples, recent successes and challenges in the analysis of nano-structures are given. Multi-method analytical approaches with the focus on imaging the nanoscale are highlighted. Details on the sample preparation and persepective on the automated analysis (sample preparation, measurement, data analyis and storage) are given. Metrological aspects, standardisation, and reference materials are also emphasized by examples. T2 - Training Course Metrological Determination of Micro and Nano Contaminants in Food CY - Berne, Switzerland DA - 05.09.2023 KW - SEM KW - EDS KW - Microanalysis KW - Nanoanalysis KW - Imaging PY - 2023 UR - https://www.sem.admin.ch/metas/en/home/dl/kurs_uebersicht/micro_nano_contaminants_in_food.html AN - OPUS4-58188 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - VAMAS Regional Workshop in Germany N2 - An overview on the VAMAS technical working areas (TWA) and projects where Germany is active has been given. The role of VAMAS as an international pre-standardisation platform, including its intense collaboration with international bodies ISO, CEN, OECD and CCQM and national organizations like DIN has been highlighted. T2 - VAMAS Regional Workshop 2023 - What can pre-normative research do for industry? CY - Online meeting DA - 24.01.2023 KW - VAMAS KW - Advanced materials KW - Inter-laboratory comparisons KW - Regional workshop PY - 2023 UR - https://www.bam-akademie.de/kursangebot/kurs/vamas-regional-workshop-2023-23.html?lang=en AN - OPUS4-57281 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Quantitative Microstructural Analysis - VAMAS TWA 37 & Liaison with ISO/TC 202 Microbeam Analysis N2 - The progress in activities on Microbeam Analysis under VAMAS/TWA 37 is reviewed. Particularly the liaison with the new projects within the ISO technical committee TC 202 is presented and discussed with respect to the identification and launching corresponding VAMAS projects. The ongoing project "FIB sample processing for TEM" is presented in detail. T2 - Versailles Project on Advanced Materials and Standards (VAMAS) 48th Steering Committee Meeting CY - New Delhi, India DA - 9.10.2023 KW - TEM KW - FIB KW - EBSD KW - Sample preparation KW - VAMAS KW - Standardisation KW - Interlaboratory comparisons PY - 2023 UR - https://www.nplindia.org/index.php/amcsnzt_2023/ AN - OPUS4-58538 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Heilmann, Maria A1 - Hodoroaba, Vasile-Dan T1 - Project 15 Measurement of particle size and shape distribution of bipyramidal titania including deposition from liquid suspension N2 - The progress in the VAMAS Project #15" Measurement of particle size and shape distribution of bipyramidal titania including deposition from liquid suspension" within TWA 34 Nanoparticle Populations is presented with highlight of the following points: - Determine and compare particle size and shape distribution by means of: • electron microscopy (SEM, TEM, STEM-in-SEM) • atomic force microscopy (AFM) • small angle X-ray scattering (SAXS) - Determine uncertainty induced by deposition protocol from liquid suspension with comparison to known values from a prior ILC with already deposited nanoparticles on TEM grids. - Provide comparative validation of protocols for the techniques other than TEM. T2 - VAMAS Regional Workshop 2023 CY - Online meeting DA - 24.01.2023 KW - Nanoparticles KW - VAMAS KW - Electron microscopy KW - AFM KW - SAXS KW - TiO2 PY - 2023 UR - https://www.bam.de/Content/EN/Events/2023/2023-01-24-vamas-regional-workshop.html AN - OPUS4-57220 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -