TY - JOUR A1 - Nolze, Gert A1 - Winkelmann, Aimo T1 - Dynamical simulation of electron backscatter diffraction (EBSD) patterns of imperfect crystals N2 - Electron backscatter diffraction in the scanning electron microscope (SEM) is extensively used for the description of crystalline microstructures, see [1, 2]. This main use of this technique are spatially resolved orientation measurements with discrimination between different crystallographic phases. For an improved phase identification and orientation determination by EBSD, a sufficiently accurate prediction of the intensity distribution in the measured Kikuchi patterns is a prerequisite. KW - EBSD KW - Rasterelektronenmikroskopie KW - Kristall KW - Rückstreukoeffizient KW - Beugungsmuster-Simulation KW - Realstruktur PY - 2012 DO - https://doi.org/10.1017/S1431927612008082 SN - 1431-9276 SN - 1435-8115 VL - 18 IS - Suppl. S2 SP - 1246 EP - 1247 PB - Cambridge University Press CY - New York, NY AN - OPUS4-27920 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -