TY - CONF A1 - Unger, Wolfgang T1 - Web site for information on reference materials T2 - Final General Meeting EU-GDS Network T2 - Final General Meeting EU-GDS Network CY - Wiener Neustadt, Austria DA - 2002-03-02 PY - 2002 AN - OPUS4-6217 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang A1 - Gross, Thomas A1 - Böse, Olaf A1 - Lippitz, Andreas A1 - Fritz, Thomas A1 - Gelius, U. T1 - VAMA TMA2 Project A2, Evaluation of static charge stabilization and determination methods in XPS on non-conducting samples: Report on an inter-laboratory comparison T2 - 11. Arbeitstagung Angewandte Oberflächenanalytik (AOFA 11) T2 - 11. Arbeitstagung Angewandte Oberflächenanalytik (AOFA 11) CY - Leipzig, Germany DA - 2000-09-24 PY - 2000 AN - OPUS4-6116 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang A1 - Retzko, Iris A1 - Lippitz, Andreas A1 - Friedrich, Jörg F. T1 - Unsaturated carbon species at polymer surfaces: The potential of X-ray absorption spectroscopy T2 - ECASIA 2001 T2 - ECASIA 2001 CY - Avignon, France DA - 2001-09-30 PY - 2001 AN - OPUS4-6165 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang A1 - Sobol, Oded A1 - Straub, Franka A1 - Nolze, Gert A1 - Wirth, Thomas A1 - Böllinghaus, Thomas T1 - Tof-SIMS imaging of Deuterium in DSS steel microstructures and data fusion with SEM topography data: Towards a better understanding of hydrogen assisted cracking in steel N2 - The use of duplex stainless steels (DSS) in energy related applications is well known. Nowadays, DSS steels become more favorable than austenitic steels due to the outstanding mechanical properties, the good corrosion resistance and the lower nickel content. However, the use of the duplex grade in acidic environments such as seawater often leads to severe degradation of the structural integrity of the steel by hydrogen-induced/assisted cracking (HAC) phenomena, which can eventually result in premature failure. Hydrogen assisted degradation and cracking of steels are active fields of research even though this topic is intensively studied for more than a century. A bottleneck is the analytical validation of the theoretical models proposed ion the literature at the sub-micron scale. Industrial and the research communities see a need for an accurate analytical method by which it is possible to image the distribution of hydrogen in the microstructure of a steels or and other alloys. Among the very few available methods hydrogen imaging methods, Time-of-Flight secondary ion mass spectrometry (ToF-SIMS) has the principal capability for mapping of hydrogen in a steel’s microstructure. The combination of ToF-SIMS with multivariate data analysis (MVA), electron microscopy (SEM) and electron-backscattered diffraction (EBSD) is a powerful approach for providing chemical and structural information. The use of data fusion techniques has been shown recently to enhance the better understanding of the hydrogen induced degradation processes in in a DSS steel. T2 - The Scientific International Symposium on SIMS and Related Techniques Based on Ion-Solid Interactions (SISS19) CY - Kyoto, Japan DA - 11.5.17 KW - Hydrogen KW - DSS steel KW - ToF SIMS KW - SEM KW - EDX KW - EBSD KW - Data fusion PY - 2017 AN - OPUS4-40276 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - The application of X-ray photoelectroscopy and X-ray absorption spectroscopy in interface analysis of metallized polymers T2 - AIST-BAM Symposium on Material Surface Technology in TWIN Institute Programme; AIST Tsukuba Research Centre T2 - AIST-BAM Symposium on Material Surface Technology in TWIN Institute Programme; AIST Tsukuba Research Centre CY - Tsukuba, Japan DA - 2003-02-18 PY - 2003 AN - OPUS4-4410 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - The application of X-ray Photoelectron Spectroscopy and X-ray Absorption Spectroscopy in Interface Analysis of Metallized Polymers T2 - Materials Week 2000 T2 - Materials Week 2000 CY - Munich, Germany DA - 2000-09-28 PY - 2000 AN - OPUS4-6117 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - The application of X-ray photoelectron spectroscopy (ESCA) and X-ray absorption spectroscopy (NEXAFS) in interface analysis of metallized polymers T2 - Center of Excellence in Analytical Chemistry (CEAC) Summer Workshop "Functionalized Surfaces: Applications and Analytical Tools" T2 - Center of Excellence in Analytical Chemistry (CEAC) Summer Workshop "Functionalized Surfaces: Applications and Analytical Tools" CY - Zurich, Switzerland DA - 1999-07-05 PY - 1999 AN - OPUS4-6050 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang A1 - Senoner, Mathias A1 - Wirth, Thomas A1 - Bütefisch, S. A1 - Busch, I. A1 - Rossi, A. A1 - Passiu, C. A1 - Spencer, N.D. T1 - Testing lateral resolution and field of view in imaging and small area analysis: reference materials and standardization N2 - The certified reference material BAM-L200, a nanoscale stripe pattern for length calibration and specification of lateral resolution, is described. BAM-L200 is prepared from a cross-sectioned epitaxially grown layer stack of AlxGa1-xAs and InxGa1 xAs on a GaAs substrate. The surface of BAM-L200 provides a flat pattern with stripe widths ranging down to 1 nm. Calibration distances, grating periods and stripe widths have been certified by TEM with traceability to the length unit. The combination of gratings, isolated narrow stripes and sharp edges of wide stripes offers a plenty of options for the determination of lateral resolution, sharpness and calibration of length scale at selected settings of imaging surface analytical instruments. The feasibility of the reference material for an analysis of the lateral resolution is demonstrated in detail by evaluation of ToF-SIMS, AES and EDX images. Other applications developed in the community are summarized, too. BAM-L200 fully supports the implementation of the revised International Standard ISO 18516 (in preparation) which is based on knowledge outlined in the Technical Report ISO/TR 19319:2013. T2 - 7th International Symposium on Practical Surface Analysis(PSA-16) CY - Daejeon, Korea DA - 17.10.2016 KW - BAM L200 KW - SIMS KW - AES KW - XPS PY - 2016 AN - OPUS4-38266 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - Surface and Micro/Nano Analysis Activities at the Federal Institute for Materials Research and Testing (BAM) T2 - Seminar: MolecularSciences Laboratory, Interfacial and Nano Science Facility, Pacific North West National Laboratory T2 - Seminar: MolecularSciences Laboratory, Interfacial and Nano Science Facility, Pacific North West National Laboratory CY - Richland, WA, USA DA - 2005-04-07 PY - 2005 AN - OPUS4-7358 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - Surface Analysis Working Group (SAWG) Report for 2005/06 T2 - CCQM Plenary Meeting 2006, BIPM T2 - CCQM Plenary Meeting 2006, BIPM CY - Sèvres, France DA - 2006-04-06 PY - 2006 AN - OPUS4-12285 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - Surface & thin film analysis at BAM: Development of certified reference materials and surface characterisation of plasma polymerized thin films T2 - Seminar im Lab. of Physical-Chemistry of Surfaces (CNRS-ENSCP), Ecole Nationale Superieure de Chemie de Paris T2 - Seminar im Lab. of Physical-Chemistry of Surfaces (CNRS-ENSCP), Ecole Nationale Superieure de Chemie de Paris CY - Paris, France DA - 2006-04-04 PY - 2006 AN - OPUS4-12286 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - Surface & thin film analysis at BAM: certified reference materials and R&D on plasma polymerization of organics T2 - Seminar, National ESCA and Surface Analysis Center for Biomedical Problems (NESCA/BIO), University of Washington T2 - Seminar, National ESCA and Surface Analysis Center for Biomedical Problems (NESCA/BIO), University of Washington CY - Seattle, WA, USA DA - 2006-06-29 PY - 2006 AN - OPUS4-12506 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang A1 - Procop, Mathias T1 - Standard-free quantification in EPMA T2 - CCQM Surface Analysis Working Group Meeting for 2004 T2 - CCQM Surface Analysis Working Group Meeting for 2004 CY - Sèvres, France DA - 2004-04-20 PY - 2004 AN - OPUS4-4607 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang A1 - Böse, Olaf A1 - Gross, Thomas A1 - Lippitz, Andreas A1 - Gelius, U. T1 - Results of a VAMAS TWA 2 inter-laboratory test experiment: Evaluation of static charge stabilization and determination methods in XPS on non-conducting samples T2 - IUVSTA 15th International Vacuum Congress/AVS 48th International Symposiun/ 11th Intern. Conf. On Solid Surfaces T2 - IUVSTA 15th International Vacuum Congress/AVS 48th International Symposiun/ 11th Intern. Conf. On Solid Surfaces CY - San Francisco, CA, USA DA - 2001-10-28 PY - 2001 AN - OPUS4-6166 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang A1 - Böse, Olaf A1 - Gross, Thomas A1 - Lippitz, Andreas A1 - Gelius, U. T1 - Results of a VAMAS TWA 2 inter-laboratory test experiment: Evaluation of static charge stabilization and determination methods in XPS on non-conducting samples T2 - ECASIA ´99 T2 - ECASIA ´99 CY - Seville, Spain DA - 1999-10-04 PY - 1999 AN - OPUS4-6051 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang A1 - Böse, Olaf A1 - Gross, Thomas A1 - Lippitz, Andreas A1 - Gelius, U. T1 - Results of a VAMAS TWA 2 inter-laboratory test experiment: Evaluation of static charge stabilization and determination methods in XPS on non-conducting samples T2 - EMASS1999 T2 - EMASS1999 CY - Neuhausen am Rheinfall, Switzerland DA - 1999-10-25 PY - 1999 AN - OPUS4-6052 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - Results of a german survey on topics of interest in surface chemical analysis of organic surfaces in 2006: topics and priorities T2 - ISO/TC201 15th Plenary and SC Meetings (Morgan Hill Meeting) T2 - ISO/TC201 15th Plenary and SC Meetings (Morgan Hill Meeting) CY - Morgan Hill, CA, USA DA - 2006-11-09 PY - 2006 AN - OPUS4-14232 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang A1 - Swaraj, Sufal A1 - Oran, Umut A1 - Lippitz, Andreas A1 - Retzko, Iris A1 - Friedrich, Jörg F. A1 - Matsubayashi, N. T1 - R.F. Plasma-polymerized Polymer Films: Comprehensive Surface and in Depth Chemical Characterization by XAS, XPS and ToF-SIMS T2 - 11th Eurpean Conference on Applications of Surface and Interface Analysis, ECASIA`05 T2 - 11th Eurpean Conference on Applications of Surface and Interface Analysis, ECASIA`05 CY - Vienna, Austria DA - 2005-09-25 PY - 2005 AN - OPUS4-11283 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang A1 - Swaraj, Sufal A1 - Oran, Umut A1 - Lippitz, Andreas A1 - Retzko, Iris A1 - Matsubayashi, N. T1 - Pulsed R. F. Plasma-polymerized Films Prepared From Small Organic Monomers: Characterization by XAS, XPS und ToF-SIMS T2 - 12. Bundesdeutsche Fachtagung Plasmatechnologie der Deutschen Gesellschaft für Plasmatechnologie T2 - 12. Bundesdeutsche Fachtagung Plasmatechnologie der Deutschen Gesellschaft für Plasmatechnologie CY - Braunschweig, Germany DA - 2005-03-21 PY - 2005 AN - OPUS4-7293 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - Pulsed Plasma-polymerized Films prepared from Organic Molecules: Characterization by Surface Analytical Tools T2 - KRISS Meeting - NanoSurface Group T2 - KRISS Meeting - NanoSurface Group CY - Daejeon, South Korea DA - 2004-10-11 PY - 2004 AN - OPUS4-4600 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -