TY - CONF A1 - Hodoroaba, Vasile-Dan A1 - Holzweber, Markus A1 - Unger, Wolfgang T1 - Ionic liquids as reference material: A "hot" candidate to check your EDS below 1 keV T2 - 16th European Conference on Applications of Surface and Interface Analysis (ECASIA´15) T2 - 16th European Conference on Applications of Surface and Interface Analysis (ECASIA´15) CY - Granada, Spain DA - 2015-09-28 PY - 2015 AN - OPUS4-34702 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan A1 - Holzweber, Markus A1 - Ortel, Erik A1 - Unger, Wolfgang T1 - What about ionic liquids as a "hot" reference material candidate to check your EDS below 1 keV? T2 - Microscopy & Microanalysis 2015 T2 - Microscopy & Microanalysis 2015 CY - Portland, Oregon, USA DA - 2015-08-02 PY - 2015 AN - OPUS4-33880 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan A1 - Terborg, R. A1 - Procop, M. T1 - Determination of the Collection Solid Angle of EDS Detectors T2 - EMAS 2015 - 14th European Workshop on Modern Developments and applications in microbeam analysis T2 - EMAS 2015 - 14th European Workshop on Modern Developments and applications in microbeam analysis CY - Portoroz, Slovenia DA - 2015-05-03 PY - 2015 AN - OPUS4-33249 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan A1 - Salge, T. A1 - Terborg, R. A1 - Ball, A. D. A1 - Broad, G. R. A1 - Kearsley, A. T. A1 - Jones, C. G. A1 - Smith, C. A1 - Rades, Steffi T1 - Advanced SEM/EDS analysis using an Annular Silicon Drift Detector (SDD): Applications in Nano, LIfe, Earth and Planetary Sciences below Micrometer Scale T2 - EMAS 2015 - 14th European Workshop on Modern Developments and applications in microbeam analysis T2 - EMAS 2015 - 14th European Workshop on Modern Developments and applications in microbeam analysis CY - Portoroz, Slovenia DA - 2015-05-03 PY - 2015 AN - OPUS4-33247 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan A1 - Mielke, Johannes A1 - Rades, Steffi A1 - Ortel, Erik A1 - Salge, T. T1 - Eds elemental selectivity with respect to nanoparticle analysis T2 - EMAS 2015 T2 - EMAS 2015 CY - Portoroz, Slovenia DA - 2015-05-03 PY - 2015 AN - OPUS4-33149 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan A1 - Terborg, R. A1 - Falke, M. A1 - Käppel, A. T1 - Characterization of EDS Systems with respect to the Geometrical Collection Efficiency T2 - 18th International Microscopy Congress IMC 2014 T2 - 18th International Microscopy Congress IMC 2014 CY - Prague, Czech Republic DA - 2014-09-07 PY - 2014 AN - OPUS4-31914 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan A1 - Terborg, R. A1 - Falke, M. A1 - Käppel, A. T1 - On the Characterization of the Geometrical Collection Efficiency of Modern EDS Systems T2 - Microscopy and Microanalysis M&M 2014 T2 - Microscopy and Microanalysis M&M 2014 CY - Hartford, CT, USA DA - 2014-08-02 PY - 2014 AN - OPUS4-31468 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan A1 - Guilherme, A. A1 - Pessanha, S. A1 - Bendaoud, R. A1 - Zegzouti, A. A1 - Elaatmani, M. A1 - Coroado, J. A1 - Carvalho, M.L. T1 - Compositional and morphological features of Moroccan Zelli by XRF and SEM/EDX T2 - European Conference on x-Ray Spectrometry (EXRS) T2 - European Conference on x-Ray Spectrometry (EXRS) CY - Bologna, Italy DA - 2014-06-15 PY - 2014 AN - OPUS4-30966 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan A1 - Guilherme, A. A1 - Benemann, Sigrid A1 - Coroado, J. A1 - Carvalho, M.L. T1 - Morphological and Compositional Features of Portuguese Polychrome Glazed Pottery Investigated by SEM/EDX - Hints about the Manufacturing Processes T2 - Microscopy and Microanalysis 2013 T2 - Microscopy and Microanalysis 2013 CY - Indianapolis, IN, USA DA - 2013-08-04 PY - 2013 AN - OPUS4-28941 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Welcoming elemental analysis of nanoparticles by EDX in combination with high-resolution electron microscopy in transmission mode T2 - 13th European Workshop on modern developments and applications in microbeam analysis (EMAS 2013) T2 - 13th European Workshop on modern developments and applications in microbeam analysis (EMAS 2013) CY - Oporto, Portugal DA - 2013-05-12 PY - 2013 AN - OPUS4-28510 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -