TY - GEN A1 - Weidner, Steffen A1 - Kühn, Gerhard A1 - Roessner, D. A1 - Friedrich, Jörg Florian A1 - Unger, Wolfgang A1 - Lippitz, Andreas ED - Olefjord, I. ED - Nyborg, L. ED - Briggs, D. T1 - Changes in molecular weight distribution of polymers by plasma treatment T2 - ECASIA 97 T2 - 7th European Conference on Applications of Surface and Interface Analysis CY - Göteborg, Sweden DA - 1997-06-16 PY - 1997 SN - 0-471-97827-2 SP - 795 EP - 799 PB - Wiley CY - Chichester AN - OPUS4-6997 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Unger, Wolfgang A1 - Wirth, Thomas A1 - Hodoroaba, Vasile-Dan ED - Hodoroaba, Vasile-Dan ED - Unger, Wolfgang ED - Shard, A. G. T1 - Auger electron spectroscopy T2 - Characterization of nanoparticles - Measurement processes for nanoparticles N2 - An introduction in the application of Auger Electron Spectroscopy to surface chemical analysis of nanoparticles is given. Auger Electron Spectroscopy is a mature method in the field of surface chemical analysis. The chapter addresses the physical basis of the method, the principal design of recent instruments together with modes of operation and options for the presentation of spectra, as well as different approaches for qualitative (including identification of chemical species) and quantitative surface analysis of elements. An application paragraph on surface chemical analysis of nanoparticles by AES or SAM introduces the different measurement approaches and sample preparation strategies applied by analysts. The analysis of nanoparticle ensembles, the so-called selected point analysis where a narrow primary electron beam is centered on an individual nanoparticle, and chemical mapping of individual nanoparticles (or a line scan across) are addressed. Existing literature is reviewed and informative case studies presented. Limitations and pitfalls in the application of AES in surface chemical analysis of nanoparticles are also addressed. KW - Auger Electron Spectroscopy KW - Surface chemical analysis KW - Imaging surface chemical analysis KW - Nanoparticles KW - Nanotechnology PY - 2020 SN - 978-0-12-814182-3 DO - https://doi.org/10.1016/B978-0-12-814182-3.00020-1 SP - 373 EP - 395 PB - Elsevier CY - Amsterdam AN - OPUS4-50119 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Unger, Wolfgang A1 - Oran, Umut A1 - Swaraj, Sufal A1 - Lippitz, Andreas ED - Chandra, T. T1 - Ageing studies of plasma deposited organic films by surface chemical analysis (ESCA, ToF-SIMS, XAS) T2 - THERMEC 2006 T2 - 5th International Conference on Processing & Manufacturing of Advanced Materials CY - Vancouver, Canada DA - 2006-07-04 KW - Plasma polymerized organic films KW - Ageing phenomena KW - ESCA KW - TOF-SIMS KW - XAS PY - 2007 SN - 0-87849-428-6 SN - 0255-5476 N1 - Serientitel: Materials science forum – Series title: Materials science forum VL - 539-543 IS - 539/543 SP - 623 EP - 628 PB - Trans Tech Publ. CY - Stafa-Zürich AN - OPUS4-14446 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Unger, Wolfgang A1 - Oran, Umut A1 - Senoner, Mathias A1 - Schmidt, M. T1 - Chemische Charakterisierung von mikro- und nanotechnologischen Bauteilen: Verfahrensentwicklung und Referenzmaterialien T2 - Messtechnik für Mikro- und Nano-Engineering T2 - VDI/VDE-Tagung "Messtechnik für Mikro- und Nano-Engineering" CY - Erlangen, Germany DA - 2006-11-29 KW - Referenzmaterial KW - Mikrofluidik KW - Nanoanalytik PY - 2006 N1 - Serientitel: VDI-Berichte – Series title: VDI-Berichte IS - 1950 SP - 197 EP - 206 PB - VDI-Verl. CY - Düsseldorf AN - OPUS4-14110 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Unger, Wolfgang A1 - Lippitz, Andreas A1 - Friedrich, Jörg Florian A1 - Koprinarov, Ivaylo A1 - Weiss, K. A1 - Wöll, Ch. ED - Mittal, K. T1 - The Application of Near Edge X-ray Absorption Fine Structures (NEXAFS) Spectroscopy and X-ray Photoelectron Spectroscopy (XPS) in Surface Analysis of Chromium-evaporated Polymers and Organic Films T2 - Metallized plastics 5 & 6 PY - 1998 SN - 90-6764-290-8 SP - 147 EP - 168 PB - VSP CY - Utrecht AN - OPUS4-6986 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Unger, Wolfgang A1 - Gross, Thomas ED - Rivière, J. C. ED - Myhra, S. T1 - Catalyst characterization T2 - Handbook of surface and interface analysis PY - 1998 SN - 0-8247-0080-5 SP - 747 EP - 780 PB - Dekker CY - New York AN - OPUS4-7020 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Unger, Wolfgang T1 - The Application of X-ray Photoelectron Spectroscopy (ESCA) and X-Ray Absorption Spectroscopy (NEXAFS) in Interface Analysis of Metallized Polymers T2 - Proceedings of the Materials Week 2000 T2 - Materials Week 2000 ; International Congress on Advanced Materials, Their Processes and Applications 2000 CY - Munich, Germany DA - 2000-09-25 PY - 2000 SN - 3-88355-296-8 CY - München AN - OPUS4-1106 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Unger, Wolfgang ED - Worsfold, P. ED - Townshend, A. ED - Poole, C. T1 - Auger electron spectroscopy T2 - Encyclopedia of analytical science / Vol. 8: [R - S] KW - AES KW - Auger Electron Spectroscopy KW - Oberflächenanalytik PY - 2005 SN - 0-12-764108-4 VL - 8 SP - 466 EP - 474 PB - Elsevier/Acad. Press CY - Amsterdam ET - 2. AN - OPUS4-7015 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Unger, Wolfgang T1 - Surface analysis - Auger electron spectroscopy T2 - Reference module in chemistry, molecular sciences and chemical engineering N2 - Basic principles and technical realization of Auger Electron Spectroscopy (AES) are presented. Different modes of application are briefly addressed. These are spectroscopy at nanoscaled surface layers including quantitative element analysis and chemical state analysis, in-depth element analysis, imaging and element mapping. A survey on standards related to application of AES in surface chemical analysis is given. KW - Auger electron spectroscopy KW - AES KW - Surface analysis KW - Chemical state analysis KW - Depth profiling KW - Element analysis KW - Imaging KW - Surface chemical analysis PY - 2013 UR - http://www.sciencedirect.com/science/article/pii/B9780124095472005163 SN - 978-0-12-409547-2 DO - https://doi.org/10.1016/B978-0-12-409547-2.00516-3 SP - 466 EP - 475 PB - Elsevier Inc. AN - OPUS4-29263 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Shard, A. G. A1 - Hodoroaba, Vasile-Dan A1 - Unger, Wolfgang ED - Hodoroaba, Vasile-Dan ED - Unger, Wolfgang ED - Shard, A. G. T1 - Introduction T2 - Characterization of nanoparticles - Measurement processes for nanoparticles N2 - The purpose of this book is to provide a comprehensive collection of analytical methods that are commonly used to measure nanoparticles, providing information on one, or more, property of importance. The chapters provide up-to-date information and guidance on the use of these techniques, detailing the manner in which they may be reliably employed. Within this chapter, we detail the rationale and context of the whole book, which is driven by the observation of a low level of reproducibility in nanoparticle research. The aim of the book is to encourage awareness of both the strengths and weaknesses of the various methods used to measure nanoparticles and raise awareness of the range of methods that are available. The editors of the book have, for many years, been engaged in European projects and standardization activities concerned with nanoparticle analysis and have identified authors who are experts in the various methods included within the book. This has produced a book that can be used as a definitive guide to current best practice in nanoparticle measurement. KW - Nanoparticles KW - Size distribution KW - Shape KW - Chemistry KW - Coating KW - Concentration KW - Standards KW - Charge KW - Characterisation PY - 2020 SN - 978-0-12-814182-3 DO - https://doi.org/10.1016/B978-0-12-814182-3.00001-8 SP - 1 EP - 6 PB - Elsevier CY - Amsterdam AN - OPUS4-50166 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Senoner, Mathias A1 - Wirth, Thomas A1 - Unger, Wolfgang A1 - Österle, Werner A1 - Kaiander, I. A1 - Sellin, R. L. A1 - Bimberg, D. ED - Wilkening, G. ED - Koenders, L. T1 - Testing the Lateral Resolution in the Nanometre Range with a New Type of Certified Reference Material T2 - Nanoscale calibration standards and methods T2 - NanoScale 2004 Seminar ; 6th Seminar on Quantitative Microscopy ; 2nd Seminar on Nanoscale Calibration Standards and Methods CY - Braunschweig, Germany DA - 2004-03-25 KW - Laterale Auflösung KW - Nanometrologie KW - Nanotechnologie KW - Oberflächenanalytik KW - Zertifiziertes Referenzmaterial PY - 2004 SN - 3-527-40502-X DO - https://doi.org/10.1002/3527606661.ch21 SP - 282 EP - 294 PB - Wiley-VCH CY - Weinheim AN - OPUS4-7541 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Senoner, Mathias A1 - Unger, Wolfgang A1 - Koenders, L. A1 - Wilkening, G. ED - Hasche, K. ED - Mirande, W. ED - Wilkening, G. T1 - Results of the inter-laboratory comparison "Determination of nanometric step heights with AFM" T2 - Proceedings of the 5th Seminar on Quantitative Microscopy and 1st Seminar on Nanoscale Calibration Standards and Methods T2 - 5th Seminar on Quantitative Microscopy ; 1st Seminar on Nanoscale Calibration Standards and Methods ; NanoScale 2001 CY - Bergisch Gladbach, Germany DA - 2001-11-15 PY - 2002 SN - 3-89701-840-3 SN - 0179-0609 N1 - Serientitel: PTB-Bericht: PTB-F – Series title: PTB-Bericht: PTB-F VL - F-44 IS - 44 SP - 70 EP - 77 PB - Wirtschaftsverl. NW CY - Bremerhaven AN - OPUS4-1327 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Senoner, Mathias A1 - Sahre, Mario A1 - Rooch, Heidemarie A1 - Unger, Wolfgang ED - Weckenmann, A. T1 - Neuartige, räumlich strukturierte Testproben für die Bestimmung der Abbildungsqualität und die Kalibrierung der Längenskala in der Rastersondenmikroskopie T2 - Abschlussbericht DFG Schwerpunktprogramm 1159 - Neue Strategien der Mess- und Prüftechnik für die Produktion von Mikrosystemen und Nanostrukturen T2 - Abschlusskolloquium DFG Schwerpunktprogramm 1159 - Neue Strategien der Mess- und Prüftechnik für die Produktion von Mikrosystemen und Nanostrukturen CY - Erlangen, Germany DA - 2010-10-06 KW - MOVPE KW - Rasterkraftmikroskopie KW - Referenzmaterial KW - Schichtstapel KW - Selektives Ätzen KW - Spitzencharakterisierer KW - TEM PY - 2011 SN - 978-3-8440-0358-1 SN - 0945-0769 SP - 116 EP - 129 PB - Shaker Verlag GmbH AN - OPUS4-24790 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Schaepe, Kaija A1 - Jungnickel, H. A1 - Heinrich, Thomas A1 - Tentschert, J. A1 - Luch, A. A1 - Unger, Wolfgang ED - Hodoroaba, Vasile-Dan ED - Unger, Wolfgang ED - Shard, A. G. T1 - Secondary ion mass spectrometry T2 - Characterization of nanoparticles - Measurement processes for nanoparticles N2 - This chapter provides an introduction in secondary ion mass spectrometry as one of the leading surface chemical analysis and imaging techniques with molecular specificity in the field of material sciences. The physical basics of the technique are explained along with a description of the typical instrumental setups and their modes of operation. The application paragraph specifically focuses on nanoparticle analysis by SIMS in terms of surface spectrometry, imaging, analysis in organic and complex media, and depth profiling. A review of the existing literature is provided, and selected studies are showcased. Limitations and pitfalls as well as current technical developments of SIMS application in nanoparticle surface chemical analysis are equally discussed. KW - Time-of-flight secondary ion mass spectrometry KW - Surface chemical analysis KW - Imaging KW - Nanomaterials KW - Nanoparticles KW - Core-shell PY - 2020 SN - 978-0-12-814182-3 DO - https://doi.org/10.1016/B978-0-12-814182-3.00025-0 SP - 481 EP - 509 PB - Elsevier CY - Amsterdam AN - OPUS4-50187 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Retzko, Iris A1 - Unger, Wolfgang A1 - Schulz, H. A1 - Scheibe, H.-J. A1 - Treu, Dieter A1 - Matsubayashi, N. T1 - Analysis of carbon materials by XPS T2 - Proceedings of the Materials Week 2002 T2 - Materials Week 2002 ; European Congress on Advanced Materials, their Processes and Applications ; 6th International Conference on Joining Ceramics, Glass and Metal CY - Munich, Germany DA - 2002-09-30 PY - 2002 SN - 3-88355-314-X PB - Werkstoff-Informationsges. AN - OPUS4-1734 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Kühn, Gerhard A1 - Ghode, Archana A1 - Weidner, Steffen A1 - Retzko, Iris A1 - Unger, Wolfgang A1 - Friedrich, Jörg Florian ED - Mittal, K. L. T1 - Chemically well-defined surface functionalization of polyethylene and polypropylene by pulsed plasma modification followed by grafting of molecules T2 - Polymer surface modification (volume 2) T2 - 2nd International Symposium on Polymer Surface Modification: Relevance to Adhesion CY - Newark, NJ, USA DA - 1999-05-24 KW - Plasma modification KW - Chemical conversion of functional groups KW - Spacers KW - Polypropylene KW - Polyethylene PY - 2000 SN - 90-6764-327-0 VL - 2 SP - 45 EP - 64 PB - VSP CY - Utrecht AN - OPUS4-6975 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Koprinarov, Ivaylo A1 - Friedrich, Jörg Florian A1 - Lippitz, Andreas A1 - Unger, Wolfgang ED - Olefjord, I. ED - Nyborg, L. ED - Briggs, D. T1 - X-ray Absorption Spectroscopy (NEXAFS) of PET Surfaces T2 - ECASIA 97 T2 - 7th European Conference on Applications of Surface and Interface Analysis CY - Göteborg, Sweden DA - 1997-06-16 PY - 1997 SN - 0-471-97827-2 SP - 755 EP - 759 PB - Wiley CY - Chichester AN - OPUS4-7288 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Holzlechner, Gerald A1 - Sobol, Oded A1 - Böllinghaus, Thomas A1 - Unger, Wolfgang ED - Udomkichdecha, W. ED - Mononukul, A. ED - Böllinghaus, Thomas ED - Lexow, Jürgen T1 - Imaging ToF-SIMS as a chemical metrology tool to support material and analytical science T2 - Materials for energy infrastructure N2 - As a chemical metrology tool time-of-flight secondary ion mass spectrometry (ToF-SIMS) has become a very popular technique to monitor the elemental, isotopic and molecular distribution in two or three dimensions. Its reduced sampling depth, high sensitivity, great structural specificity and the direct detection of hydrogen thereby increase the emergence of ToF-SIMS for material and analytical surface science, particularly due to recent instrumental developments improving mass, depth and lateral resolution. For basic surface science, adsorption processes and surface reactivity thus can be investigated in high detail on organic as well as inorganic samples. The use of multivariate data analysis in addition can effectively assist to identify trends in the complex SIMS raw data set and define key co-variances between certain samples or mass spectra. In this contribution the essence of ToF-SIMS is illustrated by discussing two highly relevant energy applications. First, for piezoelectric electroceramics oxygen exchange active zones have been visualized to determine the impact of external field-load to the oxygen vacancy distribution between anode and cathode. As a second case study the interaction of hydrogen species with the microstructure of a duplex stainless steel was investigated. It was concluded that ToF-SIMS has a valuable essence for detailing hydrogen related degradation mechanisms. T2 - 4th WMRIF Young scientists workshop CY - Boulder, CO, USA DA - 08.09.2014 PY - 2016 SN - 978-981-287-723-9 SN - 978-981-287-724-6 DO - https://doi.org/10.1007/978-981-287-724-6_7 SP - 63 EP - 72 PB - Springer AN - OPUS4-34881 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Hodoroaba, Vasile-Dan A1 - Unger, Wolfgang A1 - Shard, A. G. ED - Hodoroaba, Vasile-Dan ED - Unger, Wolfgang ED - Shard, A. G. T1 - Conclusions and perspectives T2 - Characterization of nanoparticles - Measurement processes for nanoparticles N2 - This chapter briefly summarizes the methods selected within this book for the characterization of nanoparticles with regard to commonly accessible properties: nanoparticle size and size distribution, shape, surface area, surface charge, aggregation state, structure, chemical composition, surface chemistry, and nanoparticle number concentration. Current progress of measurement and analysis, as far as possible according to standard operation procedures, has been the focus of this work. A number of new and less commonly used methods have not been covered, and we outline some of these in this chapter. Future challenges such as automated measurement and analysis, read-across approaches for the prediction of properties, knowledge of measurement uncertainties, the need for certified reference materials, and the necessity to complement measurements methods to obtain more reliable results are covered, and the unmet measurement requirements for real-world nanoparticles are described. KW - Physicochemical characterization KW - Standard operation procedures KW - Data correlation KW - Method development KW - Trends PY - 2020 SN - 978-0-12-814182-3 DO - https://doi.org/10.1016/B978-0-12-814182-3.00006-7 SP - 527 EP - 534 PB - Elsevier CY - Amsterdam AN - OPUS4-50167 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Friedrich, Jörg Florian A1 - Wigant, L. A1 - Unger, Wolfgang A1 - Lippitz, Andreas A1 - Wittrich, H. A1 - Prescher, D. ED - Mittal, K. L. T1 - Barrier properties of plasma-modified polypropylene and polyethyleneterephthalate T2 - Polymer surface modification T2 - International Symposium on Polymer Surface Modification: Relevance to Adhesion CY - Las Vegas, NV, USA DA - 1993-11-03 KW - Plasma fluorination of polymers KW - Deposition of fluorine-containing plasma polymers KW - Barrier formation against solvent permeation KW - Permeation mechanism of solvent mixtures PY - 1996 SN - 90-6764-201-0 VL - 1 SP - 121 EP - 136 PB - VSP CY - Utrecht AN - OPUS4-7006 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Friedrich, Jörg Florian A1 - Unger, Wolfgang A1 - Lippitz, Andreas A1 - Koprinarov, Ivaylo A1 - Kühn, Gerhard A1 - Weidner, Steffen A1 - Vogel, Lydia ED - Mittal, K. T1 - Plasma Pretreatment of Polymer Surfaces - Relevance to Adhesion of Metals T2 - Metallized plastics 5 & 6 T2 - 5th Symposium on Metallized Plastics ; 6th Symposium on Metallized Plastics CY - Los Angeles, CA, USA DA - 1996-05-05 PY - 1998 SN - 90-6764-290-8 SP - 271 EP - 293 PB - VSP CY - Utrecht AN - OPUS4-6987 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Friedrich, Jörg Florian A1 - Unger, Wolfgang A1 - Lippitz, Andreas A1 - Gross, Thomas A1 - Rohrer, P. A1 - Saur, W. A1 - Erdmann, J. A1 - Gorsler, H.-V. ED - Mittal, K. L. T1 - The improvement in adhesion of polyurethane-polypropylene composites by short-time exposure of polypropylene to low and atmospheric pressure plasmas T2 - Polymer surface modification KW - Polyurethane-polypropylene adhesion KW - Low pressure plasma pretreatment KW - Atmospheric pressure plasma treatment KW - Short-time exposure KW - Relevance of functional groups to adhesion KW - Molecular orientation at polymer surfaces PY - 1996 SN - 90-6764-201-0 SP - 49 EP - 72 PB - VSP CY - Utrecht AN - OPUS4-7007 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Friedrich, Jörg Florian A1 - Unger, Wolfgang A1 - Lippitz, Andreas A1 - Giebler, Rainer A1 - Koprinarov, Ivaylo A1 - Weidner, Steffen A1 - Kühn, Gerhard ED - Mittal, K. L. T1 - Significance of interfacial redox reactions and formation of metal-organic complexes for the adhesion of metals on pristine and plasma-treated polymers T2 - Polymer surface modification (volume 2) KW - Oxygen low-pressure plasma treatment of polymers KW - Metal-polymer interactions KW - Peel strength PY - 2000 SN - 90-6764-327-0 VL - 2 SP - 137 EP - 171 PB - VSP CY - Utrecht AN - OPUS4-6979 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Friedrich, Jörg Florian A1 - Retzko, Iris A1 - Kühn, Gerhard A1 - Unger, Wolfgang A1 - Lippitz, Andreas ED - Mittal, K. T1 - Metal doped plasma polymer films T2 - Metallized plastics 7 T2 - 7th Symposium on Metallized Plastics CY - Newark, NJ, USA DA - 1999-12-02 KW - Plasma polymer KW - r.f. pulsed plasma KW - Conducting films KW - Metal-polymer interface PY - 2001 SN - 90-6764-340-8 VL - 7 SP - 117 EP - 142 PB - VSP CY - Utrecht AN - OPUS4-929 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Friedrich, Jörg Florian A1 - Kühn, Gerhard A1 - Unger, Wolfgang A1 - Mix, Renate ED - Radusch, H.-J. ED - Fiedler, L. T1 - Plasma-initiated homo and copolymerisation for modifying polymer surfaces with funtional groups of different type and density T2 - Polymerwerkstoffe 2002 T2 - Internationale Fachtagung Polymerwerkstoffe ; P-2002 CY - Halle (Saale), Germany DA - 2002-09-25 PY - 2002 SN - 3-86010-656-2 SP - 534 EP - 539 PB - Martin-Luther-Univ. Halle-Wittenberg CY - Halle (Saale) AN - OPUS4-6969 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Friedrich, Jörg Florian A1 - Kühn, Gerhard A1 - Mix, Renate A1 - Retzko, Iris A1 - Gerstung, Vanessa A1 - Weidner, Steffen A1 - Schulze, Rolf-Dieter A1 - Unger, Wolfgang ED - Mittal, K. L. T1 - Plasma polymer adhesion promoters for metal-polymer systems T2 - Polyimides and other high temperature polymers: synthesis, characterization and applications, volume 2 T2 - 2nd International Symposium on Polyimides and Other High Temperature Polymers: Synthesis, Characterization and Applications CY - Newark, NJ, USA DA - 2001-12-03 KW - r.f. pulsed plasma KW - Plasma polymers with functional groups KW - Copolymers KW - Adhesion promoting interlayers KW - Metal-polymer systems PY - 2003 SN - 90-6764-378-5 VL - 2 SP - 359 EP - 388 PB - VSP CY - Utrecht AN - OPUS4-6967 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Clifford, C. A1 - Stintz, M. A1 - Hodoroaba, Vasile-Dan A1 - Unger, Wolfgang A1 - Fujimoto, T. ED - Hodoroaba, Vasile-Dan ED - Unger, Wolfgang ED - Shard, A. G. T1 - International standards in nanotechnologies T2 - Characterization of nanoparticles - Measurement processes for nanoparticles N2 - This chapter provides an overview of what standards are, why they are important, and how they are developed. There is a focus on the work of standards committees relevant to nanotechnology measurement and characterization with tables detailing the standards that are currently available for a large number of different techniques, materials, and applications at the nanoscale. KW - Standards KW - Nanotechnology KW - Reproducibility KW - ISO KW - CEN KW - VAMAS PY - 2020 SN - 978-0-12-814182-3 DO - https://doi.org/10.1016/B978-0-12-814182-3.00026-2 SP - 511 EP - 525 PB - Elsevier CY - Amsterdam AN - OPUS4-50165 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Baytekin, H. Tarik A1 - Oran, Umut A1 - Theisen, J. A1 - Schmidt, Martin A1 - Unger, Wolfgang ED - Weckenmann, A. T1 - Validierte Messverfahren für die nichtgeometrische Größe Hydrophilie - Anwendung in der Mikrofluidik T2 - Abschlussbericht DFG Schwerpunktprogramm 1159 - Neue Strategien der Mess- und Prüftechnik für die Produktion von Mikrosystemen und Nanostrukturen T2 - Abschlusskolloquium DFG Schwerpunktprogramm 1159 - Neue Strategien der Mess- und Prüftechnik für die Produktion von Mikrosystemen und Nanostrukturen CY - Erlangen, Deutschland DA - 2010-10-06 PY - 2011 SN - 978-3-8440-0358-1 SN - 0945-0769 SP - 163 EP - 172 PB - Shaker Verlag GmbH AN - OPUS4-24827 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -