TY - JOUR A1 - Nolze, Gert A1 - Winkelmann, Aimo T1 - Dynamical simulation of electron backscatter diffraction (EBSD) patterns of imperfect crystals JF - Microscopy and microanalysis KW - EBSD KW - Rasterelektronenmikroskopie KW - Kristall KW - Rückstreukoeffizient KW - Beugungsmuster-Simulation KW - Realstruktur PY - 2012 DO - https://doi.org/10.1017/S1431927612008082 SN - 1431-9276 SN - 1435-8115 VL - 18 IS - Suppl. S2 SP - 1246 EP - 1247 PB - Cambridge University Press CY - New York, NY AN - OPUS4-27920 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -